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Su5000 fe sem

Manufactured by Hitachi
Sourced in Japan

The SU5000 FE-SEM is a high-resolution field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide detailed, high-quality images of a wide range of samples at the nanoscale level. The SU5000 FE-SEM utilizes a field emission gun to generate a focused electron beam, enabling high-resolution imaging and analysis capabilities.

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15 protocols using su5000 fe sem

1

Scanning Electron Microscopy of Biofilm

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In order to examine the morphology of biofilm cells and titanium surfaces before and after all treatments, the titanium coupons were scanned before and after the treatments using SEM (FE-SEM SU5000, Hitachi, Japan). The silver-treated biofilm-contaminated were aseptically extracted from the stimulating culture tube, after 60 min of all treatment processes. The sample preparation for SEM characterization is described as follows. The silver-treated biofilm-contaminated coupons were fixed overnight with 2.5% glutaraldehyde and 2% paraformaldehyde in 0.1 M phosphate buffer. Then, 0.1 M of phosphate buffer was rinsed (3 × 10 min each). Thereafter, the coupons were dehydrated gradually by being washed sequentially with 50, 75, 85, and 95% ethanol solution (10 min each) and 100% ethanol solution (3 × 10 min each). Hexamethyldisilizane (HMDS) was used for overnight drying. Finally, samples were then sputter-coated with gold prior to FE-SEM characterization [49 (link),51 (link)].
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2

Characterization of Material Morphology

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Samples for SEM and Atomic Force Microscopy (AFM) were immersed in 25% glutaraldehyde overnight, afterwards dipped ten times in 50% EtOH [50 (link),52 (link)] and dried in a vacuum desiccator for at least 2 h. Morphology of the samples was studied using a scanning electron microscope (FE-SEM SU5000, Hitachi, Japan), at an acceleration voltage of 10–15 kV. Samples were sputtered with ~10 nm of gold. Surface topography was acquired on an atomic force microscope (AFM5500M, Hitachi, Japan) in semi-contact mode with a silicon tip and at different scanning areas at a scan rate of 1 Hz. The experiments were conducted in air and at room temperature.
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3

SEM Imaging and Particle Size Analysis

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A solution containing suspended SiO2 or MPS particles was dropped onto the carbon tape attached to the aluminum base, and excess water was removed using filter paper. This sample was dried for 5 min at room temperature (23 °C) and introduced into the FE-SEM (SU5000, Hitachi High-Tech Corp, Tokyo, Japan) instrument. Secondary electron images (1280 × 1020 pixels) were captured at 2000–2500× magnification with a scanning time of 20 s, a working distance of 7 mm, an EB acceleration voltage of 3–4 kV, and current of 1–5 pA. From 20 to 30 captured SEM images, 500 SiO2 and 400 MPS particle images were manually selected. The selected particle images were manually masked, and the diameter was calculated from the particle area using the masking region.
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4

Cellulose-Chitosan Materials Microscopy

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The
microstructure and morphology of the cellulose–chitosan-based
materials were analyzed by SEM using a FE-SEM SU5000 (Hitachi, Tokyo,
Japan). All samples were dried and coated with gold for 50 s according
to the standard protocol.57 An electron
beam energy of 5 kV was applied for analysis.
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5

Cell Scaffold Surface Characterization

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At day 7, medium was aspirated from wells of test scaffolds and controls followed by their move to a new 12-well TCP plate. Wells were washed twice with 0.01 M PBS and thrice with deionised water followed by chemical fixing using Karnovsky’s reagent (Polysciences, Inc., Warrington, PA, USA) (5% glutaraldehyde/3.2% PFA for 8 min at room temperature and then washed twice with 0.01 M PBS. Gradual dehydration was performed using an alcohol series of increasing ethanol concentration, 25, 50, 75, 90, and 100% ethanol, for 8 min each at room temperature, followed by volume ratio mix of 100% ethanol/100% hexamethyldisilizane (HMDS) for 8 min at room temperature. Wells were chemically dried overnight at room temperature using 2–3 drops of 100% HMDS. All reagents were from Sigma-Aldrich.
To maximise image quality, scaffolds were coated with a thin layer of gold-palladium (18 nm) using Emitech K500X sputtering system (Quorum Technologies, Lewes, UK) at 25 mA for 150 s. Field emission scanning electron microscopy, FESEM (SU5000, Hitachi, Tokyo, Japan), was used to study surface topography at 5 KV voltage from three random locations per cell-seeded scaffold type.
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6

