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51 xmx0019x max energy dispersive x ray spectroscopy edxs

Manufactured by Oxford Instruments
Sourced in United Kingdom

The 51-XMX0019X-Max is an energy-dispersive X-ray spectroscopy (EDXS) system. It is designed to perform elemental analysis of samples by detecting and analyzing the X-rays emitted from the sample when exposed to a beam of electrons or X-rays.

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3 protocols using 51 xmx0019x max energy dispersive x ray spectroscopy edxs

1

Comprehensive Physico-Chemical Characterization

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FT-IR spectra were recorded in the range of 4000–400 cm−1 with a resolution of 2 cm−1 by a Nicolet Is10 Fourier transform infrared spectrometer (FT-IR) (Thermo Fisher Scientific, USA) using the potassium bromide particle method. The samples were analyzed in the range of 5° to 90° using an X-ray diffraction analyzer of the EMPYREAN model (PANalytical B.V., Netherland). Surface morphology of the samples was observed using a JSM7500F scanning electron microscope (SEM) (JEOL, Japan). The elemental composition of the samples was measured by 51-XMX0019X-Max energy-dispersive X-ray spectroscopy (EDXS) (Oxford Instruments, UK). The zeta potential of the sample was detected with a Zetasizer Nano ZSP (Malvern, UK), the concentration of the prepared suspension is 0.5 mg mL−1, and the pH of the suspension was adjusted with 0.01 M sodium hydroxide or hydrochloric acid solution.
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2

Characterization of Wool-ZnO Composite Fibers

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The FT-IR spectra of pristine wool fibers, wool-AN@ZnO and wool-AO@ZnO were recorded on a Nicolet iS10 FT-IR spectrophotometer (Thermo Scientific, USA) by the KBr pellet method in a range from 4000 to 600 cm−1. The morphologies of the fibers were observed by a JSM-F7500 Scanning electron microscope (SEM) (Japan Electron Optical Laboratory Co., LTD, Japan). The elemental compositions of the samples were measured by a 51-XMX0019 X-Max Energy-dispersive X-ray spectroscopy (EDXS) (Oxford Instruments, UK). The nitrogen adsorption isotherms of the samples were detected by a Tristar 3000 surface area and porosity analyzer (Micromeritics, USA) at 77 K. The surface area of samples was calculated by Barrett–Emmett–Teller (BET) equation. All tests were run in triplicate.
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3

Spectroscopic and Morphological Characterization

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FT-IR spectra were recorded by a Nicolet Is10 Fourier transform infrared spectrometer (FT-IR) (Thermo Fisher Scientific, USA) by the KBr pellet method in the range of 4000–400 cm−1 with 2 cm−1 of resolution. Surface morphology was observed using a JSM 7500F scanning electron microscopy (SEM) (JEOL, Japan). The elemental compositions of the samples were measured via 51-XMX0019 X-Max energy-dispersive X-ray spectroscopy (EDXS) (Oxford Instruments, UK).
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