The morphology of the grains of each fraction was studied using a field emission gun scanning electron microscope (FEG-SEM) Zeiss Σigma 300 VP (Zeiss Oberkochen, Germany). Micrographs were acquired with a secondary electron detector (SE) using an accelerating voltage of 10–15 kV and a working distance of 3 mm. For the analysis an aluminum stub was covered with a carbon disk. Then, each pulse fraction was deposited over the carbon disk. Before the FEG-SEM analysis, all the samples were carbon coated. Three representative SE micrographs for each sample were further processed by ImageJ software (National Institutes of Health, Bethesda, USA) in order to measure the starch granules diameter. The analysis was carried out in duplicate.
σigma 300 vp
Manufactured by Zeiss
Sourced in Germany
The Zeiss Σigma 300 VP is a versatile laboratory microscope designed for a wide range of applications. It features a high-performance optics system and advanced imaging capabilities to provide clear and detailed visualization of samples. The instrument is equipped with various magnification options and can accommodate a variety of specimen types. However, a more detailed and unbiased description cannot be provided without the risk of extrapolation or interpretation.
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Lab products found in correlation
2 protocols using σigma 300 vp
1
Starch Grain Morphology Analysis
2
Morphological Analysis of Grain Fractions
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The morphology of the grains of each fraction was studied using a field emission gun scanning electron microscope (FEG-SEM) Zeiss Σigma 300 VP (Zeiss Oberkochen, Germany). Micrographs were acquired with a secondary electron detector (SE) using an accelerating voltage of 10 kV and a working distance of 3-5 mm. For the analysis, an aluminium stub was covered with a carbon disk, on which the powdered sample was deposited, and the specimens were carbon coated by sputtering.
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