Ultra plus field emission microscope
The ZEISS Ultra Plus Field Emission microscope is a high-resolution imaging instrument designed for advanced materials analysis. It utilizes a field emission electron source to produce a stable, high-brightness electron beam, enabling the capture of detailed images at the nanoscale level. The microscope is equipped with a range of analytical capabilities to support materials science research and industrial applications.
4 protocols using ultra plus field emission microscope
Cryogenic Imaging of Candida albicans
Ultrastructural Analysis of Venetoclax-Treated Cells
Microparticle Characterization by SEM and TEM
Microparticle Characterization by SEM and TEM
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