Thermo scientific k alpha

The size and morphology of Gd₂O₃:Eu NPs were tested by Transmission Electron Microscope (TEM, JEOL Ltd, Tokyo, Japan). The diameters of the NPs were measured with Image J according to the TEM images (National Institutes of Health, Maryland, USA). Fluorescent properties including emission and excitation spectra were measured using EnSpire Multimode Plate Readers (PerkinElmer, Inc., Massachusetts, USA). The crystal characteristics of the nanoparticles were tested with an Ultima IV X-ray diffractometer (XRD, Rigaku, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) measurements were carried out with Thermo Scientific K-Alpha + (Thermo Fisher Scientific, Massachusetts, USA).

The surface morphology of materials was characterized by scanning electron microscopy (FEI-NOVANANOSEM 450, FEI Company, Hillsboro, WA, USA). The specific surface area and pore diameter distribution of the materials were measured by an automatic specific surface area tester (Mike ASAP 2460, Micromeritics, Norcross, GA, USA) by using the Brunauer–Emmett–Teller method. Fourier transform infrared spectroscopy (IRPrestige-21, Shimadzu Company, Tokyo, Japan) was used to investigate the element composites and functional groups of materials. X-ray photoelectron spectroscopy (Thermo Scientific K-Alpha, Thermo Scientific company, Waltham, MA, USA) was used to measure the element and chemical composition of the materials’ surfaces.

The morphologies of the samples were imaged using a JSM 6490LV from JEOL (BEIJING) Co., Ltd., Beijing, China scanning electron microscope (SEM). High-resolution transmission electron microscopy (HRTEM) images were collected on a Technai G2 20. X-ray photoelectron spectroscopy (XPS) was performed using an X-ray photoelectron spectrometer (XPS, Thermo Scientific K-Alpha+) from ThermoFisher Technology (China) Co., Ltd., shanghai, China. X-ray diffraction (XRD) was conducted with a X’ Pert PRO diffractometer using Cu Kα radiation (λ = 1.54056 Å).

The X-ray diffraction (XRD, SmartLab, Rigaku, Tokyo, Japan) was conducted using Cu-Kα radiation (λ = 1.5406 Å). Raman scattering was recorded using a LabRAM HR Evolution Raman spectrometer with a 532 nm laser (Horiba Jobin-Yvon, Villeneuve d’Ascq, France). Fourier transform infrared (FT-IR) was performed using a Fourier transform infrared spectrometer (Shimadzu IRAffinity-1S, Kyoto, Japan). The morphology was observed via field emission scanning electron microscopy (FESEM, Hitachi S4800, Kyoto, Japan) and field-emission transmission electron microscopy (TEM, FEI Tecnai TF20, Hillsboro, OR, USA). The elemental energy dispersive spectroscopy (EDS) analysis was conducted using an Oxford EDS detector. X-ray photoelectron spectroscopy (XPS) was performed using a monochromatic Al Kα X-ray source with photon energy of 1486.6 eV (Thermo Scientific K-Alpha, ThermoFisher, Waltham, MA, USA). Electrochemical impedance spectroscopy (EIS) was performed on a CHI760E electrochemical workstation (Chenhua, China) with a Pt wire counter electrode and an Ag/AgCl (3 M KCl) reference electrode. An electron paramagnetic resonance spectrometer (EPR, JEOL JES FA200, Tokyo, Japan) was used to identify the radical species with DMPO and TEMP spin-trapping agents.

Scanning electron microscopy (SEM) is carried out using TESCAN MIRA LMS (TESCAN, Brno, The Czech Republic) to characterize the morphologies of samples. X-ray diffraction (XRD) is carried out using Ultima-IV (Origin Systems, Austin, TX, USA) to identify the phase structure of samples. Fourier transform infrared (FTIR) spectra are obtained on a Niolet iN10 spectrometer (Thermo Fisher Scientific). X-ray photoelectron spectroscopy (XPS) spectra data are obtained on Thermo Scientific K-Alpha+ (Thermo Fisher Scientific, Waltham, MA USA). Thermogravimetric analysis testing (TGA) is measured using Discovery TGA 550 (TA Instruments, New Castle, DE, USA) from room temperature to 800 °C at a heating rate of 10 °C min⁻¹ under a nitrogen atmosphere. The uniaxial tensile tests are conducted on Inspekt Table Blue 5KN testing machine (Hegewald & Peschke, Nossen, Germany). Samples are cut into the size of 150 mm × 15 mm × 1.25 mm and tested with a crosshead speed of 30 mm min⁻¹. The lithium metal electrodes used for SEM and XPS characterization are cleaned with DME several times and dried in an Ar-filled glove box.

The crystal phases were investigated via an X-ray diffractometer (XRD, XRD-6100, Shimadzu, Kyoto, Japan) using Cu-Kα radiation (λ = 1.5406 Å). The morphologies and lattice properties were analyzed by scanning electron microscopy (SEM, Sigma, Carl Zeiss, Oberkochen, Germany) and transmission electron microscopy (TEM, JEM2100, JEOL, Kyoto, Japan). The specific surface areas were determined by the physical adsorption of N₂ on a Micromeritics (ASAP 2020, Micromeritics, Atlanta, GA, USA) using the Brunauer–Emmett–Teller (BET) equation. The chemical state was analyzed by X-ray photoelectron spectroscopy (XPS, Thermo Scientific K-Alpha, Thermo Fisher, Waltham, MA, USA). The light absorption as well as charge separation and transfer efficiency were studied by ultraviolet-visible diffuse reflection spectroscopy (UV–vis DRS, Lambda 750, PerkinElmer, Waltham, USA), photoluminescence spectroscopy (PL, ZolixLSP-X500A, Zolix, Beijing, China), fluorescence lifetime spectrophotometer (C11367, Quantaurus-Tau, Hamamatsu, Japan), and three-electrode photoelectrochemical cell system (CHI660E, Chenghua, Shanghai, China). The water contact angles were measured by a contact angle meter (HARKE-SPCA, HARKE, Beijing, China). TOC analyzer (TOC-2000, Metash, Shanghai, China) was utilized to investigate the total organic carbon (TOC) of the residual solution.

X‐ray photoelectron spectroscopy (XPS) spectra of apo-R168H/L169C-rHLFr Au composites acquired on a Thermo Scientific K-Alpha (Thermo Scientific, USA) using an Al Ka X-ray source (6 mA, 15 kV). The freshly prepared apo-R168H/L169C-rHLFr Au composites were concentrated to about 30 μM and dropped on clean Si plates to dry, then used for XPS analysis. The binding energy was corrected using C1s spectra (284.8 eV) as a standard before further analysis.