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Su8100 field emission scanning electron microscope

Manufactured by Hitachi
Sourced in Japan

The SU8100 Field Emission Scanning Electron Microscope is a high-performance imaging system designed for advanced materials analysis. It utilizes a field emission electron source to produce a finely focused electron beam, enabling high-resolution imaging and analysis of a wide range of samples.

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2 protocols using su8100 field emission scanning electron microscope

1

Scanning Electron Microscope Analysis of Fruitlet Abscission

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For SEM analysis, fruitlet AZ from “about-to-abscise” and “non-abscised” parts of the 25th day after pistillate flowers bloomed were collected, fixed in 4% (w/v) glutaraldehyde in 0.05 M potassium phosphate buffer (pH 7.4), and then rinsed four times in the buffer. After dehydration in a graded ethanol series, the abscission samples were critical-point dried in liquid CO2. Samples were sputter coated with gold, and were viewed at 5 kV on a Hitachi SU8100 Field Emission Scanning Electron Microscope. For the morphology analysis, the samples were collected from different individuals at least three times.
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2

Ultrastructural Analysis of Mouse Liver

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P7 mice were killed and perfused with cold PBS and 4% PFA. Liver tissues (2∼3 mm2) were harvested, fixed with 2.5% glutaraldehyde, postfixed with osmium tetroxide, dehydrated with graded alcohols, dried with hexamethyldisilazane, sputter-coated with gold, and examined using a SU8100 field emission scanning electron microscope (HITACHI, Tokyo, Japan). The average number of fenestrae was determined from 10 random scanning electron micrographs of each group of 3 mice. The data are presented as the number of fenestrae per area. For transmission electron microscopy analysis, the samples were embedded in epoxy resin after dehydration with graded alcohols, and were cut into thin sections. Three samples from each group were examined with a transmission electron microscope (TECNAI 10; FEI, Tokyo, Japan) to examine changes in LSEC basement membranes and the integrity of the space of Disse.
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