Scanning electron microscopy (SEM) images were collected on an FEI Quanta 250 microscope. Transmission electron microscopy (TEM), high-resolution TEM (HRTEM) images and selected area electron diffraction (SAED) patterns were recorded on an FEI Tecnai G2 F20 field-emission microscope. X-ray diffraction (XRD) patterns were obtained on a Bruker D8 ADVANCE diffractometer equipped with a CuKα radiation source (λ = 1.54178 Å). Raman spectra were obtained on a Bruker Senterra confocal Raman spectrometer (λex = 532 nm). N2 adsorption/desorption isotherms at 77 K were carried out on a Quantachrome Autosorb-iQ instrument. Brunauer–Emmett–Teller (BET) specific surface areas were calculated from the linear range of the BET plot and pore width distribution curves were obtained using the quenched solid density functional theory (DFT) method. X-ray photoelectron spectroscopy (XPS) results were acquired on a Thermo Fisher ESCALAB 250Xi spectroscope with an excitation source of AlKα radiation (1486.6 eV).
Escalab 250xi spectroscope
Manufactured by Thermo Fisher Scientific
Sourced in United Kingdom
The ESCALAB 250Xi is a high-performance X-ray photoelectron spectroscope (XPS) designed for surface analysis and material characterization. It provides accurate and reliable data on the chemical composition and electronic structure of solid surfaces and thin films.
Automatically generated - may contain errors
Lab products found in correlation
Senterra confocal raman spectrometer, by Bruker (3 mentions)
Quanta 250 microscope, by Thermo Fisher Scientific (2 mentions)
Tecnai g2 f20 field, by Thermo Fisher Scientific (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Xcalibur, by Thermo Fisher Scientific (1 mentions)
Multimode 8, by Bruker (1 mentions)
Jem f200, by JEOL (1 mentions)
Themis z, by Thermo Fisher Scientific (1 mentions)
Bi 200sm, by Brookhaven Instruments (1 mentions)
D8 advance, by Bruker (1 mentions)
Nano zs instrument, by Malvern Panalytical (1 mentions)
Ht7700, by Bruker (1 mentions)
Rf 6000, by Shimadzu (1 mentions)
Frontier spectrophotometer, by PerkinElmer (1 mentions)
Jsm 7900f scanning electron microscope, by JEOL (1 mentions)
Ultra dry detector, by Thermo Fisher Scientific (1 mentions)
D2 phaser diffractometer, by Bruker (1 mentions)
7 protocols using escalab 250xi spectroscope
1
Multi-Technique Nanomaterial Characterization
2
Advanced Materials Characterization Methods
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Pore textural properties were acquired using a Quantachrome Autosorb iQ by the N2 isothermal adsorption–desorption method at 77 K. Brunauer–Emmett–Teller (BET) specific surface areas were obtained from the multi-point BET-plot calculation provided by the ASiQwin software (version 5.2). Pore size distribution curves, together with pore volumes and surface areas of pores with size between 0.5–50 nm, were calculated by the quenched solid density functional theory (DFT) method. Energy disperse spectroscopy (EDS) analyses were obtained from an FEI Quanta 250 microscope. Transmission electron microscope (TEM) images were recorded on an FEI Tecnai G2 F20 field-emission microscope. X-ray diffraction (XRD) patterns were collected on a Bruker D8 ADVANCE diffractometer equipped with a CuKα radiation source (λ = 1.54178 Å). Raman spectroscopy analyses were acquired on a Bruker Senterra confocal Raman spectrometer (laser excitation wavelength: 532 nm). X-ray photoelectron spectroscopy (XPS) results were recorded on a Thermo Fisher ESCALAB 250Xi spectroscope excited by AlKα radiation (1486.6 eV).
3
Comprehensive Material Characterization Protocol
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TEM and AFM images of STPE-PMNSs were obtained from Hitachi HT7700 and Bruker MultiMode 8, respectively. STEM-HAADF images were obtained from Themis Z (Thermo Scientific). Zeta potential and size of STPE-PMNSs were measured on Nano-ZS instrument (Malvern Instruments Limited) and Brookhaven BI-200SM, respectively. FT-IR was obtained from Nicolet 7000-c. The fluorescence emission spectra were measured on a fluorescence spectrophotometer (Shimadzu, RF-6000). XRD patterns were recorded on an X-ray diffractometer (Bruker D8 Advance) with Cu Kα radiation (λ = 1.54060 Å) and XPS was measured on Thermo ESCALAB 250Xi spectroscope. HRTEM and EDXS were performed on a JEOL JEM-F200. 1H NMR, 13C NMR, and 31P NMR spectra were obtained on Bruker nuclear resonance (400 MHz) spectrometer. HRMS data was collected on Thermo Scientific Xcalibur.
