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12 protocols using senterra r200 l

1

Characterization of Graphene Oxide and Reduced Graphene Oxide

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AFM (Bruker multimode 8) was used to measure the thickness and transverse diameter of GO. The AFM analysis was conducted using a drop of dialyzed GO solution, which had been diluted and ultrasonicated for 1 h on a mica substrate. The prepared LS–rGO and rGO solutions were dropped on a copper sheet and observed through SEM (Zeiss Sigma 300, Germany) after the solvent was completely dried to contrast the surface morphology and the folding degree. The Raman spectra of the freeze-dried LS–rGO and rGO samples were recorded on a Senterra R200-L apparatus (Bruker Optics) with an excitation wavelength of 532 nm. The FT-IR measurements (Bruker tensor II) were performed in the wavenumber range of 680–4000 cm−1 to explore the chemical structure of the freeze-dried LS–rGO and rGO samples. The XPS analysis was performed on a Thermo Scientific K-Alpha photoelectron spectrometer using Al Kα (1486.6 eV) radiation.
All electrochemical measurements were performed on an electrochemical workstation (CHI-760E, Austin, Texas) with a standard three-electrode system, as shown in Fig. 1a. Details can be found in the ESI.
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2

Characterization of Polymer Nanostructure Arrays

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The scanning electron microscope (SEM) images were obtained using Zeiss Ultra Plus field emission scanning electron microscope with an electron energy of 5 kV. Atomic force microscope (AFM) images were obtained using a nanoscope scanning probe microscope (Dimension fastscan, Bruker, Germany) under ambient conditions. Au coating was sputtered on the surface of the polymer nanostructure arrays using an ion sputtering apparatus (E-1045, Hitachi, Japan). The light absorption performance of substrates were measured using a spectrophotometer (Shimadzu UV3600, Shimadzu, Japan) combined with an integrating sphere for the 300−800 nm wavelength range. For Raman scattering measurements, 10 μL R6G aqueous solution (10−6 M) was dropped onto the substrates and then dried in the dark. Also, the same amount of 10−1 M R6G solution was drop-casted on glass to get reference Raman spectra. SERS spectra were collected using a Dispersive Raman Microscope (Senterra R200-L, Bruker Optics, Germany).
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3

Structural Analysis of Modified Electrodes

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The microstructure and morphology of different modified electrodes were investigated using scanning electron microscopy (SEM, JSM-6300, JEOL, Tokyo, Japan), transmission electron microscopy (TEM, JEM-2100F JEOL, Tokyo, Japan), x-ray diffraction (XRD, Rigaku, SmartLab, Tokyo, Japan), and Raman spectroscopy (Bruker Senterra R200-L, Billerica, MA, USA).
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4

Characterization of CNT Sponge Structure

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Morphology and structure of CNT sponges were characterized by high resolution transmission electron microscopy (HRTEM, EOL-2010F, accelerating voltage of 200 kV) and field emission scanning electron microscope (FESEM, GeminSEM 520). High temperature resistance and the content of Fe in the CNT sponge were analyzed by thermo-gravimetric analysis (TGA, Netzsch Model STA 409 PC) at a heating rate of 10 °C min−1 in an air environment. Raman spectroscopy was carried out by a Raman spectrometer (Bruker Senterra R200-L) using a laser of 532 nm wavelength. The diameter of CNTs was measured by a software (Nano Measurer 1.2) from their SEM images.
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5

Characterization of Porous Carbons

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Field
emission scanning electron microscopy (Nova NanoSEM450, USA) is a
powerful technique for characterizing the structure and surface morphologies
of the porous carbons. A transmission electron microscope (TEM, JEOL-2100F,
Japan) is used to investigate the morphologies of the samples. The
XRD patterns of these samples were collected via a D/max 2550VB3+/PC
diffractometer (RIGAKU, Japan) with Cu Kα radiation (40 kV,
40 mA, and k = 1.5418 Å) between 10 and 80°.
X-ray photo-electron spectroscopy (XPS) is a powerful technique for
quantitative surface analysis to characterize the elemental analysis
of the samples. Raman spectra were obtained on a Senterra R200-L apparatus
(BrukerOptics, Germany). Thermogravimetric analysis (TGA) of the samples
was performed using a TAQ600 (TGA) analyzer from American TA.
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6

