Jsm 6700f field emission sem

The X-ray powder diffraction (XRD) patterns of the samples were obtained using a Philips X’ Pert PRO SUPER diffractometer equipped with graphite monochromatized Cu Kα radiation (λ = 1.541874 Ǻ). The scanning electron microscopy (SEM) images of the samples were obtained using an X-650 scanning electron micro analyzer and a JSM-6700F field emission SEM (JEOL Co., Japan). The transmission electron microscopy (TEM) images of the samples were recorded on a TEM (H-7650, Hitachi Co., Japan), using an electron kinetic energy of 100 kV. The high-resolution transmission electron microscopy (HRTEM) images and selected area electron diffraction (SAED) patterns were analysed with a HRTEM (2010, JEOL Co., Japan) performed at an acceleration voltage of 200 kV. The mapping element were analysed using a scanning transmission electron microscope (STEM) (JEM-ARM200F, JEOL Co., Japan) at an acceleration voltage of 200 kV. The chemical composition and the valence states of the constituent elements were analysed by X-ray photoelectron spectroscopy (XPS) (ESCALAB250, Thermo Fisher Inc., USA), and the diffuse reflectance spectra were assessed using a UV/Vis spectrophotometer (UV-2550, Shimadzu, Japan).

The SHs flour (1.840 g) was placed in the glass bottle under 75% RH conditions to facilitate water absorption for 30 h at 25 °C. The glass bottle was kept in clean and relatively closed LHS-250SC box with constant temperature and humidity. The unstored SHs flour was named SHs-0 h and stored SHs flour for 30 h was named SHs-30 h. The effects of moisture absorption on morphological changes of SHs flour were evaluated by SEM. SEM experiment was performed according to the previous method described by Zhao et al. [15 (link)]. The SHs-0 h and SHs-30 h flour were observed with a JSM-6700F field emission SEM (JEOL Ltd., Tokyo, Japan) by the E-1045 ion beam sputtering instrument (Hitachi Co. Ltd., Japan). The SHs-0 h or SHs-30 h flour (1 mg) was adhered to a circular aluminum specimen and photographed under the condition with a potential of 3000 V. The SEM micrographs magnification was 1000 and 5000×.

Ground sections of teeth were prepared as described by [21 (link),37 (link)]. Teeth were stained with Villanueva stain for 3 days, followed by dehydration, infiltration with a mixture of propylene oxide and then embedded in resin at 60 °C for 5 days. Sections were prepared by using a diamond saw (Accutom 50, Ballerup, Denmark), ground (Rotopol-35, Ballerup, Denmark), then mounted on slides in historesin mounting media (Leica, Hanau, Germany). SEM (SEM; JEOL JSM-6700 F Field emission SEM, Tokyo, Japan) was performed, as detailed by [35 (link)].

The samples were characterized by different analytical techniques. Simultaneous TG/DSC analysis was performed on a NETZSCH STA 449 C Jupiter system. Optical image was captured on a Nikon Microphot-FXA microscope. SEM observations were made on a JEOL JSM-6700F field-emission SEM. TEM images, SAED pattern, EELS, and EDS were obtained on a JEOL JEM-2100F STEM (200 kV, field-emission gun) system equipped with an Oxford INCA x-sight EDS and an ENFINA 1000 EELS. XPS spectra were acquired on a Thermo Scientific Escalab 250Xi spectrometer. XRD measurement was conducted using a Rigaku SmartLab Intelligent X-ray diffraction system with filtered Cu K_α radiation (λ = 1.5406 Å, operating at 45 kV and 200 mA). Raman measurement was taken using a Horiba Jobin Yvon LabRAM HR system with a laser wavelength of 488 nm. The nitrogen adsorption and desorption isotherms were obtained at 77 K with a Micromeritics ASAP 2020 volumetric adsorption analyzer.