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Xrd 700

Manufactured by Shimadzu

The XRD-700 is a versatile X-ray diffractometer designed for a wide range of materials analysis applications. It is capable of performing qualitative and quantitative phase analysis, structural characterization, and particle size determination. The XRD-700 utilizes a high-intensity X-ray source and advanced detection technology to provide accurate and reliable data.

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3 protocols using xrd 700

1

Comprehensive Characterization of Graphene-based Materials

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X-Ray Diffractometer (XRD) model XRD-700-Shimadzu was used to investigate the crystalline nature of prepared GO and composite material. The surface morphology of prepared material was characterized by scanning electron microscope (SEM) model SEM-JSM 7800F, Fourier transform infrared spectroscopy (FTIR) (Nicolet-5700, Themofinnigan, USA) was used to determine functionalities and UV-visible spectroscopy (UV-vis) (Lambda-35, PerkinElmer, USA) was used to determine the concentration of analytes before/after adsorption. Zeta potential model DLS (sizing), M3-PALS (zeta potential) was used to determine the charge on surface of material. BET (AutosorbiQ S/N: 14716090801 station: 1) analysis was used to check the surface area and pore diameter of prepared material. Raman analysis was performed using (DXR Raman microscope with a 780 nm filter, Thermo Scientific). The contact angle of the prepared materials was estimated using a standard contact angle apparatus (Ossila contact Angle Goniometer). Metals analysis was performed by ICP-OES model Thermo Scientific iCAP 7000 spectrophotometer. The GC/MS analysis was carried out using an Agilent 6900 gas chromatograph and an Agilent 5975 mass spectrometer (Agilent Technologies, US).
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2

Characterization of Porous Silica-Supported Ionic Liquid

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The porous sample nature was investigated by N2 adsorption-desorption technique and specific surface area was calculated using Brunauer – Emmett-Teller method (BET). Morphology was evaluated by scanning electron microscopy with field emission (SEM-FEG) using FEI Inspect F50 in the secondary electron mode (SE). Chemical composition was evaluated by energy dispersion X-ray spectrometry (EDS). For this purpose, samples were covered with a thin layer of gold. X-ray diffraction pattern (XRD) was recorded on Shimadzu XRD-700 equipment using Cu Kα radiation, voltage of 40 kV, 30 mA (1.5418 Å) ranging from 2 to 70° with scanning speed of 4°/min. Samples thermal stability and the immobilized ionic liquid actual content were evaluated by TGA/DTG (TA Instruments SDT-Q600), under nitrogen atmosphere within the range from 25 to 800 °C and heating rate of 20 °C/min. All analyses were conducted in triplicate. The IL loading in silica support (denoted as IL%) was calculated from the TGA curve using the following Eq. (2): IL(%)=W150W800W150×100 Where, W150 and W800 are sample weight (g) at 150 °C and 800 °C, respectively.
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3

Comprehensive Material Characterization Protocol

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The morphology and structure of samples were investigated by high resolution transmission electron microscopy (TEM, JEOL-3010) and scanning electron microscopy (SEM, SU-8000). Small angle X-ray diffraction (SAXRD) patterns were obtained by using an X-ray diffractometer (XRD Shimadzu Limited XRD-700) with a Cu Kα radiation source (λ ≈ 1.54 Å) in the range of 0.5–5.5°. The elemental analysis was performed on an X-ray photoelectron spectroscopy instrument (XPS AXIS Ultra Kratos Analytical Ltd). The BET specific surface area (SBET) and Barrett–Joyner–Halenda (BJH) pore size distribution were measured on a NOVA4200e surface area analyzer by using the N2 gas adsorption/desorption isotherm. Fourier transform infrared (FTIR) spectra were recorded by a FTIR-8400S spectrometer. The samples and KBr were pressed to form thin plates (the mass of KBr and the as-prepared sample was about 200 mg and 2 mg, respectively) for obtaining the FTIR spectra. Thermogravimetric analysis (TGA) was carried out using a F2009 TG analyzer in the range of 25–900 °C at a heating rate of 10 °C min−1 under N2 flow. The zeta potential of the samples was measured by using a Zetasizer ZEN 3500 potentiometer in the pH range of 7–13.
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