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Fib sem

Manufactured by Zeiss
Sourced in Germany

The FIB-SEM is a high-performance analytical instrument that combines a focused ion beam (FIB) and a scanning electron microscope (SEM) in a single system. The FIB is used to precisely mill and modify the surface of a sample, while the SEM provides high-resolution imaging and analysis of the modified sample. This integrated system enables both structural and chemical characterization of materials at the nanometer scale.

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11 protocols using fib sem

1

Histological and ultrastructural analyses of testes

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For H&E staining, testes were fixed in modified Davidson's Fluid (30% of a 37–40% stock solution of formaldehyde, 15% ethanol, 5% glacial acetic acid and 50% distilled H2O) and embedded in paraffin. Sections were cut at a thickness of 5 μm. The sections were then deparaffinized, rehydrated, stained with H&E, dehydrated, and mounted.
Ultrastructural examination has been described previously (37 (link)). Briefly, 4% (vol/vol) glutaraldehyde-fixed tissues were postfixed with 2% (w/v) OsO4 and embedded in araldite. Ultrathin sections (80 nm) were stained with uranyl acetate and lead citrate and analyzed by EM (JEM. 1010, JEOL).
For focused ion beam scanning electron microscopy (FIB-SEM; Carl Zeiss AG), the tissues embedded in araldite were coated with a thin layer of gold using a Cressington 108Auto system. FIB-SEM was used to collect 3D data. The focused ion beam milled the cross-section, and the scanning electron beam imaged the newly milled cross-section. The XY pixel size was 10 nm, and the Z interval was 20 nm.
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2

Comprehensive Characterization of Precursor Powders

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The morphology and element distribution
of the precursor or lithiated powders was checked with scanning electron
microscopy (SEM, SU-700, Hitachi) equipped with an energy dispersive
spectroscopy (EDS) system. Focused ion beam scanning electron microscope
(FIB-SEM, Carl Zeiss Auriga) featuring a Schottky field emission Gemini
electron column was used to cut the particles. The crystalline form
was determined by X-ray powder diffraction (PANalytical, Empyrean
X-ray diffractometer) using a Cu Kα radiation source. The composition
of the synthesized powders was measured by inductively coupled plasma-optical
emission spectrometry (ICP-OES, Agilent Technologies, 5110-MS). Tap
density was measured using Autotap from Quantachrome instruments.
Thermogravimetric analysis (TGA) and differential scanning calorimetry
(DSC) thermal graphs were obtained from TGA Q500 and DSC Q1000 (TA
Instruments) at a ramp of 10 °C min–1. Crystal
size was analyzed by a laser diffraction instrument (Sympatec HELOS
equipped with ASPIROS feeder) operating at 300 kPa.
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3

Comprehensive Material Characterization Protocol

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Analysis of the crystal information and chemical composition of the as-prepared samples was performed by X-ray diffraction (XRD) using a Rigaku D/max-2500 (Cu Ka radiation, k = 0.15406 nm) at a scanning speed (5 min−1) in the range of 5–80°. FIB/SEM (Zeiss Model Auriga) was used to evaluate the morphology and structure of the prepared samples. The Fourier transform infrared spectra (FT-IR) of the samples were recorded on a Nicolet iS5 spectrometer using the KBr disk method with a sample/KBr mass ratio of 1 : 100 within the range of 4000 to 400 cm−1. The surface element state analysis was recorded by X-ray photoelectron spectroscopy (XPS, Thermo ESCALAB 250Xi X-ray photoelectron spectrometer). The samples were detected by a LabRAM HR Evolution Raman spectrometer. N2 adsorption–desorption isotherms were determined by using a Micrometric instrument (ASAP 2020). The photocatalytic activity of the samples was measured by a UV-3600 UV visible near-infrared spectrophotometer.
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4

Characterization of Photolithographic Patterns

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Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam (HT=2 kv, WD=5mm) was used for the characterization of photolithographic patterns, and the detailed analysis of the microdiskś thickness, diameter, surface roughness and NP density per μm2 of surface. The microdisks’ thickness and morphology were investigated by tilting samples to 60 or 80 degrees.
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5

