D max iiia

Manufactured by Rigaku

Sourced in Japan

The D/Max-IIIA is an X-ray diffractometer designed for materials analysis. It is capable of performing powder X-ray diffraction measurements to identify crystalline phases and determine structural properties of materials.

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Lab products found in correlation

Jem 2010hr, by JEOL (2 mentions) Jem 2100, by JEOL (1 mentions) Amicus, by Shimadzu (1 mentions) Raman spectrometer, by Horiba (1 mentions) Sta 499c, by Netzsch (1 mentions) Tg 209 f3, by Netzsch (1 mentions) Uv 3600 plus, by Shimadzu (1 mentions) Invia reflex, by Renishaw (1 mentions) Fls980, by Edinburgh Instruments (1 mentions) Escalab 250, by Thermo Fisher Scientific (1 mentions) Asap 2020m, by Micromeritics (1 mentions) K alpha, by Thermo Fisher Scientific (1 mentions) V 650, by Jasco (1 mentions) Tecnai g2 f30, by Thermo Fisher Scientific (1 mentions) Quanta 200 feg, by Thermo Fisher Scientific (1 mentions) Jem 2010, by JEOL (1 mentions) Nicolet 6700, by Thermo Fisher Scientific (1 mentions) Fe28 standard, by Mettler Toledo (1 mentions)

Close spelling variants of this product

D/max-IIIA X-ray diffractometer (7 citations) D/max-IIIA diffractometer (6 citations) D/Max-IIIA Powder X-ray Diffractometer (2 citations)

12 protocols using d max iiia

XRD Analysis of Crystallite Size

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XRD (D/MAX IIIA, Rigaku Co.) was performed under the following conditions: room temperature; Cu K_α X‐ray source, K_α radiation generated with a Cu target; tube voltage, 30 kV; tube current, 30 mA; scan range, 10–60°(2θ); and scan speed, 4°/min. The average particle size of the crystallites in the powdered sample was calculated using the Scherrer equation (Equation 1):

d = 0.89 λ / β \cos θ

where β is the full width at half maximum (FWHM) of the strongest diffraction peak of the sample, λ is the X‐ray wavelength, and θ is the diffraction angle.

Yang Y., Guan C, & Chen S. (2020). Structural characterization and catalytic sterilization performance of a TiO2 nano‐photocatalyst. Food Science & Nutrition, 8(7), 3638-3646.

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Comprehensive Microstructural and Structural Analysis

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The microstructure of these samples were investigated using scanning electron microscopy (SEM, ZEISS Merlin, Oberkochen, Germany) and transmission electron microscopy (TEM, JEM-2100, JEOL Ltd., Tokyo, Japan). The crystalline structure of the electrode materials was determined using an X-ray diffractometer (XRD, D/max-IIIA with nickel-filtered Cu Kα radiation (λ = 0.15418 nm), Rigaku Corporation, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) was conducted on an AMICUS (Shimadzu, Japan) spectrometer with monochromated Mg Kα radiation. The nitrogen sorption measurements were carried out using an ASAP 2020 analyzer (Micromeritics, Georgia, GA, USA). The Raman spectra were recorded on a Raman Spectrometer (HORIBA Jobin Yvon, Paris, France).

Li X.S., Xu M.M., Yang Y., Huang Q.B., Wang X.Y., Ren J.L, & Wang X.H. (2019). MnO2@Corncob Carbon Composite Electrode and All-Solid-State Supercapacitor with Improved Electrochemical Performance. Materials, 12(15), 2379.

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Multianalytical Characterization of Nanomaterials

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For transmission
electron microscopy
(TEM) and high-resolution TEM (HRTEM) images, the samples were recorded
on a field-emission transmission electron microscope (JoelJEM-2001F)
to measure the size and size distribution of particles by depositing
them on carbon-coated copper grids (holey carbon, 200 mesh Cu) and
leaving them to dry at room temperature. Powder X-ray diffraction
(XRD) patterns were acquired on a D/MaxIIIA (Rigaku) diffractometer
using Cu Kα radiation (λ = 1.54 Å) in a 2θ
range from 5 to 80° at a scan rate of 0.02° per step. Thermogravimetric
analysis (TGA) and differential scanning calorimetry (DSC) were performed
using a simultaneous thermal analyzer (STA 499C, Netzsch) at a heating
rate of 10 °C·min^–1 in a flowing nitrogen
atmosphere from room temperature to 800 °C. Fourier transform
infrared (FT-IR) spectra were obtained on an FT-IR spectrometer (Nicolet
iS50) using KBr pellets. The electrical conductance (EC) was recorded
on an EC meter (DDSJ-308F).

