electron microscopy (HRTEM) is carried out on an aberration-corrected
FEI Titan3 80–300 microscope at 300 keV electron energy. Samples
for HRTEM were prepared at room temperature in air by drop casting
of a diluted suspension of carbon dot/CNT complexes in water onto
an ultrathin amorphous carbon film (3 nm) on a holey carbon support
film mounted on a 400 μm mesh Cu grid (Ted Pella Inc.). HRTEM
images were evaluated by calculating their two-dimensional Fourier
transform (FT), which yields information on the crystal structure
(lattice parameters and crystal symmetry) of single carbon dot/CNT
complexes. The analysis was performed by comparing experimental FTs
and calculated diffraction patterns with Miller indices, where the
latter were obtained by using Jems (Java version of the electron microscopy
simulation) software.30 On FT images, the
zero-order beam is indicated by a white circle.