Tecnai g2 tf20 ut

The morphology and composition of the as-synthesized materials were investigated using a Transmission Electron Microscope (TEM) (FEI Tecnai G2 TF20 UT) equipped with Energy Dispersive X-ray (EDX) spectroscopy and high-angle annular dark-field scanning TEM (HAADF-STEM) operated at 200 kV. The elemental composition of the as-synthesized catalysts was determined using Inductively Coupled Plasma-Mass Spectrometry (ICP-MS) on a NEXION 300D (PerkinElmer, USA). Textural properties of the as-synthesized catalysts were determined from N₂ sorption experiments at 77 K. The surface area was estimated according to the BET (Brunauer–Emmett–Teller) model. The crystalline phases of the prepared materials were investigated using Powder X-ray Diffraction (PXRD) on an X'Pert-Pro MPD diffractometer (PANalytical Co., Netherlands) with a Cu-K_α source (λ = 1.54059 Å). The chemical nature and oxidation states of various elements were investigated via an XPS spectrophotometer (Kratos Axis Ultra) equipped with a monochromatic Al-K_α radiation source (1486.6 eV). A Micromeritics Autochem 2910 equipped with a thermal conductivity detector (TCD) was used to investigate H2-TPR. 100 mg of the test sample was introduced into a testing tube and 10% H₂ in Ar was purged over the test sample at a flow rate of 30 mL min⁻¹. The sample was then heated up to 850 °C at a heating rate of 5 °C min⁻¹.

Transmission electron microscopy image was carried out with a FEI Tecnai G2 TF20 UT instrument operated at 200 kV. Scanning electron microscopy (SEM) images were recorded on a Philips XL30 FEG SEM microscope. The film samples were cut to small pieces and adhere by Cu tape to the substrates. All samples were sputter-coated with a thin layer of Pt under argon in a sputter coater (Leica EM SCD 500). X-ray photoelectron spectroscopy (XPS) spectra data were collected on a Kratos Axis Ultra DLD instrument. AFM image was carried out using a Digital Instruments Dimension 3100 atomic force microscope.