STM-TERS measurements were performed under UHV (base pressure = 4 × 10−11 torr) at 6 K. A parabolic mirror installed inside the homebuilt STM system was aligned to the tip apex by imaging electroluminescence from the tunneling junction (41 (link)). For Raman measurements, the tip-sample junction was illuminated at 45° with a single-mode 634-nm diode laser (CrystaLaser) focused at the tunneling junction through an aspheric lens. The Raman spectra were acquired using a 0.3-m spectrograph (SpectraPro 2300i, Princeton Instruments) equipped with a liquid nitrogen-cooled charge-coupled device (Spec-10). The nanoscopically smooth silver tip was prepared by ex situ Ar+ field-directed sputter sharpening (FDSS) and finalized by Ne+ ion FDSS in situ (11 (link)). The cone radius of the tip before in situ processing was 16 nm. We dosed 12C18O, CoTPP, and ZnEtio onto the Au(111) surface, as shown in fig. S1. The Ag tip was terminated by a single CO molecule through field emission on a CO lattice gas on Au(111), and the functionalization was directly verified through the CO stretch Raman spectrum and enhanced resolution in STM topographic images. The CO Raman maps were acquired in constant current and constant height modes.
Spectrapro 2300i
Manufactured by Teledyne
Sourced in United States
The SpectraPro 2300i is a high-performance imaging spectrograph designed for various spectroscopic applications. It features a compact and versatile design, providing efficient light collection and high spectral resolution. The instrument is equipped with a concentric optical system and multiple grating options to enable flexible configuration and spectral coverage for diverse research and analytical needs.
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Lab products found in correlation
Pixis 400br excelon, by Teledyne (1 mentions)
Ft ir 4200st spectrometer, by Jasco (1 mentions)
Tg dta 6200, by Seiko Instruments (1 mentions)
2400ii elemental analyzer, by PerkinElmer (1 mentions)
Fp 6500 fluorescence spectrometer, by Jasco (1 mentions)
Spec 10 400b ln, by Teledyne (1 mentions)
Ln ccd 1340 400, by Teledyne (1 mentions)
Axiovert 200m, by Teledyne (1 mentions)
6 protocols using spectrapro 2300i
1
TERS Measurements of Surface-Adsorbed Molecules
2
Dark-field Spectroscopy of Silicon Nanosphere Oligomers
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The dark-field reflection of silicon nanosphere oligomers, also called backward scattering spectra, were collected using a dark-field optical microscope (Olympus BX51) integrated with a quartz-tungsten-halogen lamp, a monochromator (Acton SpectraPro, 2300i) and a charge-coupled device (CCD) camera (Princeton Instruments, Pixis 400BR_eXcelon). During the measurements, the camera was thermoelectrically cooled to −70 °C. The oblique incident white light was illuminated with a 53° incident angle on the oligomer, and the scattered light was collected by a dark-field objective on top (LMPLFLN100XBD, numerical aperture=0.80).
3
Characterization of C12NH3-CrMo6 Precipitate
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Infrared (IR) spectra were measured using an FT/IR-4200ST spectrometer (Jasco Corporation, Tokyo, Japan, KBr pellet method). Powder X-ray diffraction (XRD) patterns were recorded using a MiniFlex300 diffractometer (Rigaku Corporation, Tokyo, Japan, Cu Kα radiation, λ = 1.54056 Å) under an ambient atmosphere. CHN (carbon, hydrogen, and nitrogen) elemental analyses were performed using a 2400II elemental analyzer (PerkinElmer, Inc., Waltham, MA, USA). Thermal gravimetric (TG) analyses were carried out on a TG/DTA-6200 (Seiko Instruments, Chiba, Japan) at a heating rate of 10 °C min−1 in a nitrogen atmosphere.
Steady-state diffuse reflectance, excitation, and emission spectra were recorded at 300 K using an FP-6500 fluorescence spectrometer (Jasco Corporation, Tokyo, Japan) equipped with an Xe lamp. Time-resolved emission spectra were obtained at 15 and 300 K with an Ultra CFR 400 YAG:Nd3+ laser (Big Sky Laser Technologies, Inc., Bozeman, MT, USA, 266 nm fourth harmonics, pulse duration 10 ns with a repetition rate of 10 Hz) as an excitation source. A Spectra Pro 2300i (Princeton Instruments, Inc., Trenton, NJ, USA) was utilized as a spectrometer, and a PI-Max with an intensified CCD camera (Princeton Instruments, Inc., Trenton, NJ, USA) was used as a detector. Pelletized samples of the C12NH3-CrMo6 precipitate were used for the aforementioned photoluminescence measurements.
