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Asylum mfp 3d

Manufactured by Oxford Instruments
Sourced in United States

The Asylum MFP-3D is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise control and measurement of sample topography, mechanical properties, and other surface characteristics.

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11 protocols using asylum mfp 3d

1

Measuring EWNS size and lifetime

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An Atomic Force Microscope (AFM), Asylum MFP-3D (Asylum Research, Santa Barbara, CA) and the AC260T probes (Olympus, Tokyo, Japan) were used to measure the size and lifetime of EWNS. The AFM scan rate was 1 Hz and the scanned area 5 μm × 5 μm with 256 scan lines. All images were subjected to 1st order image flattening with the Asylum Software (range of 100 nm and threshold of 100 pm for the mask).
The sampling funnel was removed and the mica surface was placed at a 2.0 cm distance from the counter electrode for an average time of 120s to avoid particle coalescence and the formation of irregular shaped droplets on the mica surface. The EWNS were directly sprayed on a freshly cleaved mica surface (Ted Pella, Redding, CA). The mica surface was imaged immediately after the spray using AFM. The contact angle of a freshly cleaved, unmodified, mica surface is close to 0° so the EWNS were spread on the mica surface adopting a dome like shape20 (link). The diameter (a) and the height (h) of the spread droplet were measured directly from the AFM topography and used to calculate the volume of the dome-like spread of EWNS with our previously validated methodology8 (link). Assuming that airborne EWNS have the same volume, an equivalent diameter can be calculated with equation (2):

where a is the radius of the spread droplet and h the height.
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2

Atomic Force Microscopy Techniques

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Example 13

Atomic Force Microscopy

Atomic force microscopy (AFM) measurements were performed on an Asylum MFP-3D instrument (Asylum Research, Santa Barbara, Calif.) installed on a Nikon TE2000 microscope. Silicon cantilevers (VISTAprobes, T300) were used for tapping-mode measurements in air and silicon nitride cantilevers (Veecoprobes, DNP-S20) were used for tapping-mode measurements in UP H2O.

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3

Stiffness Characterization of GelMA Hydrogels

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The stiffness of the GelMA hydrogels was measured using an atomic force microscope (AFM) (Asylum MFP-3D, Asylum Research, Santa Barbara, CA, USA) in contact force mode using silicon nitride cantilevers with a spring constant of 0.12 N/m (DNP-S10, Bruker, CA, USA). The tip geometry was triangular with a tip radius of 10 nm. Three samples were prepared for each sterilization method and three force maps of 10 μm × 10 μm were collected on each sample. Each force map was fitted to the linear region of the force curve to obtain the Young’s modulus using the Hertz Model and assuming the sample was isotropic and linearly elastic [16 (link)].
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4

AFM Surface Characterization Protocol

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Atomic force microscopes Solver Next (NT-MDT SI, Zelenograd, Russia) and Asylum MFP-3D (Asylum Research, Goleta, CA, USA) were used to study surface morphology and conduct roughness measurements. Images were obtained using semi-contact AFM mode with NSG01 probes, resonance frequency of 120–150 kHz, a radius about 10 nm, and a stiffness of 4–6 N/m. Image analysis was carried out using software by Gwyddion. Surface roughness values (Sa) and smoothness coefficients (k) were calculated as an average of a minimum 5 measurements obtained from different positions on the sample surface.
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5

Collagen Peptide Morphology on Silicon and PDMS

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The morphology of collagen peptides on silicon and PDMS with or without FOTS treatment was measured, as described above, using atomic force microscopy (AFM) (Asylum, MFP 3D, Asylum Research, Santa Barbara, CA, USA). Collagen peptide solutions were incubated on the surfaces using the microspot patterning, as described above, or in 4 mm diameter PDMS wells. A solution containing 250 µg/mL of each peptide (CRP, GFOGER, and VWF-III) in 10 mM acetic was incubated in these wells for 2 h at room temperature in a humid environment. The wells were rinsed in triplicate using DI water, the PDMS device was removed, and the substrate was dried using an air brush. AFM images of the spots were taken using alternating current (AC) Tapping mode in air. The root mean square roughness (RMS) was calculated for each surface using Gwyddion [23 (link)].
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6

