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10 protocols using multimode 8 afm system

1

Comprehensive Characterization of g-C3N4 Heterojunctions

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Transmission electron microscopy (TEM, JEOL, Tokyo, Japan) and high-resolution TEM (HRTEM) images were taken on a JEOL-2100F transmission electron microscope. Scanning electron microscopy (SEM, JEOL, Tokyo, Japan) images, energy dispersion spectrum (EDS), and elemental mapping images of the samples were taken on a JSM-4800F scanning electron microscope. Atomic force microscopy (AFM, Bruker, Billerica, MA, USA) images were measured on a Bruker Multimode 8 AFM system. X-ray diffraction (XRD, Rigaku Corporation, Tokyo, Japan) patterns of g-C3N4, EF, and as-prepared EFC heterojunctions were taken on a Rigaku Smartlab diffractometer. Fourier-transform infrared spectra (FTIR, ThermoFisher, Waltham Mass, MA, USA) were recorded on a Nicolet NEXUS 470 spectrometer in the range of 4000–400 cm−1. XPS spectra (ThermoFisher, Waltham, MA, USA) were detected on a Thermo ESCALAB 250XI X-ray photoelectron spectroscopy spectrometer equipped with anAlKαX-ray source. The N2 adsorption desorption isotherms and BET specific surface area was measured on a Micromeritics ASAP 2460 analyzer at 77 K (Micrometrics, Londonderry, NH, USA).
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2

Comprehensive Characterization of Perovskite QDs

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Cross sections of the perovskite fibre were characterized by a Zeiss Auriga FIB-SEM system. The UV-Vis spectra of the perovskite QD solutions were measured by a Shimadzu UV-3600 UV/VIS/NIR spectrophotometer. SEM images were obtained by using a FEI Quanta 250FEG system, and AFM images were acquired by a Bruker Multimode 8 AFM system. The PL spectra of the QDs were measured by using an Agilent Cary Eclipse spectrometer. The photodetector characteristics were measured by a Keysight B1500A semiconductor analyser. The EL spectra and L-J-V characteristics were collected by using a Keithley 2400 source metre, a spectroradiometer (Cs-2000, Konica Minolta), and a close-up lens at room temperature. The viscosities of the pure and molecule-doped QD solutions were acquired on a Malvern Rheometer Instrument (Kinexus Lab+, UK). The surface tensions of the pure and molecule-doped QD solutions were measured using a Kibron EZ Pi-Plus tensiometer. The light communication system consisted of an oscilloscope (DSO9254A, Keysight), a 405 nm OBIS laser, an arbitrary waveform generator (33622 A, KEYSIGHT) and a photodiode module (C12702-11, Hamamatsu).
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3

Characterizing Nanomaterials with Advanced Techniques

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Thermogravimetric analysis (TGA) was performed with a Q-600 Simultaneous TGA/DSC from TA Instruments. AFM measurements were performed with a Bruker Multimode 8 AFM system in tapping mode using ScanAsyst Air silicon cantilevers. Cryo-TEM specimens were imaged with a FEI Talos 200C high-resolution TEM at an accelerating voltage of 200 kV below −175 °C, using a Gatan 626 cryo-holder. The specimens were studied in the low-dose imaging mode to reduce electron beam radiation damage. Images were recorded digitally by a FEI Falcon III direct-imaging camera and the TIA software, with the help of the “phase plates” (FEI) to enhance image contrast.42,43 (link) Absorbance measurements were acquired using a Shimadzu 2450 UV-Visible spectrophotometer. Photoluminescence spectra were measured with a Horiba Nanolog Spectrophotometer. The samples were excited at 250 nm through a 5 nm slit and recorded from 290 to 450 nm with a slit width of 5 nm. DLS and zeta potential measurements were obtained using a Malvern Zen 3600 Zetasizer with the dispersions injected into disposable polystyrene cuvettes and folded capillary cells respectively. All measurements were conducted at 25 °C and at the natural pH of the surfactant solution. For zeta potential measurements, the sample was dialyzed in Cellu-Sep H1 cellulose tubular membranes (MWCO: 2000) for 6 hours to remove excess surfactant.
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4

Structural Analysis of GalNAc-T3 Interactions

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HsGalNAc-T3 in buffer A (100 nM transferase, 25 mM MES pH 6.0, 1 mM TCEP and 400 nM MnCl2) was incubated on freshly cleaved muscovite mica pieces (Electron Microscopy Sciences) for 10 min at room temperature. The enzyme was further incubated with 1 μM UDP, 1–4 μM FGF23c and 1–4 μM MUC5AC-3 for 15 min under mild stirring at room temperature. Note that MUC5AC-3 was previously reported to be a monoglycopeptide substrate for GalNAc-T3 (ref.23 (link)). After sample incubation, the substrate was washed extensively with the buffer to remove unbound molecules. AFM measurements were performed in buffer A at 20 °C using the Tapping Mode on a MultiMode 8 AFM system (Bruker) at 18 kHz, using a 2 nm ultrasharp V-shaped silicon nitride cantilevers (SNL-D; Bruker Probes) with a spring constant of 0.06 N m−1 and nominal resonant frequency of 18 kHz.
AFM images were further analyzed with the WSxM software54 (link). At least, three samples per condition were analyzed using data obtained from ten images of ten different 500 nm2 area regions55 (link). Each feature was further analyzed using the zoom function of the WSxM program, performed without losing image information and discarding nonclear artifacts56 (link).
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5

