Measurements of printed objects were made using SEM micrographs. To enhance sample conductivity, the samples were sputter-coated with gold (Sputter Coater 108) prior to imaging. The samples were placed 3 cm under the gold target and were coated for 1 min at 0.05 mbar and 20 mA. SEM imaging was performed with a Zeiss Supra 55VP Field Emission SEM. The samples were imaged at 6-mm working distance with the secondary electron sensor, 3-kV accelerating voltage and 30-μm aperture size.
Supra 55vp field emission sem
Manufactured by Zeiss
Sourced in Germany
The Supra 55VP field emission SEM is a scanning electron microscope designed for high-resolution imaging and analysis of a wide range of materials. It features a stable field emission gun, high-performance detectors, and advanced software for data acquisition and processing.
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Lab products found in correlation
8 protocols using supra 55vp field emission sem
1
SEM Imaging of Printed Objects
2
SEM Imaging of Printed Objects
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Measurements of printed objects were made using SEM micrographs. To enhance sample conductivity, the samples were sputter-coated with gold (Sputter Coater 108) prior to imaging. The samples were placed 3 cm under the gold target and were coated for 1 min at 0.05 mbar and 20 mA. SEM imaging was performed with a Zeiss Supra 55VP Field Emission SEM. The samples were imaged at 6-mm working distance with the secondary electron sensor, 3-kV accelerating voltage and 30-μm aperture size.
3
Morphological Analysis of Plasma-Treated PLGA Fibers
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The surfaces of the untreated (PLGA) and plasma treated PLGA microfibers have been examined and imaged using a Supra 55VP field-emission SEM at 5 kV accelerating voltage (Carl Zeiss AG, Jena, Germany) after being gold coated using a sputter coater. Using the imageJ software (NIH, Wisconsin, WI, USA), the average fiber diameter size was determined from around 100 fibers from each fleece type randomly chosen (n = 3 for each fleece type) while the changes in fiber orientation before and after CAP treatment were assessed using the directionality Plugin (n = 3 for each fleece type). This plugin chops the image into square pieces and computes their Fourier power spectra allowing the generation of statistics data on the basis of the highest peak found represented by direction (the center of the Gaussian), dispersion (the standard deviation of the Gaussian), and goodness (the goodness of the fit, 1 is good and 0 is bad).
4
Field Emission SEM Analysis of Samples
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We used a Zeiss Supra 55 VP Field Emission® SEM coupled to energy dispersive X-ray spectrometry (EDS) at the Université Pierre et Marie Curie (Paris, France). Images were collected with a beam acceleration voltage of 15 kV using a backscattered electron (BSE) detector (AsB). EDS analyses and chemical mapping were carried out with a Bruker Xflash Quad® spectrometer using the microanalysis system Quantax. All the samples analyzed by SEM were prepared free of epoxy resin to avoid organic contamination (see “Sample preparation” section) and Au-coated. The samples were treated in an ultrasonic bath to remove particulates from all surfaces.
5
SEM Imaging of Alginate Cryogels
6
Ultrastructural Analysis of Biological Specimens
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For transmission electron microscopy (TEM), specimens were fixed and decalcified following the same procedure as the tissues embedded in methacrylate. They were then rinsed in PBS and dH2O before postfixation in 1% OsO4; they were dehydrated in ethanol (70, 90 and 100%) and embedded in Epon 812 (Fluka Chemie AG, Switzerland). Ultrathin sections (50 nm) were placed on grids, contrasted with uranyl acetate and lead citrate, and viewed in a JEM‐1011 transmission electron microscope (JEOL, Tokyo, Japan).
For scanning electron microscopy (SEM), the specimens were fixed according to the same procedure as for light microscopy. Specimens were carefully sectioned with razor blades, rinsed in PBS, postfixed in 1% OsO4, and rinsed in dH2O. All specimens were then dehydrated in an acetone series (50, 70, 90, and 100%), dried to critical point, coated with gold‐palladium and studied in a Supra 55VP field emission SEM (Zeiss, Jena, Germany).
For scanning electron microscopy (SEM), the specimens were fixed according to the same procedure as for light microscopy. Specimens were carefully sectioned with razor blades, rinsed in PBS, postfixed in 1% OsO4, and rinsed in dH2O. All specimens were then dehydrated in an acetone series (50, 70, 90, and 100%), dried to critical point, coated with gold‐palladium and studied in a Supra 55VP field emission SEM (Zeiss, Jena, Germany).
7
Ultrastructural Analysis of Biological Specimens
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For transmission electron microscopy (TEM), specimens were fixed and decalcified following the same procedure as the tissues embedded in methacrylate. They were then rinsed in PBS and dH2O, before post‐fixation in 1% OsO4, dehydrated in ethanol (70, 90, and 100%), and embedded in Epon 812 (Fluka Chemie AG, Buchs, Switzerland). Ultrathin sections (50 nm) were placed on grids, contrasted with uranyl acetate and lead citrate, and viewed in a Jeol 1011 TEM.
For scanning electron microscopy (SEM), the specimens were fixed according to the same procedure as for light microscopy. Specimens were carefully sectioned with razor blades, rinsed in PBS, postfixed in 1% OsO4, and rinsed in dH2O. All specimens were then dehydrated in an acetone series (50, 70, 90, and 100%), dried to critical point, coated with gold‐palladium and studied in a Zeiss Supra 55VP field emission SEM.
For scanning electron microscopy (SEM), the specimens were fixed according to the same procedure as for light microscopy. Specimens were carefully sectioned with razor blades, rinsed in PBS, postfixed in 1% OsO4, and rinsed in dH2O. All specimens were then dehydrated in an acetone series (50, 70, 90, and 100%), dried to critical point, coated with gold‐palladium and studied in a Zeiss Supra 55VP field emission SEM.
8
Imaging Organo-Mineral Aggregates via SEM
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SEM was used to image the texture of organo-mineral aggregates. Solid phases were recovered from 1 mL of suspension by centrifugation in small centrifuge tubes (14,000 rpm, 15 min), rinsed, and resuspended in anoxic water. A drop of suspension was then deposited and dried on a small chip broken off an Si wafer in the anaerobic chamber. The Si chip was fixed onto an aluminum stub with double-sided carbon tape. Samples were imaged with a Supra 55VP field emission SEM (Zeiss) operating at the Harvard Center for Nanoscale Systems (CNS). Secondary electron images were obtained at a voltage of 10 kV and a working distance of 3-4 mm with an Everhart-Thornley secondary electron detector or an InLens detector.
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