Steady-state diffuse reflectance, excitation, and emission spectra were recorded at 300 K using an FP-6500 fluorescence spectrometer (Jasco Corporation, Tokyo, Japan) equipped with an Xe lamp. Time-resolved emission spectra were obtained at 15 and 300 K with an Ultra CFR 400 YAG:Nd3+ laser (Big Sky Laser Technologies, Inc., Bozeman, MT, USA, 266 nm fourth harmonics, pulse duration 10 ns with a repetition rate of 10 Hz) as an excitation source. A Spectra Pro 2300i (Princeton Instruments, Inc., Trenton, NJ, USA) was utilized as a spectrometer, and a PI-Max with an intensified CCD camera (Princeton Instruments, Inc., Trenton, NJ, USA) was used as a detector. Pelletized samples of the C12NH3-CrMo6 precipitate were used for the aforementioned photoluminescence measurements.
4
Ultrafast Spectroscopy with High Temporal Resolution
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The fs-TA spectrometer with a 120 fs time resolution, as determined as the full width at half maximum (FWHM) of instrumental response function (IRF), was described in detail elsewhere.74 (link),75 (link) Briefly, a regenerative amplifier (SPTF-100F-1KHPR, Spectra Physics) combined with an optical parametric amplifier (OPA) provided the actinic laser at a desired wavelength with a spectral bandwidth of 10 nm (FWHM). A white-light continuum probe was generated from a sapphire plate of 3 mm thickness and, after interrogating the excited sample, was detected with a liquid-nitrogen cooled charge-coupled device (CCD; Spec-10:400B/LN, Princeton Instruments) attached to an imaging spectrograph (SpectraPro 2300i; Princeton Instruments). To minimize the possible nonlinear effects, the lowest possible excitation energy (<100 nJ/Pulse) as limited by a reasonable signal-to-noise ratio was applied to the samples. The laser source was run at a repetition rate of 100 Hz to ensure that each pulse excited the dynamically relaxed sample. The sample OD at an excitation wavelength was adjusted to 0.3–0.5 in terms of an optical path length of 1 mm. Steady-state absorption spectra were checked for the samples before and after the measurements, and no appreciable sample degradation was observed. All the measurements were carried out at room temperature (296 K).
5
Vibrational Sum-Frequency Generation Setup
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A different femtosecond laser amplifier system (UpTek Solutions) with a fundamental wavelength of 800 nm and repetition rate of 1 kHz was used for VSFG experiments at the air/liquid interface. This 800 nm pulse was used to pump an OPA (TOPAS, Light Conversions) which generated a 3250 nm IR pulse of 5 μJ. The residual 14 μJ, 800 nm pulse was directed through a translation stage to control the temporal overlap of the two pulses, followed by an air-spaced etalon (SLS Optics) and half-wave plate. A dichroic mirror was used to direct the IR and 800 nm pulses colinearly to the sample. A reflection geometry was employed in which the VSFG signal was collected by a lens and passed through a thin film polarizer before being focused on the slit of a spectrometer (Acton, SpectraPro 2300i, Princeton Instruments) fitted with a CCD detector (Princeton Instruments, LN/CCD-1340/400)57 (link). Samples were contained in a 2” diameter PTFE dish placed on a rotation stage and prepared identical to those for VSFS experiments.
6
Fabrication of Au Nanoislands on Quartz for SERS
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The Au nanoislands on quartz glasses were prepared for the experiment as a SERS substrate. The gold was simply coated (10 nm) on a quartz glass through thermal evaporation of Au thin film. The coated Au thin film in Volmer–Weber mode directly forms the nanoislands on the top surface of the quartz glass due to the strong coupling of Au atoms with each other. Dedicate control of film thickness and deposition rate enables formation of Au nanoislands in Volmer–Weber node. Extinction spectra were calculated as 1 − Rnp/Rg after the intensity values of reflected light intensity R from the nanoplasmonic glass (Rnp) and quartz glass (Rg) were measured using a charge-coupled device (CCD)-based UV–vis near-infrared (NIR) micro-spectrometer (SpectraPro 2300i, Princeton Instruments) coupled with an inverted confocal laser scanning microscope (CLSM, Axiovert 200M).
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