Substrate Characterization by SEM-BEI-EDS

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Scanning electron microscopy (SEM) with backscatter electron imaging (BEI) and energy-dispersive X-ray spectroscopy (EDS) were used to study the surface structure of the tested substrates, element mapping, and qualitative mineral identification. A Hitachi SU5000 FE-SEM (Schottky FEG) provided the SEM analyses, and the EDS was performed by a Dual Bruker XFlash system and a high-resolution automated electron backscatter diffraction (HR EBDS) system. Carbon coating of substrates was carried out to improve imaging quality, increase chemical analysis precision, and better topographic examination while avoiding surface charging and potential thermal damages. For each substrate (representing different Ω, T, and t), three random locations were analyzed, and a mosaic map of nine ordinary SEM images (3 × 3) was acquired at each locality. Each mosaic map covers a 3786 × 2781 µm region, with each pixel representing 1 µm2 surface area.
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7

Scanning Electron Microscopy of Cell Filopodia

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After time-lapse imaging, the cell culture medium in the dish was removed, and the platform was washed twice with 1% PBS for 5 min each time. Then, the cells were fixed with 4% paraformaldehyde for 15 min. After cell fixation, the platform was washed with 1% and 0.25% PBS for 5 min each, followed by rinsing twice in DI water for 10 min each time. Subsequently, cells were dehydrated for 5 min each time using a series of increasing ethanol concentrations (30%, 50%, 70%, 80%, 95%, and 100%). Cells were dried using a critical point dryer, in which CO2 was the transitional medium. A thin layer of gold was then sputter-coated on the platform using a thin film coater (Q150 coater, Quorum Technologies Ltd., UK). High-resolution images of the fixed cells were captured using a field emission scanning electron microscope (SEM) (SU5000 FE-SEM, Hitachi, Japan) with a 10 kV electron beam. These images were used to analyze the number and length of filopodia and long protrusions of cells. Typical filopodia were narrow with widths of 200–400 nm and lengths of 4–30 μm. Long protrusions had widths >400 nm, and protrusion length was defined as the distance between the edge of the cell membrane and the protrusion tip, which could be 5–50 μm long.
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8

Scanning Electron Microscopy Sample Preparation

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Cells on platforms were washed twice with PBS and fixed for 15 min with 4% paraformaldehyde. The cells were then treated with ethanol at concentrations of 30%, 50%, 70%, 80%, 90%, 95%, and 100% for 5 min each, and then dried in a critical point dryer (EM CPD300, Leica, Germany) for 4 h. To prevent charging during imaging in the scanning electron microscope (SEM, SU5000 FE-SEM, Hitachi, Japan), a thin layer of Au was coated onto the dried samples using a thin film coater (Q150 coater, Quorum Technologies, Lewes, UK). The coated samples were then mounted onto a 51 mm stub using conductive tape. Samples without and with cells were captured using a secondary electrons detector with a 10 kV accelerating voltage to achieve high-resolution images.
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9

Detailed SEM and TEM Imaging Protocols

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Scanning electron microscopy (SEM) was performed as described previously (Bhar et al., 2021 (link)). Briefly, bacterial pellets were fixed with Trump's fixative, washed with 0.1M sodium cacodylate, pH 7.24 and then fixed with OsO4. The sample is dehydrated in 25%–100% graded ethanol series, dried by Tousimis Autosamdri‐815 and mounted on 12 mm Carbon Conductive Adhesive Tab and aluminum stub with sputter gold/palladium coating before being imaged by Hitachi SU‐5000 FE‐SEM. Negative staining was performed using Transmission electron microscopy (TEM) as described previously (Bhar et al., 2021 (link)). Briefly, purified bacterial OMVs pellet, stool derived bEVs or concentrated MNV‐1 were resuspended in fixating solution and 10 μl droplet of the homogenate was poured onto 400‐mesh carbon coated Formvar nickel grid. The excess solution was removed, and the grid was fixed. The grid was stained using floatation on 10 ml of 1% aqueous uranyl acetate and observed with FEI Tecnai G2 Spirit Twin TEM. Finally, images were obtained using Digital Micrograph software and a Gatan Ultrascan 2kX camera.
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10

Scanning Electron Microscopy and Elemental Mapping

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FE-SEM and STEM was performed using a Hitachi S-5200 (Hitachi High-Tech Corp., Tokyo, Japan) equipped with detectors for secondary and transmitted electrons at 4 kV and 30 kV acceleration voltage, respectively. Micrographs using backscattered electrons were recorded with a Hitachi SU 5000 FESEM. An EDAX Phoenix X-ray-detector system attached to the Hitachi S-5200 was used to record elemental maps at a pixel resolution of 512 × 400 and a dwell time of 200 µs per pixel leading to 88 full scans per hour. A full spectrum was recorded and stored for every pixel (spectral mapping). At each scan, spectra were integrated for every pixel allowing for standard-less background corrected calculation of atomic ratios for selected regions. For bulk samples we used the ZAF mode and for thin sections the Mthin mode following the method of Zaluzec (1980) as implemented in the EDAX Genesis software (Ametek GmbH, Meerbusch, Germany).
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