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Jfcc 160 ion sputterer

Manufactured by JEOL

The JFCC-160 is an ion sputterer manufactured by JEOL. It is a compact and versatile instrument designed for depositing thin films onto sample surfaces. The JFCC-160 uses an ion beam to sputter material from a target, creating a controlled deposition of the sputtered material onto the sample. The ion sputterer is a critical tool for various applications, including surface analysis, thin-film research, and sample preparation for electron microscopy.

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2 protocols using jfcc 160 ion sputterer

1

Scanning Electron Microscopy of Cultured Cells

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Logarithmic growth phase cells (31 passages) were processed for scanning electron microscopy. Cell slides were washed with physiological saline, fixed in 4% glutaraldehyde (SPI-CHEM, USA) and rinsed thrice with phosphate buffer. Subsequently, the slides were dehydrated with 50%, 70%, 80%, 90% and 100% tert-butanol in a step-by-step gradient for 5 min each time. A JEOL JFD-320 cold dryer was used to dry the samples, and the dried samples were taken out after they reached room temperature. A conductive paste was used to coat the sample holder with a JEOL JFCC-160 ion sputterer. Observations and imaging were performed using a HITACHI Regulus 8100 scanning electron microscope after sample preparation.
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2

Scanning Electron Microscopy Preparation

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Thirty-five passages of logarithmic growth phase ICC-X1 cells were used for these experiments. After washing the cell slides with physiological saline, they were quickly put into 4% glutaraldehyde (SPI-CHEM, USA) in a fixative solution and rinsed three times with phosphate buffer. The cells were dehydrated with 50%, 70%, 80%, 90%, and 100% tert-butanol in a step-by-step gradient (5 min at each concentration). Next, the cells were put into the JEOL JFD-320 cold dryer, and the dried sample was taken out when the temperature equilibrated to room temperature. A conductive paste was used to coat the sample holder with a JEOL JFCC-160 ion sputterer. The specimens were observed and photographed using a scanning electron microscope (HITACHI Regulus 8100).
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