Chen S., Xu Y., He X., Su Y., Yang J., Chen W, & Tan H. (2019). Microemulsion Synthesis of Nanosized Calcium Sulfate Hemihydrate and Its Morphology Control by Different Surfactants. ACS Omega, 4(5), 9552-9556.

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Comprehensive Characterization of Doped Microcrystalline Powders

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Powder X-ray diffraction (PXRD) patterns were tested on a Rigaku D/max-IIIA diffractometer with Cu Kα (1.54 Å) radiation at 293 K. Steady-state PL spectrums were recorded by Edinburgh Instruments FLS 980 at room temperature (25 °C) for all samples. Diffuse reflectance spectrums of the microcrystalline powders were recorded on a UV/Vis spectrophotometer (SHIMADZU, UV3600Plus), calibrated by simultaneous measurement of the substance (BaSO₄ powder), and then converted to absorbance using the KubelkaMunk theory. The thickness and roughness of the samples remained consistent during the study with different doping levels. Thermogravimetric Analysis spectrums were measured on NETZSCH TG209F3 with the heating rate of 10 K per minute in N₂ atmosphere. Raman spectrums were obtained on RENISHAW inVia Reflex. The XPS measurements were performed on Thermal Scientific Escalab 250 Xi-UPS. An Al Kα (1486.6 eV) X-ray was used as the excitation source for XPS.

Yang C., Guo F., Wang S., Chen W., Zhang Y., Wang N., Li Z, & Wang J. (2023). Admirable stability achieved by ns2 ions Co-doping for all-inorganic metal halides towards optical anti-counterfeiting. RSC Advances, 13(16), 10884-10892.

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Multimodal Characterization of Quasione-Dimensional Nanomaterials

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The morphology of the samples was examined using the thermal field-emission environmental scanning electron microscope (Quanta 400F, FEI/OXFORD/HKL, Dutch). The crystal structure analysis was conducted by XRD instruments (D/Max-IIIA, Rigaku, Japan) using Cu-Kα radiation (λ = 1.5418 Å). The TEM, high-resolution TEM images, and SAED were obtained with a JEOL JEM- 2010HR transmission electron microscope operating at 200 kV. Chemical composition of QNHMs was analysed by X-ray photoelectron spectroscopy (ESCALAB 250, Thermo-VG Scientific). The pore characteristics and specific surface area were measured by a nitrogen adsorption–desorption apparatus (ASAP 2020M, Micromeritics).

Zhou Y., Liu Y., Zhao W., Wang H., Li B., Zhou X, & Shen H. (2015). Controlled synthesis of series NixCo3-xO4 products: Morphological evolution towards quasi-single-crystal structure for high-performance and stable lithium-ion batteries. Scientific Reports, 5, 11584.

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X-ray Diffraction Analysis of GF Samples

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X-ray diffraction (XRD) was performed using DMAX-IIIA (Rigaku, Akishima-shi, Japan) with 2 kW X-ray source. Well-grounded GF samples were positioned on a silicon wafer, and data collection was done between 10° and 60°. The composition of the precipitates was determined using an ATSAS 2.7 (BIOSAXS GmbH, Hamburg, Germany).

Kim W., Lee W., Huh E., Choi E., Jang Y.P., Kim Y.K., Lee T.H, & Oh M.S. (2019). Ephedra sinica Stapf and Gypsum Attenuates Heat-Induced Hypothalamic Inflammation in Mice. Toxins, 12(1), 16.

