D max rc

The polycrystalline X-ray diffractometer (D/MAX-RC, Rigaku, Tykyo, Japan) equipped with Cu-Kα radiation at 40 kV and 40 mA was used to analyze mineral composition of hydration products at 28 days with an angular accuracy of ±0.01°, a scanning speed of 5°/min, and a scanning range of 10–80°.

The microstructure of FCI particle and rGO-coated FCI particle was analyzed by field emission scanning electron microscopy (FEI, Quanta 2005), and the samples were mounted on aluminum studs using adhesive graphite tape and sputter-coated with gold before analysis. The structural information of the samples was identified by X-ray diffractometer (XRD, Rigaku D/MAXRC) using Cu Kα radiation source (λ = 1.5406 Å). Raman spectra were recorded on a confocal Raman spectrometer system (Renishaw, In Via) using a 532 nm laser as the excitation source. The magnetic measurement was carried out at room temperature by a vibrating sample magnetometer (VSM, Lakeshore-7404, USA). The complex permittivity and permeability of the composites were measured using the T/R coaxial line method in the frequency range of 2–18 GHz by a network analyzer (Agilent technologies E8362B: 10 MHz to 20 GHz). A sample containing 40 wt% of as-prepared product was pressed into a ring with an outer diameter of 7.0 mm, an inner diameter of 3.03 mm, and a length of about 3.0 mm for microwave measurement in which paraffin wax was used as the binder.

The crystal structures and bonding within the electrode samples after cycling were analyzed by X-ray photoelectron spectroscopy (XPS), Raman spectroscopy (T64000, Horiba Jobin-Yvon, excitation at 633 nm) and X-ray diffraction (XRD, RIGAKU, D/MAX-RC). Raman spectra were recorded with a CCD detector that was cooled to −70 °C and a silicon wafer was used to calibrate the Raman shift. XPS measurements were performed at Brookhaven National Laboratory on a SPECS GmbH instrument under ultrahigh vacuum (UHV) conditions. The X-ray source was Al Kα at a power of 300 W.

Ca(NO₃)₂·4H₂O, 85% aq. H₃PO₄, 25% aq. NH₃ and ethanol (Prime Chemicals Group, Moscow, Russia) were used as purchased.
XRD patterns were obtained with a Rotaflex RU-200 X-ray source (Rigaku, Japan) with rotating anode tube (CuKα radiation, 50 kV and 160 mA mode) equipped with a horizontal wide-angle goniometer Rigaku D/Max-RC with Bragg-Brentano θ–2θ geometry at angle range 2θ = 10–60°, step 0.02°, continuous scan rate 1°/min.
Sample morphologies of HAp nanoparticles were studied using a Hitachi HT7700 transmission electron microscope (Hitachi Ltd., Tokyo, Japan). Images were acquired in bright-field TEM mode at 100 kV accelerating voltage. A target-oriented approach was utilized for the optimization of the analytic measurements [66 (link)]. Before measurement, the samples were mounted on a 3 mm copper grid and fixed in a grid holder.

Surface morphology of the nanowire structures was investigated by field emission scanning electron microscopy (FESEM; JEOL, JSM-700F) and transmission electron microscopy (TEM), scanning TEM (STEM), and high-resolution TEM (HR-TEM). The structural properties were investigated by X-ray diffraction (XRD; Rigaku D/MAX-RC) using Cu Kα radiation with a Ni filter. The electronic structure of the surface of samples was elucidated by X-ray photoelectron spectroscopy (XPS; VGMultilab 2000; Thermo VG Scientific, UK).