Atomic force microscopy (AFM) images of Bo were recorded with a JPK Nanowizard Ultra Speed AFM in ambient conditions. Non-contact AC (tapping) mode was used for data acquisition with a setpoint of around ~55%. Bruker TESP-V2 silicon tips with a nominal spring constant of 37 N/m, a tip radius of 7 nm and a resonant frequency of 320 kHZ were used. Images were processed with JPK Data Processing software and WSxM software. 24 (link)
Tesp v2 silicon tips
Manufactured by Bruker
The TESP-V2 silicon tips are specialized probe tips designed for use in atomic force microscopy (AFM) applications. They feature a silicon construction and are intended for standard tapping mode imaging.
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Lab products found in correlation
2 protocols using tesp v2 silicon tips
1
Atomic Force Microscopy of Bo
2
Atomic Force Microscopy Imaging Protocol
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Atomic force
microscopy (AFM) images were recorded with a JPK Nanowizard Ultra
Speed AFM instrument under ambient conditions. Noncontact AC (tapping)
mode was used for data acquisition with a set point of around ∼65%.
Bruker TESP-V2 silicon tips with a nominal spring constant of 37 N/m,
a tip radius of 7 nm, and a resonant frequency of 320 kHz were used.
Images were processed with JPK Data Processing software and WSxM software.29 (link)
microscopy (AFM) images were recorded with a JPK Nanowizard Ultra
Speed AFM instrument under ambient conditions. Noncontact AC (tapping)
mode was used for data acquisition with a set point of around ∼65%.
Bruker TESP-V2 silicon tips with a nominal spring constant of 37 N/m,
a tip radius of 7 nm, and a resonant frequency of 320 kHz were used.
Images were processed with JPK Data Processing software and WSxM software.29 (link)
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