Auriga scanning electron microscope
The Auriga scanning electron microscope is a high-performance imaging and analysis tool designed for a wide range of applications. It provides high-resolution, high-contrast images of a variety of materials and samples. The Auriga utilizes a focused electron beam to scan the surface of the sample, generating detailed information about its topography and composition.
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17 protocols using auriga scanning electron microscope
Gold Sputtering and SEM Characterization
Nanofiber Scaffold Preparation for SEM Imaging
Fixed samples were then critical point dried with EM CPD300 (Leica Microsystems, Wetzlar, Germany), removed from Minusheets, gold-palladium sputtered, and examined using an AURIGA® scanning electron microscope (SEM) (Carl Zeiss, Jena, Germany).
SEM Imaging and EDX Analysis of Diatom Biofilms
After fixation, dehydration and Au/Pd-sputtering, the biofilm-covered Thermanox disks were imaged with a Zeiss “AURIGA” scanning electron microscope, controlled with the “SmartSEM” software v05.04.05.00. The elemental composition of samples was analysed by energy-dispersive X-ray (EDX) spectroscopy. Samples were excited with the AURIGA’s electron beam at 10 kV and the emitted X-rays (of specific energy levels due to the elemental electron configuration) were recorded with an Oxford Instruments “X-Max 20 mm2” detector (Oxford Instruments, Scotts Valley, California, USA) and the “INCA” software v4.15.
Biofilm Structural Analysis via SEM and TEM
Scanning Electron Microscopy of Bacterial Cultures
Microscopy Techniques for Biofilm Analysis
Electron Microscopy Sample Preparation
Nanoporous Model System Characterization
Scanning Electron Microscopy for Membrane Analysis
Laser Textured Surface Evaluation
The contact angles for all the samples were determined before and after the surface modification process. Droplets with a volume of 2 μL were placed on the surfaces of each sample. Deionized water was used as the measuring liquid. Photos of the drops were made 5 s after they were placed, determining the contact angle by tangents to the external droplet profile on both sides. In each case, five measurements were made and an average value was calculated. Due to the significant effect of microgeometry on the surface roughness of the samples, no free surface energy was determined.
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