S 570
The S-570 is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging of samples at the nanoscale level. The S-570 uses a focused beam of electrons to scan the surface of a sample, generating detailed information about its topography and composition.
Lab products found in correlation
58 protocols using s 570
Scanning Electron Microscopy of Flower Buds
Comprehensive Nanomaterial Characterization
Ultrastructural Analysis of Pea Pods
Morphological Analysis of Polymer Blends
with an accelerating voltage of 10 kV (Hitachi S-570). The samples
are fractured in liquid nitrogen and obtained from the notched Izod
impact test, which are sputtered with gold first and then observed
by SEM.
Nanoparticle Elemental Composition
Cellular Ultrastructure Analysis by SEM and TEM
For TEM analysis, cells were fixed with 3% glutaraldehyde at 20°C for 48 h. Following fixing, cells were washed and dehydrated as before, and cells were embedded in Epon-Araldite mix solution and blocked at 60°C in a vacuum drying oven (Yamoto, DPF-31) for 36 h. First, semithin slides were made using an ultramicrotome (LKB-2088) and stained with 1% toluidine blue (1% borax) on a 60°C hot plate for 2 min. Then, ultrathin slices were made and stained with uranyl acetate and lead citrate. The cell microstructures were observed under TEM (JEM-1230, JEOL, Japan).
Scanning Electron Microscopy of Blend Fractures
blends was observed by Hitachi S-570 SEM with an accelerating voltage
of 10 KV. The fracture surfaces obtained from the notched Izod impact
test were sputtered with gold and characterized by SEM directly.
Morphological Analysis of Human Red Blood Cells Treated with OTC
Visualization of Apios Starch Granules
Scanning Electron Microscopy of Infected Wheat
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