4
Characterization of Photoelectrode Structure
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The chemical structure of the as-prepared photoelectrode was verified by Fourier transform infrared (FTIR) spectra and X-ray photoelectron spectra (XPS). FTIR spectra were recorded in the range of 400~4000 cm−1 with an interval of 4 cm−1 on a PerkinElmer Frontier spectrophotometer in the attenuated total refraction (ATR) mode with an additional variable angle reflectance accessory under ambient conditions. XPS spectra were performed on a Thermo Fisher Scientific ESCALAB 250Xi spectroscope with Al Kα radiation (photon energy 1253.6 eV) as the exciting source at a working voltage of 12.5 kV. The crystalline features of the samples were characterized by using a Bruker D8 Advanced X-ray diffractometer with Cu Kα radiation (λ = 1.5416 Å), operated at 40 kV and 40 mA ranging from 1.5 to 80° with a speed of 2° min−1. The microstructures and element distribution of samples were observed on a JEOL JSM-7900F scanning electron microscope (SEM).
5
Composition Analysis of Salivary Sialoliths
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We analyzed samples of 50 salivary sialoliths obtained from the submandibular gland main duct from 50 patients with submandibular sialolithiasis. The exemplary micrographs made using a SEM, operating with a variable pressure chamber at a pressure of 90 Pa to minimize ionization of the specimen. A back-scatter electron BSE detector was used for the analysis. The accelerating voltage was 20 kV. The only pre-treatment procedure was cutting the investigated salivary stones to reveal their core. Energy Dispersive X-Ray Spectroscopy (EDX) carried out using an UltraDry detector (ThermoFisher Scientific, United States) integrated with the SEM microscope.
The molecular composition of the specimens (X-Ray Photoelectron Spectroscopy, XPS) was studied using an Escalab 250Xi spectroscope (ThermoFisher Scientific, United Kingdom). The spectroscope was equipped with an Al Kα monochromatic X-Ray source, spot diameter 250 µm. The pass energy applied was 20 eV. Before measurements on sialoliths, the XPS was calibrated using single-crystal Au. Charge compensation was controlled through low-energy Ar+ ions emission . CC-BY-NC-ND 4.0 International license It is made available under a is the author/funder, who has granted medRxiv a license to display the preprint in perpetuity.
The molecular composition of the specimens (X-Ray Photoelectron Spectroscopy, XPS) was studied using an Escalab 250Xi spectroscope (ThermoFisher Scientific, United Kingdom). The spectroscope was equipped with an Al Kα monochromatic X-Ray source, spot diameter 250 µm. The pass energy applied was 20 eV. Before measurements on sialoliths, the XPS was calibrated using single-crystal Au. Charge compensation was controlled through low-energy Ar+ ions emission . CC-BY-NC-ND 4.0 International license It is made available under a is the author/funder, who has granted medRxiv a license to display the preprint in perpetuity.
6
Comprehensive Characterization of ANPC Materials
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N2 adsorption/desorption isotherms were measured on a Quantachrome autosorb-iQ at 77 K. Brunauer–Emmett–Teller (BET) specific surface areas of the ANPC materials were calculated according to the linear ranges of BET plots from the corresponding physisorption isotherms. Pore width distribution curves of the ANPC materials were acquired based on the quenched solid density functional theory (DFT) method. The microstructures and morphologies of the ANPC materials were observed on an FEI Tecnai field-emission transmission electron microscope (TEM) and an FEI Quanta TM 250 scanning electron microscope (SEM). Raman spectra were obtained on a Bruker Senterra confocal Raman spectrometer (laser excitation wavelength: 532 nm). X-ray photoelectron spectroscopy (XPS) spectra were collected on a Thermo Fisher ESCALAB 250Xi spectroscope equipped with an excitation source of Al Kα radiation (1486.6 eV).
7
Characterization of Nanofillers via XRD, XPS, and BET
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A Bruker D2 Phaser diffractometer with Cu Kα radiation (λ = 1.54056 Å) and an XE-T detector were used to carry out X-ray diffraction (XRD) measurements. A 2θ range of 5–70° was used to collect the data. High-resolution X-ray photoelectron spectroscopy (XPS) measurements were carried out using an Escalab 250Xi spectroscope from Thermo Fisher Scientific. The X-ray source was AlKα and the spot was 500 μm. The pass energy was set to 20 eV. Charge compensation was assured through low-energy electron and Ar+ ion bombardment of the sample, with final peak calibration at adventitious carbon (C 1s at 284.6 eV). Specific surface areas of the fillers were measured by nitrogen adsorption at 77 K (NOVAtouch™ 2, Quantachrome Instruments) and calculated using the BET linear equation in the approximate relative pressure range of 0.1 to 0.3. The correlation coefficient of the linear regression was not less than 0.99. Prior to the measurements, the samples were degassed under vacuum at 40°C for 12h.
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