Double tilt holder

Manufactured by Ametek

Sourced in United States

The Double Tilt Holder is a lab equipment product that enables controlled tilting of a sample along two perpendicular axes. It provides precise angular adjustment capabilities for various applications in materials science, microscopy, and other research fields.

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Lab products found in correlation

2100 hrtem, by JEOL (1 mentions) Titan 80 300 environmental tem, by Thermo Fisher Scientific (1 mentions) Titan 80 300 tem, by Thermo Fisher Scientific (1 mentions) Gif tridiem detector, by Ametek (1 mentions) Tecnai g2 f20 x twin tem, by Thermo Fisher Scientific (1 mentions)

4 protocols using double tilt holder

X-ray Photoelectron Spectroscopy and Microscopy for Material Characterization

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XPS characterization was performed
using monochromated Al Kα X-rays from an Omicron XM1000 MkII
X-ray source and Omicron EA125 hemispherical analyzer with ±0.05
eV resolution. A take-off angle of 45°, acceptance angle of 8°,
and pass energy of 15 eV were employed during spectral acquisition.
The BE scale was referenced to the adventitious carbon species in
the C 1s core level (285.8 eV). Spectra were deconvolved using AAnalyzer,⁴⁹ a curve fitting software.
For structural
analysis, cross-section samples were obtained by using the Dual Beam
Helios NanoLab 600i system from FEI, using a Ga ion beam. Layers of
the protective material were used consisting of electron beam deposited
C, Pt, and ion beam deposited C. Lamellas were thinned and polished
at 30 kV 100 pA and 5 kV 47 pA, respectively. XTEM imaging was carried
out using a JEOL 2100 HRTEM, operated at 200 kV in the bright field
mode using a Gatan double tilt holder. EDX mapping was carried out
using a Thermo Fisher Scientific Titan Themis operated of 300 kV in
the STEM mode using the Bruker SuperX silicon drift detector.

Mirabelli G., Walsh L.A., Gity F., Bhattacharjee S., Cullen C.P., Ó Coileáin C., Monaghan S., McEvoy N., Nagle R., Hurley P.K, & Duffy R. (2019). Effects of Annealing Temperature and Ambient on Metal/PtSe2 Contact Alloy Formation. ACS Omega, 4(17), 17487-17493.

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Multimodal Microscopy for Material Characterization

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FIB/SEM imaging and TEM specimen preparation by FIB lift out were conducted on a FEI Helios DualBeam FIB operating at 1–30 kV. STEM observation was conducted on FEI Titan 80-300 TEM with probe corrector. In STEM mode the beam current is 60 pA. For high-resolution lattice imaging, the beam dose is around 10⁶ e Å^–2. HRTEM observations were conducted on FEI Titan 80-300 Environmental TEM with objective lens corrector. The beam current is 140 pA. The in situ TEM heating holder is carried using a double tilt holder based on resistant heating coil made by Gatan (Gatan Inc., Pleasanton, CA, USA). The sample was heated at a constant rate of 5 °C min^–1 from room temperature and the temperature is measured using a thermal couple integrated into the holder. In situ XRD experiments were carried out using a Bruker D8 advace X-ray diffractometer with a heating stage.

Yan P., Zheng J., Chen T., Luo L., Jiang Y., Wang K., Sui M., Zhang J.G., Zhang S, & Wang C. (2018). Coupling of electrochemically triggered thermal and mechanical effects to aggravate failure in a layered cathode. Nature Communications, 9, 2437.

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Structural Analysis of Polymer Membranes

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Scanning electron microscopy (SEM) analysis was performed using a FEI Quanta 650 FEG High Resolution scanning electron microscope. Typical beam energies were in the range of 10–20 kV. SEM analysis allowed for membrane thickness measurements and topological investigation. Transmission electron microscopy (TEM) was employed to image and measure Ag and Au NPs in the Chi-TEOS IPN membrane; these measurements were carried out on a JEOL 2100 High Resolution TEM, operated at 200 kV in bright field mode using a Gatan double tilt holder.

Ryan C., Alcock E., Buttimer F., Schmidt M., Clarke D., Pemble M, & Bardosova M. (2017). Synthesis and characterisation of cross-linked chitosan composites functionalised with silver and gold nanoparticles for antimicrobial applications. Science and Technology of Advanced Materials, 18(1), 528-540.

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TEM Imaging of Nanomaterials

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Selected samples were imaged with a transmission electron microscope (FEI Tecnai™ G2 F20 X-Twin TEM) equipped with a field-emission gun electron source. TEM samples were prepared by suspending a few milligrams of the sample in 1-2 mL of acetone, ultrasonicating for 20 min, then drop-casting them onto holey carbon Cu TEM grids. The grids were then mounted on a Gatan double-tilt holder at room temperature or a Gatan double-tilt liquid nitrogen cryo-TEM holder at 77 K. Energy filtered images were acquired at an acceleration voltage of 200 kV on a Gatan GIF Tridiem detector.

Blukis R., Schindler M., Couasnon T, & Benning L.G. (2022). Mechanism and Control of Saponite Synthesis from a Self-Assembling Nanocrystalline Precursor. Langmuir : the ACS journal of surfaces and colloids, 38(25).

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