Multimode 8 afm system
The Multimode 8 AFM system is a versatile atomic force microscope that provides high-resolution imaging and measurement capabilities. It is designed to analyze the surface topography and properties of a wide range of materials at the nanoscale level.
Lab products found in correlation
10 protocols using multimode 8 afm system
Comprehensive Characterization of g-C3N4 Heterojunctions
Comprehensive Characterization of Perovskite QDs
Characterizing Nanomaterials with Advanced Techniques
Structural Analysis of GalNAc-T3 Interactions
Topographic Imaging of Supported Lipid Bilayers
Characterization of Carbon Quantum Dots
Patterned Nanocomposite Fabrication on PMMA
Tapping Mode AFM Imaging of Ultrasharp Tips
Topographic Imaging of Supported Lipid Bilayers
Topographical Characterization of CS and CS-GG Beads
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