powder diffraction patterns at room temperature were collected by
using a Philips X’pert PRO automatic diffractometer operating
at 40 kV and 40 mA, in theta–theta configuration, secondary
monochromator with Cu-Kα radiation (λ = 1.5418 Å)
and a PIXcel solid-state detector (active length in 2θ 3.347°).
Data were collected from 5° to 50° 2θ (step size =
0.026 and time per step = 60 s) at room temperature.
Furthermore,
the X-ray diffraction profiles during the crystallization and melting
process were collected following the procedure and conditions of nonisothermal
experiments conducted in the DSC equipment. Wide-angle X-ray scattering
(WAXS) experiments were measured at beamline BL11-NCD in the ALBA
Synchrotron (Barcelona, Spain). Aluminum pans were employed to place
samples in the beam path. A THMS600 Linkam hot stage and a liquid
nitrogen cooling device were employed for temperature control and
to heat and cool the samples. The X-ray energy source amounted to
12.4 keV. For WAXS, the sample–detector distance was 132.6
mm with a 21.2° tilt angle, and chromium(III) oxide was employed
to do the calibration (Rayonix LX255-HS detector, Evanston, IL, U.S.A.,
with a resolution of 1920 × 5760 pixels and pixel size of 44
μm2).