Fls1000 spectrofluorometer

Powder X-ray diffraction (PXRD) data were collected on an UltimaIV diffractometer from Japan Tokyo. The single-crystal X-ray diffraction (SC-XRD) data collection was carried out on a Bruker AXS D8-VENTURE diffractometer (Mo Kα radiation, λ = 0.71073 Å) (Karlsruhe, Germany). Morphologies were observed using a scanning electron microscope (SEM, JSM-7610F, Tokyo, Japan). Thermogravimetric analysis (TGA) was performed using STA449F5 (Netzsch, Selb Germany). An F-4700 fluorescence spectrophotometer (HITACHI, Tokyo, Japan) was used for the collection of luminescence and excitation spectra. Decay curves and PL quantum yields were collected on an FLS 1000 spectrofluorometer (Edinburgh Instruments, Edinburgh, UK). The ultraviolet-visible (UV–vis) absorption spectra were collected on a UV 2600 (Tianmei, Shanghai, China) spectrophotometer.

UV–visible absorption spectra of
the CABI and CABI-xBr films were collected on a Shimadzu
UV-1800 absorption spectrometer (Shimadzu Corporation, Japan). An
FLS1000 spectrofluorometer (Edinburgh Instruments, UK) was employed
to measure steady-state PL spectra of the films. TCSPC measurements
to obtain the TRPL decays were performed using a Picoharp 300 controller
and a PDL 800-B driver for laser excitation. The excitation repetition
rate was 200 kHz and controlled with a Tektronix function generator.
A Hamamatsu R3809U-50 microchannel plate photomultiplier was used
for detection in a 90° configuration.

Emission spectra
and time-dependent PL intensity were measured with an Edinburgh FLS1000
spectrofluorometer under an excitation of λ_ex = 276
nm. Time-dependent PL measurements were registered for the most intense
Eu³⁺ emission band at 620 nm. Absolute photoluminescence
quantum yield (PLQY) measurements were performed in an integrating
sphere using FLS1000. Our films were excited at 285 nm, and the emission
and scattering peaks measured in the integrating sphere in the spectral
range comprised between 270 and 850 nm. In addition, the scattering
and emission peaks of a scattering sample were also measured to serve
as a reference. Spatial-resolved microscopic PL measurements were
obtained using a confocal optical microscope (Leica Stellaris 8) using
an oil immersion objective and 465 nm laser light as excitation source.
Samples were illuminated through a glass coverslip employed as the
substrate. Spatial resolution is diffraction limited (ca. 250 nm ×
250 nm). The step size of the scanning is 70 nm. Emitted photons were
collected in the wavelength range comprised between 606 and 636 nm
that corresponds to the main emission band of GdVO₄:Eu³⁺. Background measurements were taken in the wavelength range
comprised between 780 and 810 nm.

Powder X-ray diffraction (PXRD) data were collected on an UltimaIV diffractometer from Japan Tokyo. The single-crystal X-ray diffraction (SC-XRD) data collection was carried out on a Bruker AXS D8-VENTURE diffractometer (Mo Kα radiation, λ = 0.71073 Å) (Karlsruhe, Germany). Morphologies were observed using a scanning electron microscope (SEM, JSM-7610F, Tokyo, Japan). Thermogravimetric analysis (TGA) was performed using STA449F5 (Netzsch, Selb Germany). An F-4700 fluorescence spectrophotometer (HITACHI, Tokyo, Japan) was used for the collection of luminescence and excitation spectra. Decay curves and PL quantum yields were collected on an FLS 1000 spectrofluorometer (Edinburgh Instruments, Edinburgh, UK). The ultraviolet-visible (UV–vis) absorption spectra were collected on a UV 2600 (Tianmei, Shanghai, China) spectrophotometer.