Supra 55 scanning electron microscope
The Supra 55 Scanning Electron Microscope (SEM) is a high-performance imaging tool designed for advanced materials analysis. It utilizes a focused electron beam to generate detailed images and data about the surface structure and composition of a wide range of samples. The Supra 55 SEM offers high resolution, versatile imaging modes, and a range of analytical capabilities to support research, development, and quality control applications.
Lab products found in correlation
20 protocols using supra 55 scanning electron microscope
Ultrastructural Analysis of M. canis Fungus
Isolation and Imaging of Caenorhabditis elegans Spermatozoa
SEM Imaging of Nanoparticle-Exposed Cells
Visualization of Lactobacillus-Titanium Nanoparticle Interactions
Multi-Technique Characterization of Advanced Materials
Nanoparticle Characterization Using Advanced Spectroscopy
Morphological Analysis of Caco-2/HT29-MTX Co-cultures
Spectroscopic Characterization of Materials
by a UV–vis
spectrophotometer (TU1810, Universal Analysis, Beijing, China). H2O2 was determined using the potassium titanium
oxalate method at its maximum absorption wavelength of 400 nm. The
MB concentration was measured at its maximum absorption wavelength
of 664 nm. The standard curves of H2O2 and MB
are shown in the Supporting Information (
by an atomic absorption spectrophotometer37 (link) (TAS-990F, Universal Analysis, Beijing, China). The specific surface
area (Brunauer–Emmett–Teller) was measured by nitrogen
adsorption/desorption (Micromeritics ASAP2020 instrument). SEM measurement
was performed on a Zeiss Supra 55 scanning electron microscope.
Caco-2/HT29-MTX Co-Culture SEM Analysis
Microscopic Examination of Bacterial Morphology
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