2100 plus transmission electron microscope
The JEOL 2100 Plus Transmission Electron Microscope is a high-performance, versatile instrument designed for advanced materials characterization. It features a LaB6 electron source, a robust and stable column, and a high-resolution imaging system. The JEOL 2100 Plus provides researchers and scientists with a powerful tool for studying the structure and composition of a wide range of materials at the nanoscale.
2 protocols using 2100 plus transmission electron microscope
Cryo-TEM Imaging of Extracellular Vesicles
High-Resolution Ultrastructural Imaging
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