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Jem 1010 80 kv electron microscope

Manufactured by JEOL

The JEM-1010 (80 kV) is a transmission electron microscope manufactured by JEOL. It operates at an accelerating voltage of 80 kV and is designed to provide high-resolution imaging of samples. The core function of the JEM-1010 is to generate and transmit an electron beam through a thin specimen, allowing for the magnification and observation of microscopic structures.

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2 protocols using jem 1010 80 kv electron microscope

1

Phycobiont Ultrastructure Analysis by TEM

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The ultrastructure of the phycobionts was characterized by transmission electron microscopy (TEM) from five thalli (one specimen per species). Specimens from AN, AP, RM and DRM were sampled in a parasitic state from the same DD thallus (Fig. 5A), and their primary phycobionts were identified by Sanger sequencing. For TEM, the cells were fixed and dehydrated as described in Molins et al.46 (link),72 . Samples were embedded in Spurr’s resin according to the manufacturer’s instructions. Sections (90 nm) were cut and mounted as described in Moya et al.38 (link). The sections were observed with a JEOL JEM-1010 (80 kV) electron microscope equipped with a MegaView III digital camera and ‘AnalySIS’ image acquisition software. TEM examinations were carried out at the SCSIE Service of the University of Valencia.
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2

Transmission Electron Microscopy of Cells

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For TEM (transmission electron microscope), the cells were fixed and dehydrated as described in Molins et al. (2018) . Samples were embedded in Spurr's resin according to the manufacturer's instructions. Sections (90 nm) were cut and mounted as described in Moya et al. (2018) . The sections were observed with a JEOL JEM-1010 (80 kV) electron microscope, equipped with a MegaView III digital camera and 'AnalySIS' image acquisition software.
TEM examinations were made at the SCSIE Service of the University of Valencia.
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