AFM Nanoindentation of Phage Fibers

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The Asylum MFP-3D (Asylum Research, Santa Barbara, CA), Igor Pro 6.0, and Asylum software package was used to measure the mechanical properties of electrospun phage fibers through AFM nanoindentation method. In this method, the probe was a cone shaped silicon tip (Tap300Al-G, Ted Pella, Inc., Redding, CA) with <10 nm radius, and 62 N m−1 spring constant. The force-indentation loading and unloading curves of 50 different points in several phage electrospun fibers were taken with AFM nanoindentation method. According to the Oliver–Pharr model,41 (link) a line with slope S = dF dl−1 (S: unloading stiffness, F: force, l: indentation length) was fit in the upper portion of the unloading curves in the data to calculate Young's modulus.42 (link) We used dehydrated electrospun phage fibers on the gold-coated silicon substrate under environmental conditions (25 °C, 40% relative humidity).
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7

Atomic Force Microscopy and Spectroscopy of Bacterial Colonies

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The bacteria were grown for 24 h on TSA agar. The colonies were washed off the agar pates with distilled water and dried for 15 min. AFM samples were prepared by mounting of agar pieces on glass slides. AFM images were obtained using Asylum MFP-3D (Oxford Instruments) operated in tapping mode (scan rate = 0.3–0.4 Hz, Si tip, probe stiffness ~40 N/m, drive frequency 316 kHz, ambient temperature). Electronic spectra were recorded on a Varian 5000 UV/vis/NIR instrument. The relative peak positions were assigned via spectral deconvolution using Origin 7.5 software (Originlab). Samples were interrogated in 2 mm path-length fused-silica cells under argon.
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8

Visualizing Graphene Oxide on Mica Surface

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Atomic force microscope (Asylum
MFP-3D, Oxford instruments), standard air-tapping mode (silicon probes
Ted Pella, silicon probes), 300 kHZ resonance frequency, and 40 N/m
force, was used. We used mica surface (Ted Pella, freshly cleaved)
layered by 20 μL of poly-l-lysine 0.01% solution (Sigma-Aldrich),
and, upon wash with water, 20 μL of GO suspension (100 μg/mL)
was drop casted. Gwyddion software (http://gwyddion.net, version 2.56) was used to image processing.
ImageJ software (https://imagej.nih.gov) with AFM images 5 μm × 5 μm height distribution
analysis allowed was used to obtain the lateral dimensions values.
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9

Peptoid Nanostructure Imaging by AFM

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Ex situ (in air) AFM imaging of
the peptoid assembled nanostructures were performed on an Asylum MFP-3D
(Oxford Instruments) atomic force microscope in tapping mode. The
peptoid assembly solution was diluted for 10 times (0.4 mg/mL) with
ultrapure water. Five microliters of the diluted solution was loaded
onto precut 4 in. silicon wafer (4 in. wafer with 5 × 7 mm chips,
Ted Pella, Inc.), which was plasma cleaned in a Harrick plasma cleaner
using a mix of Ar/O2 (25/75 v/v). The drop was then quickly
dried with a stream of nitrogen. TAP 150 AL-G tips were used with
resonant frequency at 150 kHz and the force constant at 5 N/m. The
AFM images were processed and analyzed using Gwyddion software.
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10

Atomic Force Microscopy Imaging of Hyaluronic Acid

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Atomic force microscope (AFM) imaging was carried out using an Asylum MFP-3D standalone AFM (Oxford Instruments, Santa Barbara, CA, USA). The sharp nitride lever (SNL) tip (SNL-10, a silicon tip with a 0.35 N/m spring constant on a silicon nitride cantilever, Bruker AFM Probes, Camarillo, CA, USA) was used with tapping mode in water or the HA solution at room temperature (as shown in Figure 3).
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