Transmission electron microscopy (TEM) (Hitachi H-8100) was used to characterize the surface morphology of CNPs and GNs. Raman spectra were measured with a SENTERRA dispersive Raman microscope spectrometer (Bruker Optics). A SHIMADZU UV-1800 spectrophotometer was used for UV-Vis measurements. MALDI-TOF-MS analyses were carried out using a 4800 MALDI TOF/TOF analyzer (AB SCIEX) equipped with a pulsed Nd:YAG laser at an excitation wavelength of 355 nm. For each MS spectrum 1250 laser shots were fired (50 sub-spectra, 25 shots per sub-spectrum). The mass spectra analyzed using Data Explorer 4.9 software (AB SCIEX). GlycoWorkbench software was employed for MS data interpretation.
Senterra dispersive raman microscope spectrometer
Manufactured by Bruker
The SENTERRA dispersive Raman microscope spectrometer is a laboratory instrument designed for Raman spectroscopy analysis. It provides high-resolution Raman spectra by using a dispersive optical system. The instrument is capable of performing micro-Raman measurements and mapping of samples.
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2 protocols using senterra dispersive raman microscope spectrometer
1
Characterization of Carbon and Gold Nanoparticles
2
Advanced Material Characterization Techniques
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Scanning electron microscopy (SEM)
images were obtained from a field emission scanning electron microscope
(FE-SEM-JEOL Model-JSM7, Japan), equipped with an energy-dispersive
spectrometer. Before the analysis, a thin layer of a gold and palladium
alloy was evenly coated on the sample. High-resolution transmission
electron microscopy (HR-TEM) images were taken by using a JEOL JEM-200CX
operating at 200 kV. The powder X-ray diffraction (XRD) patterns were
recorded on an X-ray diffractometer (XRD Rigaku, Japan). Raman spectra
were collected using a Bruker Optics Senterra dispersive Raman microscope
spectrometer with a 532 nm laser excitation. X-ray photoelectron spectroscopy
(XPS) spectra of the composite were recorded on a PerkinElmer, PHI1257
(USA), with Al Kα source and excitation energy of 1486.7 eV;
the binding energy was calibrated using C 1s at 284.5 eV. Fourier
transform infrared (FTIR) spectroscopy was performed with a Spectrum
Two (PerkinElmer, USA), equipped with an attenuated total reflection
cell using the KBr pellet method. The porous structures of the materials
were determined using a nitrogen adsorption isotherm obtained from
the BELSORP MAX instrument II (Japan) surface analyzer. The materials
were degassed at 200 °C for 2 h under a high vacuum before the
measurement.
images were obtained from a field emission scanning electron microscope
(FE-SEM-JEOL Model-JSM7, Japan), equipped with an energy-dispersive
spectrometer. Before the analysis, a thin layer of a gold and palladium
alloy was evenly coated on the sample. High-resolution transmission
electron microscopy (HR-TEM) images were taken by using a JEOL JEM-200CX
operating at 200 kV. The powder X-ray diffraction (XRD) patterns were
recorded on an X-ray diffractometer (XRD Rigaku, Japan). Raman spectra
were collected using a Bruker Optics Senterra dispersive Raman microscope
spectrometer with a 532 nm laser excitation. X-ray photoelectron spectroscopy
(XPS) spectra of the composite were recorded on a PerkinElmer, PHI1257
(USA), with Al Kα source and excitation energy of 1486.7 eV;
the binding energy was calibrated using C 1s at 284.5 eV. Fourier
transform infrared (FTIR) spectroscopy was performed with a Spectrum
Two (PerkinElmer, USA), equipped with an attenuated total reflection
cell using the KBr pellet method. The porous structures of the materials
were determined using a nitrogen adsorption isotherm obtained from
the BELSORP MAX instrument II (Japan) surface analyzer. The materials
were degassed at 200 °C for 2 h under a high vacuum before the
measurement.
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