For SEM (scanning electron microscopy) (FEI Quanta 400FEG ESEM/EDAX Genesis X4M, Hillsboro, EUA with an accelerating voltage of 25.00 XkV and a working distance of 10 mm), analysis powders were covered by a 10-nm gold layer, and for TEM (transmission electron microscopy) (JEOL JEM-1400, Tokyo, Japan), suspensions of the obtained powders were prepared in ethanol and placed on a copper grid (StrataTek, Square Mesh Grids, 400 mesh, Copper, Ashburn, EUA). Finally, for particle size distribution analysis, suspensions were collected at the end of each experiment and directly analyzed by laser diffraction using ethanol as a solvent (LS 230, Beckman Coulter, Brea, CA, USA).
Quanta 400 feg esem edax genesis x4m
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Quanta 400 FEG ESEM/EDAX Genesis X4M is a scanning electron microscope (SEM) with a field emission gun (FEG) and an energy-dispersive X-ray spectroscopy (EDS) system. The SEM provides high-resolution imaging, and the EDS system allows for elemental analysis of the sample.
Automatically generated - may contain errors
Lab products found in correlation
Nicolet 6700 ft ir, by Thermo Fisher Scientific (3 mentions)
Ls230, by Beckman Coulter (1 mentions)
Jem 1400, by JEOL (1 mentions)
K575x sputter coater, by Quorum Technologies (1 mentions)
X pert pro mrd, by Malvern Panalytical (1 mentions)
Uv 1800, by Shimadzu (1 mentions)
Vertex 70, by Bruker (1 mentions)
Aanalyst 400, by PerkinElmer (1 mentions)
Mct a detector, by Thermo Fisher Scientific (1 mentions)
Trichrome stain masson kit, by Merck Group (1 mentions)
16 protocols using quanta 400 feg esem edax genesis x4m
1
SEM, TEM, and Particle Size Analysis
2
Cryo-SEM and SEM Imaging of Liposomes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Image analyses of the liposomes and the proliposome powder, loaded and unloaded, was performed using, respectively, Cryo-SEM (JEOL JSM 6301F/Oxford INCA Energy 350/Gatan Alto 2500) and SEM (FEI Quanta 400FEG ESEM/EDAX Genesis X4M) techniques. The Cryo-SEM/EDS samples were rapidly frozen by submerging the formulation in liquid nitrogen (slushy from) and then transferred to the cold vacuum preparation station. Afterward, the frozen samples were fractured (etched) for 90 s at negative 90 °C and coated with a thin film of Au/Pd by sputtering for 45 s (SPI-Module™ Sputter Coater, Structure Probe, Inc; West Chester, PA, USA). Finally, the samples are analyzed using SEM operating at negative 150 °C. For the dry proliposomes powder, the samples were merely coated with Au/Pd using, the same method as before, and transferred to the SEM.
3
Thin Film Surface Topography Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The topography of the vapor-deposited thin films was investigated by scanning electron microscopy (SEM) through the high-resolution FEI Quanta 400 FEG ESEM/EDAX Genesis X4M instrument at the CEMUP (Centro de Materiais da Universidade do Porto) services. SEM micrographs (top views) were acquired using a secondary electron detector (SE). The acceleration voltage was 10 keV, while an in-lens detector was employed with a working distance of about 10 mm.
4
Characterizing Fiber Mesh Morphology
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of the produced meshes was examined by scanning electron microscopy (SEM) using a Quanta 400 FEG ESEM/EDAX Genesis X4M (FEI Company, USA). Prior to examination, samples were coated with a gold/palladium (Au/Pd) thin film, by sputtering, using the SPI module sputter coater equipment. SEM images were also used to measure the fiber diameter using ImageJ software. For each condition, three individual samples were analyzed and fifty measurements per image were carried out.
5
Functional Group Analysis and Morphological Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The functional groups
presented in the VPW extract were identified by the FTIR spectrum
recorded as KBr pellets in a Jasco FT/IR Plus spectrophotometer. Scanning
electron microscopy was carried out to obtain morphological features
of the VPW extract using a high resolution (Schottky) environmental
scanning electron microscope with X-ray microanalysis and electron
backscattered diffraction analysis: FEI Quanta 400 FEG ESEM/EDAX Genesis
X4M.
presented in the VPW extract were identified by the FTIR spectrum
recorded as KBr pellets in a Jasco FT/IR Plus spectrophotometer. Scanning
electron microscopy was carried out to obtain morphological features
of the VPW extract using a high resolution (Schottky) environmental
scanning electron microscope with X-ray microanalysis and electron
backscattered diffraction analysis: FEI Quanta 400 FEG ESEM/EDAX Genesis
X4M.