Characterization of Graphene Oxide Microstructure

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The morphology and structure of GO were characterized by AFM (‘E-Sweep’ of the NanoNavi-Series) and Raman spectroscopy (Senterra R200-L, Bruker). Phase and elemental analyses were performed by XRD (D8 Advance, Bruker) and XPS (AXIS Ultra DLD, Shimadzu-Kratos). The microstructures of the film and composite were observed by SEM (FEI SIRION 200) and TEM (JEOL JEM-2100F). For compressive testing, the obtained samples were cut using a wire electrical discharging machine along the direction both parallel and perpendicular to the layered direction and were polished to cylinder shape with a height of 3.5 mm and a diameter of 2 mm. The compressive testing was conducted using a servo-hydraulic materials testing system (Zwick/Roell Z020) at room temperature at a strain rate of 1 × 10−4 s−1.
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7

Characterization of CNTs and Iron Composites

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The contents of CNT and Fe were evaluated by thermo-gravimetric analysis (TGA, Netzsch Model STA 409 PC, heating rate of 10 °C min−1 and a constant air flow of 20 mL min−1). The structural features of CNTs and CNCs were characterized by high resolution transmission electron microscopy (HR-TEM, JEOL-2010F, accelerating voltage of 200 kV), and Raman spectroscopy (Raman, Bruker Senterra R200-L, excitation wavelength of 532 nm). The functional groups were determined by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi). The specific surface area of the sample was calculated using the Brunauer–Emmett–Teller method (BET, TriStar 3000 V6.05 A).
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8

Raman Characterization of Graphene Defects

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We used Raman spectroscopy to characterize the defect states of graphene in the composite powders (0.8 vol.% C). Both composite powders before and after the ball-milling were probed. Micro-Raman spectroscopy (Senterra R200-L, Bruker) with an excitation wavelength of 633 nm (1.96 eV) was used. A laser beam power of 10 mW and an exposition time of 10 s was employed so as to collect sufficient Raman intensity, as the embedding of unc into metal matrix drastically reduces the carbon signal. Five measurements were taken in each composite powder (i.e., before and after ball-milling) from different areas. The Raman peaks (D, G, and D) were fitted with Lorentzian functions with the commercial software Origin 8, and we denote their intensities (height) as I(D), I(G), and I(D’). The I(D)/I(G) ratio was used to estimate the domain size of graphene, following the theory and equation described by our previous work44 . For the graphene we used, the crystalline domain size was found to decrease from 1.3 nm to 1.1 nm after ball milling. Since our unc has an average size of ~2.5 nm, this suggests that a large fraction of unc is amorphous.
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9

Characterization of Fe3O4@Graphene Nanocomposites

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The morphology and size of as-synthesized Fe3O4@graphene NPs were observed with a TEM (Tecnai G2 Spirit Biotwin, FEI) operating at 120 KV. XRD patterns were collected by an X-ray polycrystalline diffractometer (D8 Advance, Bruker). Raman spectra were collected by a dispersive Raman microscope (Senterra R200-L, Bruker). XPS spectra were measured by an X-ray photoelectron spectrometer (AXIS, UltraDLD). Magnetization curves of the Fe3O4@graphene NPs were measured by a physical property measurement system (PPMS-9T, Quantum Design). Thermal conductivity of paraffin and paraffin-Fe3O4@graphene composite samples was measured by a transient hot bridge analyzer (Linseis THB-1). Optical spectra were measured by a UV-Vis spectrometer (Lambda 950, PerkinElmer) equipped with an integrating sphere. TGA and DSC analysis was conducted in a differential scanning calorimeter (Netzsch 204 F1) and a thermo gravimetric analyzer (Pyris 1) under nitrogen atmosphere with a heating and cooling rate of 5 °C min−1, respectively.
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10

Characterization of Dispersed Nanocarbons and Metal Flakes

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Zeta potential measurements of the dispersed nanocarbons and metal flakes in aqueous solutions were conducted by Zeta potential analyzer (Brookhaven ZetaPlus) and ten data for each sample were measured. Scanning electron microscopy (SEM, Quanta 250, FEI) was used to characterize the morphology of the composite powders. Biology Transmission Electron Microscope (TEM, Tecnai G2 spirit Biotwin, FEI) and Raman spectroscopy (Senterra R200-L, Bruker Optics) with an Ar+ laser wavelength of 532 nm were applied to analyze the morphology and defects of dispersed and adsorbed SWCNT, respectively.
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