Tecnai g2 f20 x twin

Goethite particles were analyzed using a Thermo Fisher Scientific (former FEI) Tecnai G2 F20 X‐Twin transmission electron microscope equipped with a field‐emission gun. TEM samples were prepared by suspending a few mg of powdered sample in 1 ml of acetone, ultrasonicating for 30 s, then drop‐casting onto a holey carbon Cu TEM grid. Micrographs were acquired at an acceleration voltage of 200 kV as energy‐filtered images on a Gatan GIF Tridiem detector. The width and length dimensions of 200‐400 goethite particles from each experiment were quantified using ImageJ (version 1.52a).^[61] The particle dimensions were measured on isolated particles (and not aggregates) to ensure that the TEM images correspond to a reliable 2D projection of each particle on the TEM grid.

PB-UMN-CS-NPs, PB-UMN-CS-FA-NPs, PB-UMN-CS-ES-NPs and PB-UMN-CS-FA-ES-NPs images were taken by utilizing TEM (FEI Tecnai G2 F20 X-TWIN). The suspensions of nanoformulations were tenfold diluted in purified water before being deposited onto a separate TEM grid with a 400-mesh. The TEM grid, with the dried NPs cast on it, was then subjected to vacuum drying. Subsequently, TEM was used to capture images of the samples 33 (link).

Fluorescence spectra were recorded using a fluorescence spectrophotometer (Hitachi F-7000). UV–Vis absorbance was measured using UV–Vis spectrophotometer (Lambda 35, Perkin Elmer) to ensure the absence of large NPs, which commonly show absorption at about 520 nm. UV light with the excitation of 365 nm was used. To study the protein conformation, far-UV circular dichroism (CD, J-1000 series, JASCO) was employed. The oxidation state of core Au atoms was examined by X-ray photoelectron spectroscopy (XPS, ULVAC-PHI, Inc.). The morphological characterization of BSA/AuNCs was carried out using a high-resolution transmission electron microscope (HRTEM, FEI Tecnai G² F20 X-Twin). The Fourier transform infrared spectroscopy (FTIR) spectra of FA, rGO and FA-rGO were recorded on a FTIR spectrometer (PerkinElmer Frontier).

SWCNHs were purchased from Nec Company (Tokyo, Japan). n-Alcohols C₁-C₄ (A.R. grade) were used as adsorbates (they are denoted as MeOH (methanol), EtOH (ethanol), PrOH (n-propanol) and BuOH (n-butanol). Figure 1 shows the morphology of SWCNH obtained using high-resolution transmission electron microscopy (HRTEM, Tecnai G2 F20 X-Twin, FEI Europe, Eindhoven, North Brabant, Netherlands). Measurement was carried out with an accelerating voltage of 200 kV. The Scanning electron microscopy (SEM) measurements were performed using Quantax 200 with XFlash 4010 detector (Bruker AXS machine). To perform the High Resolution Transmission Electron Microscopy (HRTEM) measurements SWCNHs were dispersed in ethanol (96%, pure p.a., Chempur, Piekary, Śląskie, Poland) in concentration of 0.001 mg·mL using sonication (30 s, 18 W, Sonoplus Mini20, Bandelin, Berlin, Germany). Then the TEM grid (Lacey Carbon film on copper TEM grid, mesh 400, PIK Instruments, Piaseczno, Poland) was immersed in the SWCNHs dispersion and air-dried at room temperature. Images were obtained using a Transmission Electron Microscope (FEI, Tecnai F20 S-Twin, Particulate Systems, Norcross, GA, USA) operated at 200 kV.

The crystalline phase of the as-prepared materials was confirmed by X-ray diffractometer (XRD, XD-2) from 10–80° with a scan rate of 4° min⁻¹. The apparent morphology and distribution of elements were obtained by transmission electron microscope (TEM, FEI Tecnai G2 F20 X-Twin) with an energy dispersive X-ray spectrometer (EDS). The specific surface area was collected by surface area analyzer (BET, Gemini VII 2390). Functional groups and molecular structure were analyzed by the Fourier transform infrared spectrometer (FTIR, Cary 630) from 4000–400 cm⁻¹. The element kinds, contents, and valence states were determined by X photoelectron spectroscopy (XPS, ThermoFisher ESCALAB Xi+, Waltham, MA, USA) from 0–1350 eV.

Scanning electron microscopy (SEM–EDS). The surface morphology and chemical analysis of the investigated composites with AgNPs were investigated by SEM “FEi Quanta 200 FEG”: resolution—1.2 nm, accelerating voltage—20 kV (FEI Company, Hillsboro, OR, USA). The EDS system consists of a Bruker XFlash^® 4030 (FEI, Hillsboro, OR, USA) X-ray energy dispersive detector, signal processor, controller, and ESPRT 2.1 data analysis software. The spectrometer allows for the quantitative and qualitative assessment of the chemical composition of the sample by detecting chemical elements in the area of the sample and determining the distribution map of individual chemical elements on the surface. Additionally, this study allows for the qualitative assessment of the morphology and structural changes of the object under study. Samples were scanned at least three different times.
Transmission electron microscopy (TEM). TEM “Tecnai G2 F20 X-TWIN” (FEI, Hillsboro, OR, USA) studied the size, distribution, and structure of nanoparticles. A Schottky-type field emission electron source was used, and an accelerating voltage of 20–200 kV was applied. The resolution of the microscope was 0.8–1.0 nm. An EDAX Spectrometer with r-TEM detector and 11 MPix ORIUS SC1000B (Gatan Inc., Pleaston, CA, USA) CCD camera were used. Point/line resolution—0.25/0.102 nm.

The morphology and the microstructure were studied using SEM (FEI, XL30 Sirion) and TEM (FEI, Tecnai G2 F20 X-TWIN). The specific surface area was characterized from nitrogen adsorption–desorption measurement (Micromeritics, ASAP 2020). ICP-OES was conducted using a Thermo Scientific ICAP 6300 Duo View Spectrometer.