Jsm 6330f fe sem
The JSM-6330F FE-SEM is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The FE-SEM utilizes a field emission electron source to generate a focused electron beam that scans the surface of a sample, generating various signals that are detected and used to create an image.
2 protocols using jsm 6330f fe sem
Diacetylenic Lipid Characterization
Multimodal Imaging of Leaf Stomata
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