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Characterization of Brush-Coated LaYSrO Films

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The chemical compositions of the formed brush-coated LaYSrO films were investigated by XPS (K-alpha, Thermo Scientific, Waltham, MA, USA) using a 12 kV/3 mA power source and monochromatic Al X-ray source (Al Ka line: 1486.6 eV). The surface morphologies of the brush-coated LaYSrO films were then investigated using AFM (NX-10, Park Systems, Suwon, Korea). Spin-coated LaYSrO films were also examined for comparison at the same curing temperatures. The optical transparencies of the brush-coated LaYSrO films were measured by UV–Vis–NIR spectroscopy (JASCO Corporation, V-650) in the wavelength range of 250–850 nm. The film crystallinity was investigated by XRD (DMAX-IIIA, Rigaku, Tokyo, Japan) measurements in the range of 20° to 80° in the 2θ scan mode.

Lee D.W., Kim D.H., Oh J.Y., Kim D.H., Choi S.H., Kim J.A., Park H.G, & Seo D.S. (2022). Self-Aligned Liquid Crystals on Anisotropic Nano/Microstructured Lanthanum Yttrium Strontium Oxide Layer. Materials, 15(19), 6843.

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Multi-technique Materials Characterization

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XRD was performed using a Rigaku D/Max-IIIA x-ray diffractometer with Cu Kα radiation (λ = 1.54056 Å, 40 kV, 20 mA) at a scanning rate of 2 deg/s. TEM images, SAED patterns, and HRTEM images were obtained using a JEOL JEM-2010HR instrument (at an accelerating voltage of 200 kV), an FEI Tecnai G2 F30 transition electron microscope equipped with a field emission gun (at an accelerating voltage of 300 kV), and an EDX spectrometer. The sample was pipetted onto a carbon support film on a copper grid. SEM images of the as-synthesized samples were obtained using a Quanta 400F field emission scanning electron microscope operated at 10 kV.

Pan B., Xiao J., Li J., Liu P., Wang C, & Yang G. (2015). Carbyne with finite length: The one-dimensional sp carbon. Science Advances, 1(9), e1500857.

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Quantifying Crystalline Domains via XRD

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XRD patterns were obtained for samples with a D/Max-IIIA diffractometer (Rigaku, Tokyo, Japan) using Ni-filtered Cu Kα radiation (λ = 1.54 Å) at 40 kV and 20 mA. The diffraction angle ranged from 5° to 60° with a step-scan of 0.01°. Prior to determination, all samples were lyophilized. Sample crystallinity was determined by plotting the peak baseline on the diffractogram. The areas above and under the curve corresponded to crystalline domains and amorphous regions, respectively. The ratio of upper area to total area was taken as relative crystallinity.

Wang S., Ding L., Chen S., Zhang Y., He J, & Li B. (2022). Effects of Konjac Glucomannan on Retrogradation of Amylose. Foods, 11(17), 2666.

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Powder X-ray Diffraction Analysis of HAP

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Powder X-ray Diffraction (XRD, D/Max-IIIA, RIGAKU, Japan) was utilized to identify the crystalline phase. The crystallite size was calculated by Scherrer's formula as follows: X_hkl = kλ/β_1/2cosθ, where X_hkl is the crystallite size (nm); λ the wavelength of monochromatic X-ray beam (nm); β_1/2 the full width at half maximum of diffraction peak; θ the diffraction angle (°); and k is a constant varying with crystal habit and chosen to be 0.9. The diffraction peaks of (002) and (310) Miller's plane families were used to calculate the crystallite sizes of HAP, showing the crystal growth along the c-axis and along a direction perpendicular to c-axis of HAP crystalline structure. The crystallinity degree (X_c) of HAP powders was evaluated by the equation: X_c ≈ 1–V_112/300/I₃₀₀, where I₃₀₀ is the intensity of (300) diffraction peak and V_112/300 is the intensity of the hollow between (112) and (300) diffraction peaks.

Han Y., Li S., Cao X., Yuan L., Wang Y., Yin Y., Qiu T., Dai H, & Wang X. (2014). Different Inhibitory Effect and Mechanism of Hydroxyapatite Nanoparticles on Normal Cells and Cancer Cells In Vitro and In Vivo. Scientific Reports, 4, 7134.

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