6
Morphological Analysis of Electrospun PCL Meshes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of the electrospun meshes was examined by scanning electron microscopy (SEM) using a Quanta 400 FEG ESEM/EDAX Genesis X4M (FEI, Hillsboro, OR, USA). Prior to examination, samples were coated with an Au/Pd thin film by sputtering (Sputter Coater, SPI, West Chester, PA, USA). SEM images were also used to evaluate the fiber diameter distribution using ImageJ software (Fiji, version J1.46r., NIH, Bethesda, MD, USA). For each condition, three individual samples were analyzed and 50 measurements per image were performed. The apparent density and porosity of the electrospun meshes were calculated using Equations (1) and (2) [13 (link)], respectively, where the thickness of the meshes was measured with a micrometer.
The surface area to volume ratio (SA/v) for the electrospun PCL meshes was also calculated.
The surface area to volume ratio (SA/v) for the electrospun PCL meshes was also calculated.
7
Microstructural Analysis of Prepared Pastes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A microstructural analysis of the prepared pastes (surface) was performed by SEM/EDS using a High Resolution (Schottky) Environmental Scanning Electron Microscope with X-Ray Microanalysis and Electron Backscattered Diffraction analysis: FEI Quanta 400 FEG ESEM/EDAX Genesis X4M. Each sample was mounted and sputter-coated with a thin layer of gold–palladium alloy using the SPI Module Sputter Coater equipment. Digital images were collected at an accelerating voltage of 5–10 kV. Samples were observed with 100-, 500-, and 1000-fold magnification.
8
Scanning Electron Microscopy of SSH
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface morphology of SSH was analysed by scanning electron microscopy (SEM). SSH was freeze dried (Armfield SB4 model, Ringwood, UK) and cut to obtain middle cross-section samples, which were then sputter-coated with a thin layer (9–12 nm) of gold/palladium (SPI Module Sputter Equipment, FEI Company, Hillsboro, OR, USA) and observed using an SEM microscope (Quanta 400 FEG ESEM/EDAX Genesis X4M; FEI Company, Hillsboro, OR, USA). The micrographs were taken at an acceleration voltage of 15 kV at different magnifications.
9
Scanning Electron Microscopy of Particle Morphology
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Particle morphology and internal vesiculation were observed by scanning electron microscopy (SEM), using a FEI Quanta 400FEG ESEM/EDAX Genesis X4M (Hillsboro, Oregon, USA) at Centro de Materiais da Universidade do Porto (CEMUP).
In order to allow visualization of the particle’s interior, dried particles were encapsulated in epoxy resin, and the resulting composite was fractured in liquid nitrogen after hardening overnight. Before being analyzed, samples were sputtered with gold/palladium using a K575X Sputter Coater by Quorum Technologies (Lewes, United Kingdom).
In order to allow visualization of the particle’s interior, dried particles were encapsulated in epoxy resin, and the resulting composite was fractured in liquid nitrogen after hardening overnight. Before being analyzed, samples were sputtered with gold/palladium using a K575X Sputter Coater by Quorum Technologies (Lewes, United Kingdom).
10
Comprehensive Material Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Chemical composition and structure were determined by FTIR (Fourier Transform Infrared Spectroscopy) (Bruker Vertex 70, Billerica, MA, USA), XRD (X-ray diffraction) (PANalytical Xpert PRO MRD, Malvern, United Kingdom), EDX based on different sections of the sample (Energy-dispersive X-ray spectroscopy) (FEI Quanta 400FEG ESEM/EDAX Genesis X4M, Hillsboro, EUA), and Atomic Absorption Spectrometry (λ = 422.7 nm, Flame: air-acetylene, with addition of lanthanum) (Perkin Elmer AAnalyst 400, Massachusetts, EUA) and UV-Vis Spectrophotometry-Molybdenum Blue (UV-Vis-Shimadzu UV-1800) to determine calcium and phosphate concentration.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!