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Xflash 6130 detector

Manufactured by Bruker
Sourced in United States

The XFlash 6130 detector by Bruker is a high-performance energy-dispersive X-ray spectroscopy (EDS) detector designed for elemental analysis in scanning electron microscopy (SEM) and similar applications. It provides reliable and accurate detection of elements from beryllium to uranium.

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2 protocols using xflash 6130 detector

1

Comprehensive Materials Characterization Protocol

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X-ray diffraction
(XRD) patterns were collected on a Unisantis XMD300 powder diffractometer
unit using Cu Kα (λ = 1.5418 Å). FTIR spectra were
recorded using a Bruker α II spectrophotometer in the range
of 400–2000 cm–1. Thermal properties of the
ZHF nanohybrid were determined using an SDT Q600 V20.9 Build 20 instrument
operated under an argon atmosphere at a flow rate of 50 mL/min from
25 to 720 °C at a rate of 5 °C/min. The morphologies and
texture of the carbon materials were characterized using a field emission
scanning electron microscope (FESEM) (MIRA3, TESCAN) and a transmission
electron microscope (FEI Tecnai F20 at 200 kV). Elemental analysis
was also performed by using energy-dispersive X-ray spectroscopy (EDS,
XFlash 6130 detector, Bruker). The surface area and pore size distribution
of the carbon materials were determined using a BELSORP measuring
instrument (BELSORP-mini, Japan, Inc.) using nitrogen gas adsorption–desorption
technique at 77 K. X-ray photoelectron spectroscopic (XPS) measurement
was performed on a Thermo Scientific K-Alpha X-ray photoelectron spectroscope
using Al Kα and spot size 400 μm.
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2

Comprehensive Physicochemical Characterization

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Particle size analysis was performed by the dynamic light scattering (DLS) method using a ZetaSizer model Nano ZS-ZEN3600 (Malvern, UK). Samples (at a concentration of 1 ng/mL) were analyzed in 0.1 M phosphate-buffered saline (PBS), pH 7, at room temperature. Particle morphology was evaluated by transmission electron microscopy (TEM) using a Zeiss EM10C 80 KV (Zeiss, Jena, Germany). X-ray diffraction (XRD) measurements were made at room temperature using Cu K radiation (Philips, PW1730). Chemical composition was analyzed using energy dispersive spectrometry (EDS) analysis using an XFlash 6130 detector (Bruker).
Fourier transform infrared (FT-IR) spectra were recorded (Perkin Elmer spectrometer, USA) at room temperature.
UV-visible (UV-vis) absorption spectroscopic measurements were recorded using ScanDrop (Analytik Jena, Germany).
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