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Jem 2200fs

Manufactured by Bruker
Sourced in Japan

The JEM-2200FS is a high-resolution transmission electron microscope (TEM) designed for advanced materials analysis. It features a field emission electron source and an advanced imaging and analytical system. The JEM-2200FS provides high-resolution imaging and analytical capabilities suitable for a wide range of materials research applications.

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3 protocols using jem 2200fs

1

Nanomaterial Characterization by SEM-EDS and ICP-OES

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All elemental compositions were
determined by energy-dispersive X-ray spectroscopy (EDS). Concentrated
colloidal solutions were drop-cast onto a Si substrate and measured
in a high-resolution scanning electron microscope (SEM) JEOL JSM-7500F
equipped with a cold field emission gun, and an Oxford X-Max 80 spectrometer
(based on an 80 mm2 Si drift detector). Standardless quantification
was achieved with the Aztec Energy EDS software. Elemental analyses
on single nanosheets were performed on a JEOL JEM-2200FS microscope
equipped with a Bruker Quantax solid state detector. The composition
of the nanosheets was also determined by inductively coupled plasma–optical
emission spectroscopy (ICP-OES) analysis performed on aiCAP 6000 spectrometer
(Thermo Scientific). The nanosheet solutions were digested in aqua
regia overnight and diluted to a known volume prior to the measurements.
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2

Characterization of MXene@PI Composites

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Scanning electron microscopy (SEM, FEI NanoSEM 230), transmission electron microscopy (TEM, JEOL JEM2200fS) and atomic force microscopy (AFM, Bruker ICON3) were employed to characterize the morphology and microstructure. A drop shape analyzer (DSA 30, Krüss, Germany) was utilized to measure the water contact angles (CA). A FTIR spectrometer (PerkinElmer Spectrum Two) with an attenuated total reflection accessory was used to perform the FTIR measurements. The resistances (R) were measured in a four-probe method by a Keithley 4200 electrometer so as to calculate the electrical conductivity (δ). EMI SE in the frequency range of 8.2–12.4 GHz (X-band) was measured by a vector network analyzer (Agilent 8517A) in the waveguide method. More than three specimens were tested for each component. The S-parameters were recorded and used to calculate the SET, SER, and SEA. To evaluate the electrothermal performance, various DC voltages were applied to the 10L MXene@PI composite foams using a DC-regulated power supply. The temperature of the sample was measured by a digital thermometer (UT325) with its T-type thermocouple contacting the surface of the sample. The electromechanical response of the composite foams was obtained by measuring the resistance change using the Keithley 4200-SCS electrometer in a two-probe method.
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3

Characterization of Ag Nanoclusters and Graphene Quantum Dots

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The CL signals were evaluated by a Sirius L single tube luminometer (Berthold, Germany). Fluorescence and UV-Vis absorption analysis was carried out using an RF-5301 spectrofluorometer (Shimadzu, Japan) and UV-1800 spectrophotometer (Shimadzu, Japan), respectively. The CL spectra were obtained by a flow-based system connected to the same spectrofluorometer while the excitation source had been turned off. Some techniques were used to investigate the morphology and chemical conditions of synthesized AgNCs and GQDs, using a JEOL high-resolution transmission electron microscope (HR-TEM, JEM-2200FS, Japan), a Fourier transform infrared (FT-IR) spectrometer (Tensor 27, Bruker, Germany) and an X-ray diffractometer (D5000, Siemens, USA) with a Cu Kα radiation source (1.54065 Å).
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