M 2000 spectroscopic ellipsometer
The M-2000 is a spectroscopic ellipsometer manufactured by J.A. Woollam Co. It is an optical instrument used for the measurement of thin film thickness and optical properties. The M-2000 operates by reflecting a polarized light beam off the surface of a sample and analyzing the change in the polarization state of the reflected light.
Lab products found in correlation
6 protocols using m 2000 spectroscopic ellipsometer
Adsorption of Hydrophobin SC3 on Surfaces
Protein Adsorption on Spin-Coated Films
NO-Releasing CarboSil® Thin Film Characterization
Ellipsometric Analysis of Protein Adsorption
Thin Film Optical Property Characterization
Woollam Co., Inc.) is used to measure film thicknesses and optical
properties. The ellipsometer reports ψ and Δ values as
a function of wavelength from 350 to 1000 nm. These values contain
information to calculate the refractive index, extinction coefficient,
and thickness of the film as experimental conditions are varied. The
fitting model for systems reported here consists of a bare silver
substrate layer, an intermixed layer, and a general oscillator layer
to account for some small optical absorption by the thickest films.
Spin Coating for Thin Polymer Films
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