Topographic Imaging of Supported Lipid Bilayers

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Topographic imaging of SLBs – DLPC and DLPC/DLPG (3:1 molar ratio) – was performed in aqueous buffers at room temperature. A Multimode 8 AFM system (Bruker AXS, CA, USA) was used to record images using Peak Force Tapping™ mode and MSNL-E cantilevers (Bruker AFM probes, USA). Images were taken at the PeakForce frequency of 2 kHz, PeakForce amplitude of 10-20 nm and PeakForce set point of 10-30 mV (<100 pN). Image processing was done using Gwyddion (http://gwyddion.net) for flattening (line-by-line background subtraction) and plane fitting. Cross-sections were recorded using Gwyddion and were then plotted using Origin (OriginLab, MA, USA). Peptides diluted in 20 mM MOPS containing 120 mM NaCl (pH 7.4) were transferred into a 100-μL fluid cell (Bruker AXS, USA) to the final concentrations stated.
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6

Characterization of Carbon Quantum Dots

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Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images of the CQDs were recorded on a Hitachi-F20 transmission electron microscope (Tokyo, Japan). The atomic force microscopy (AFM) images were recorded on a Bruker Multimode 8 AFM system (Karlsruhe, Germany). Photoluminescence (PL) measurements were conducted on a RF-6000 spectrofluorometer (Shimadzu, Japan). The X-ray photoelectron spectroscopy (XPS) analysis used an ESCALAB 250Xi (Thermo Fisher Scientific, Madison, USA) photoelectron spectrometer. Fourier transform infrared (FTIR) spectra were collected on a Bruker Nicolet 6700 spectrometer (Karlsruhe, Germany). UV-Vis absorption spectra were obtained on a 4501S UV-vis spectrophotometer (Gangdong, Tianjin, China) at room temperature. A KT7-900-434 high-speed centrifuge from Heller International Trading Co., Ltd. (Kenda, Germany) was used. The confocal microscopic images were acquired using a confocal laser scanning BX53 fluorescence–confocal microscope (Olympus, Japan). The pH value of the solution was measured by a S210 pH-meter (Mettler Toledo, Germany). All reagents were weighed with an AL104 electronic balance (Mettler Toledo Measurement Instrument Co, Ltd.; Shanghai, China).
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7

Patterned Nanocomposite Fabrication on PMMA

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The patterned nanocomposites were fabricated on poly(methyl methacrylate) (PMMA). Initially, PMMA thin films were produced on glass cover slips of 18 mm in diameter. The glass cover slips surfaces were first activated with oxygen plasma (Tepla 600) at 300 W for 5 min to improve the adhesion and then, a solution of PMMA (Mw 120.000, Sigma-Aldrich) on toluene (7.5 wt/v%) was spin-coated at 1000 rpm for 1 min and the resultant film annealed at 100 °C. Subsequently, the films were activated with oxygen plasma (Tepla 600) at 50 W for 1 min and the prepared (0.5 wt/v%) TiO2 or ZnO NP dispersions spin coated. On the PMMA-NP prepared films, the moth-eye nanocomposite structures were nanoimprinted at 170 °C and 45 bars of pressure for 5 min using an Eitre 3 Nanoimprint lithography system (Obducat Technologies AB) using a PDMS working mould. As control substrates, smooth nanocomposites were prepared following the same conditions but pressed using instead a flat slab of PDMS. The PDMS working mould was obtained by replication of a master nickel mould (HT-AR-02, Temicon) as reported before.13 (link) The nanocomposite substrates were imaged by scanning electron microscopy (SEM) using an Auriga FIB-SEM system (Zeiss) and by atomic force microscopy (Multimode 8 AFM system, Bruker).
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8

Tapping Mode AFM Imaging of Ultrasharp Tips

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AFM measurements were performed using a MultiMode 8 AFM system (Bruker). Images were taken using the Tapping Mode with V-shaped silicon nitride cantilevers with integrated pyramidal 2 nm ultrasharp tips exhibiting a spring constant and a frequency of 0.03 N m−1 and 15 kHz, respectively (MSNL-D; Bruker Probes). Additional details are in Supplementary Methods.
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9

Topographic Imaging of Supported Lipid Bilayers

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Topographic imaging of SLBs – DLPC and DLPC/DLPG (3:1 molar ratio) – was performed in aqueous buffers at room temperature. A Multimode 8 AFM system (Bruker AXS, CA, USA) was used to record images using Peak Force Tapping™ mode and MSNL-E cantilevers (Bruker AFM probes, USA). Images were taken at the PeakForce frequency of 2 kHz, PeakForce amplitude of 10-20 nm and PeakForce set point of 10-30 mV (<100 pN). Image processing was done using Gwyddion (http://gwyddion.net) for flattening (line-by-line background subtraction) and plane fitting. Cross-sections were recorded using Gwyddion and were then plotted using Origin (OriginLab, MA, USA). Peptides diluted in 20 mM MOPS containing 120 mM NaCl (pH 7.4) were transferred into a 100-μL fluid cell (Bruker AXS, USA) to the final concentrations stated.
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10

Topographical Characterization of CS and CS-GG Beads

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Scanning electron microscopy (SEM) was performed on CS and CS-GG beads to characterize their topography by using a field emission scanning electron microscope JEOL (model: JSM-7600F). In addition, atomic force microscopy (AFM) was used to analyze the surface topography of CS-GG beads with a Bruker MultiMode 8 AFM system.
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