Frontier atr ftir

The solid was analyzed with a Fourier Transform-Infrared Spectroscopy (FT-IR) on a PerkinElmer Frontier ATR-FTIR/NIR with a CPU32 Main software. Raman Spectroscopy was performed in a RENISHAW inVia Microscope using a laser excitation wavelength of 514 nm. X-Ray Photoelectron Spectroscopy was used on a PHI VersaProbe II with 2x10 -8 mTorr vacuum chamber, aluminum anode as X-ray monochromatic source and a radiation energy of 1486.6 eV. The analysis range was from 1400 to 0 eV. High resolution spectra of the C 1s signal was obtained for each of the samples. The high-resolution spectra were acquired with a step energy of 11.75 eV. The software used to do the deconvolution was CasaXPS (version 2.3.19PR1.0). Zeta Potential was measured in a Malvern Zetasizer Nano Z ZEN2600. As concentration of solutions was quantified by plasma atomic emission spectrometry (ICP, PERKIN ELMER optima 8300 model). Transmission electron microscopy analysis was performed in a FEI-Talos F200S with four in-column Super-X EDS detectors with a beam current of 300 pA and a collection time of 10 min.