Imaging PDMS Surface Topography

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Samples were sputter-coated with Au-Pa for 50 s (85 Å thickness). A FIB-SEM (Zeiss) was used to image surface topography of patterned PDMS substrates.
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6

Characterization of Etch Profiles

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The etch profiles were characterized using a focused ion beam-scanning electron microscope (FIB-SEM, Zeiss Auriga Compack, Guangzhou, China). Etch rate of every sample was determined in the middle part of the sample cell through the mechanical measurement using a DektakXT® stylus profilometer with 2 µm stylus tip radius.
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7

Characterization of Polymer Microplastics

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The morphology of the two MPs was determined using focused ion beam scanning electron microscopy (SEM, Zeiss/Auriga FIB SEM). The zeta potential of PET and PS MPs in aqueous solution was determined using a microelectrophoresis apparatus (JS94H, Shanghai Zhongchen Digital Equipment Co., Ltd, Shanghai, China). The particle size of MPs was estimated by laser particle-size distribution (BT-9300, Bettersize Instruments Ltd, Dandong, Liaoning, China).
Phase analysis was conducted using an X-ray diffractometer (XRD, with Cu Kα radiation, λ = 1.54 Å, Philips, PANalytical B.V., Holland). The chemical states and bonding were defined using X-ray photoelectron spectroscopy (XPS, Escalab 250Xi, Thermo Scientific). indicating the lower crystallinity of PS relative to that of PET (Veisi et al., 2018) .
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8

Characterization of Hydrogel Microstructure

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The hydrogel samples were first frozen with liquid nitrogen and then freeze-dried for the following characterization. Focused ion beam scanning electron microscopy (FIB-SEM, Zeiss/Auriga-Bu*) was performed to analyze the microstructure of the hydrogels. X-ray diffraction (XRD) was performed using an X-ray diffractometer (DX-2700BH) equipped with a Ni-filtered Cu Ka radiation source (l = 1.5405 Å) in the 2y range of 5-601 with a scan rate of 51 min À1 . The crystallinity of the hydrogel samples was evaluated as the ratio between the area of crystalline reflection in the 2y range 18-211 and the area subtending the whole diffraction profile. 22 Fourier transform infrared (FT-IR) nicolet iS50 spectroscopy (Thermo Fisher) was applied to record the FT-IR spectra.
The static conductivity of the hydrogel samples was measured by the standard four-probe technique (RTS-8).
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9

Analytical Characterization of Cantilever Cross-Sections

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Cantilever cross-sections were prepared using an Auriga focused ion beam scanning electron microscope (FIB-SEM, Zeiss, Germany). A sacrificial platinum layer was deposited atop the metallised surface of the cantilever, to protect it from the milling beam. The crystal structure of the modified cantilever at the interface between the Si and metal film was then analysed using a Titan 80-30 TEM (FEI, USA). The chemical composition of the metal layer was analysed using energydispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS).
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10

Characterization of Coating Solutions

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The coating solutions were characterized using a Varian INOVA-500 1H NMR spectrometer (Varian Medical Systems, Palo Alto, CA) with D2O as the solvent. Additionally, the solutions were drop-cast onto wafers, and the dried aggregates were examined using a focused-ion beam SEM (FIB-SEM, Auriga, ZEISS International, Germany) and attenuated total reflectance Fourier-transform infrared spectrometer (ATR-FTIR, Vertex 70, Bruker, MA).
Water contact angles were determined using a Ramé Hart goniometer (Model 190, Succasunna, NJ) and 10 μL water droplets. Five measurements were recorded for each sample. For the coating layers in the polystyrene wells, the thickness was determined using an F20 instrument (Filmetrics, Inc., San Diego, CA).18 X-ray photoelectron spectroscopy (XPS) was used for elemental analysis of the coated wafers with a Kratos AXIS Ultra DLD Spectrometer (Kratos Analytical, Manchester, UK). The spectra were collected from spot sizes of 300 μm × 700 μm and analyzed using the CasaXPS software package.30
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