microscopy of the membranes was used to determine the coverage of
particle contamination, and this was done using a Zeiss Primotech
microscope (Carl Zeiss Ltd., Cambridge, UK) at 50× and 500 overall
magnification.
For SEM and energy-dispersive X-ray spectroscopy
(EDX) analysis, a Tabletop Microscope TM3000 was utilized (Hitachi
High-Technologies Corporation), and samples were mounted on carbon
tape and placed in a vacuum chamber.
A new technology was also
put in place. Furthermore, high-resolution
characterization was conducted using a secondary electron detector
on a JEOL 7800F field emission gun scanning electron microscope (JEOL,
Tokyo, Japan). Prior to imaging, these samples were coated in 10 nm
of platinum.