Fourier transform infrared (FT-IR) spectra were obtained with Nexus-470 FT-IR spectrometer (Nicolet, Madison, USA). Surface morphology measurements were performed using a JSM-7500F scanning electron microscope (SEM) (JEOL, Tokyo, Japan). Raman spectra were acquired on a Thermo Scientific DXR2xi Raman spectrometer (Waltham, MA, USA). Thermal gravimetric analysis (TGA) was obtained on a STA-449F3 instrument (Netzsch, Selb, Germany). All electrochemical experiments were accomplished on a CHI660D electrochemical workstation using a three-electrode system, where a modified glassy carbon electrode (GCE) as the working electrode, a platinum wire electrode used as the auxiliary electrode and a saturated calomel electrode (SCE) as the reference electrode.
Dxr2xi raman spectrometer
Manufactured by Thermo Fisher Scientific
Sourced in United States
The DXR2xi Raman spectrometer is a laboratory instrument designed for Raman spectroscopy analysis. It provides high-quality Raman data collection and processing capabilities. The core function of the DXR2xi is to identify and characterize the molecular composition of samples through Raman spectroscopy techniques.
Automatically generated - may contain errors
Lab products found in correlation
Sta449f3, by Netzsch (1 mentions)
Jsm 7500f scanning electron microscope, by JEOL (1 mentions)
Peakfit software version 4, by Grafiti LLC (1 mentions)
Gemini 300, by Zeiss (1 mentions)
Scientific escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Escalab xi spectrometer, by Thermo Fisher Scientific (1 mentions)
Evo 10 microscope, by Zeiss (1 mentions)
Tga dsc 3, by Mettler Toledo (1 mentions)
Spm 9700ht, by Shimadzu (1 mentions)
D8 advance spectrometer, by Bruker (1 mentions)
Lambda 950, by PerkinElmer (1 mentions)
Jem 2100, by JEOL (1 mentions)
Vertex 70, by Bruker (1 mentions)
4 protocols using dxr2xi raman spectrometer
1
Comprehensive Material Characterization Techniques
2
Raman Spectroscopic Analysis of Surimi Gel
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The protein structure of the BD surimi gel was analyzed by Raman spectroscopy (DXR2xi Raman spectrometer; Thermo Fisher Scientific, USA), according to the method of Herrero et al. (18 (link)). The samples were scanned three times in the range of 50–3400 cm–1, using a λ = 785 nm semiconductor laser operated at room temperature. After smoothing and baseline correction, the spectral peaks were differentiated and imitated using the Peakfit software version 4.1.2 (Systat Software, USA). The intensities of the Raman signals were normalized relative to the phenylalanine peak at 1003 cm–1, as it is insensitive to the microenvironment.
3
Structural Characterization of Hydrogel Composites
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The obtained hydrogel composites were freeze-dried at −60 °C under vacuum conditions before FESEM, XPS, BET and Raman measurement. The morphology and structure characterizations of the samples were observed by means of scanning electron microscopy (FESEM, Gemini300, ZEISS, Jena, Germany). The energy dispersive X-ray spectra (EDS) were collected on Oxford MAX-50 (Oxford, UK). Raman spectrum was measured on a Thermo DXR2xi Raman Spectrometer fitted with a 633 nm laser beam. XPS analysis was performed in a Thermo SCIENTIFIC ESCALAB 250Xi photoelectron spectrometer using Al Kα X-ray source (1486.6 eV). Brunauer–Emmett–Teller (BET) surface area measurements and Barrett–Joyner–Halenda (BJH) porous size distribution were performed at −196 °C by Nitrogen adsorption–desorption on a surface analyzer (ASAP2020).
4
Comprehensive Materials Characterization Protocol
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Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) were carried out on a JEM-2100 (JEOL, Akishima, Tokyo, Japan) instrument operating at an accelerating voltage of 200 kV. Scanning electron microscopy (SEM) images were obtained using EVO-10 microscope (Zeiss, Munich, Germany). Atomic force microscopy (AFM) was conducted using SPM-9700HT (Shimadzu, Kyoto, Japan). Raman spectra were obtained on a DXR2xi Raman spectrometer (Thermo Fisher, Waltham, MA, USA) with 514.5 nm wavelength incident laser light. X-ray photoelectron spectroscopy (XPS) studies were performed on a ESCALAB Xi+ spectrometer (Thermo Fisher, Waltham, MA, USA) using an Al Kα X-ray source. Infrared spectra (IR) were recorded on a micro-infrared spectrometer (Vertex70, Bruker, Germany). X-ray Diffraction (XRD) spectra were obtained on a D8 Advance spectrometer (Bruker, Bremen, Germany).Thermogravimetric analysis (TGA) was performed at a heating rate of 10 K/min under a nitrogen atmosphere (TGA/DSC 3+, Mettler Toledo, Columbus, OH, USA). UV-VIS absorption spectra were recorded on a UV-VIS/NIR spectrophotometer (Lambda-950, PerkinElmer, Waltham, MA, USA).
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