The largest database of trusted experimental protocols

Miniflex 2 desktop

Manufactured by Rigaku
Sourced in Japan

The MiniFlex II Desktop is an X-ray diffractometer designed for laboratory use. It is a compact, versatile instrument that provides phase identification and quantification of polycrystalline materials. The MiniFlex II Desktop is capable of performing a wide range of X-ray diffraction measurements and analyses.

Automatically generated - may contain errors

9 protocols using miniflex 2 desktop

1

Crystallographic Analysis of Nanomaterials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystallographic structure of the prepared nanomaterials
was
studied by XRD techniques using a Rigaku MiniFlex II Desktop diffractometer
equipped with a radiation source from an X-ray tube with Cu Kα
radiation (λ = 1.54 Å). Measurements were performed in
a 2θ range of 20–80° with a scan rate of 2°/min
and 0.02° increases.
+ Open protocol
+ Expand
2

Characterization of Bimetallic Nanoparticles

Check if the same lab product or an alternative is used in the 5 most similar protocols
Samples drawn periodically were monitored with UV–Visible spectroscopy by recording the spectra between 200 and 800 nm using Shimadzu double beam spectrophotometer. FTIR spectroscopy analysis was carried out to reveal the functional group of biomolecules responsible to reduce the metal salts and stabilization of bimetallic nanoparticles by using the instrument JASCO FT-IR 4100 at room temperature with a resolution of 4 cm−1. Crystalline nature of the bimetallic nanoparticles was studied with XRD by coating the dried sample on XRD grid and spectra were recorded by Rigaku Miniflex-II Desktop X-ray diffractometer instrument operating at a voltage of 30 kV. Size and morphology of nanoparticles were analyzed by using Transmission Electron Microscopy, and an aliquot of nanoparticles was transferred on to a carbon-coated copper TEM grids. The films on the TEM grids were allowed to stand for 2 min, then extra solution was removed and the grid was allowed to dry prior to measurement and scanned using a TECHNAI-T12 JEOL JEM-2100. Transmission electron microscope was operated at a voltage of 120 kV with Bioten objective lens. Subsequently, the particle size was ascertained using a Gatan ccd Camera and histogram was constructed by counting 200 bimetallic nanoparticles (Baker et al., 2015 ).
+ Open protocol
+ Expand
3

Characterization of Cm-AgNPs by XRD

Check if the same lab product or an alternative is used in the 5 most similar protocols
The fabrication of Cm-AgNPs, along with the crystal structure and size, was approved by the XRD pattern. The XRD pattern of Cm-AgNPs was documented employing the Rigaku Mini Flex II Desktop X-ray diffractometer instrument and CuKα radiation (0.15418 nm). The powder of Cm-AgNPs for XRD analysis was prepared. The sample was scanned in the range of 20˚-80˚ of 2θ with a 46-s counting time. The ISDD standard software, Joint Committee on Powder Diffraction (JCPDS, Standard), made an XRD data study [42 (link)].
+ Open protocol
+ Expand
4

Comprehensive Characterization of Synthesized Nanocomposites

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphology of synthesized samples was examined using a scanning electron microscope (SEM, JEOL JSM-IT800, Tokyo, Japan). High-resolution transmission electron microscopy (HRTEM, JEOL JEM-2200FS, Tokyo, Japan) was used to analyze the microstructures of synthesized samples. Using energy-dispersive x-ray spectroscopy (EDX), elemental analysis was conducted with scanning transmission electron microscopy (STEM, JEOL JEM-2200F, Tokyo, Japan). Attenuated total reflectance: Fourier transform infrared (ATR-FTIR) spectra were acquired at room temperature with an ATR-FTIR spectrometer (Bruker, Tensor 27, Billerica, MA, USA). To evaluate the elemental composition, X-ray diffraction (XRD) (Rigaku Miniflex II desktop, Tokyo, Japan) measurements were performed. To determine the actual amount of each component in the nanocomposite, simultaneous thermal analysis (STA) was performed using a Rigaku (Thermo Plus Evo2, Tokyo, Japan) analyzer in air.
+ Open protocol
+ Expand
5

Characterization of Ag/Co3O4 Bimetallic Nanoparticles

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystalline structure of Ag/Co3O4 was identified using a Rigaku MiniFlexII Desktop X-ray
powder diffractometer with a wavelength of Cu Kα radiation and
10–80° scan range. Optical properties of the synthesized
catalysts were studied using Thermo Scientific Evolution 300 UV–visible
spectroscopy. FTIR spectroscopy (Thermo Nicolet FTIR 6700) spectra
of the as-synthesized samples were recorded in the range of 400–1800
cm–1 to understand the chemical bonding on the surface
of the catalyst. Morphology of the particles synthesized was analyzed
with SEM (Nova Nano 450, FEI). A high-resolution transmission electron
microscope (Tecnai G2, F20, FEI) has been used to identify
the presence of NPs and its size distribution. XPS (Kratos AXIS Ultra
DLD) was used to analyze the elemental composition and the bonding
configuration on the surface of bimetallic NPs.
+ Open protocol
+ Expand
6

Comprehensive Characterization of Humic Acids

Check if the same lab product or an alternative is used in the 5 most similar protocols
The C, H, N, and S contents in humic acids were determined using Vario Micro Cube Elementar (Elementar Analysensysteme GmbH, Germany); the O content was determined by the difference. All the experiments were performed in duplicates to confirm the accuracy of the data. An IR spectrometer (Varian 640-IR, American) was used to identify the organic functional groups in the HAs at ambient temperature. The humic acids and residual lignite samples (1 mg) were mixed with spectrometry grade dried KBr (100 mg) and then pressed into pellets under 10 MPa for 2 min. Spectra were recorded in the range 4000-400 cm -1 .
The phase composition of Na, K, Fe, N, P in humic acids was characterized using an X-ray diffractometer (Rigaku MiniFlex II DESKTOP) equipped with Cu Kɑ radiation (λ = 0.15406 nm) operating at 40 kV (tube voltage) and 140 mA (current). The samples were scanned in the range 10°-90° at a speed of 7°min -1 . The surface morphology of humic acids was visualized by a HITACHI-3500 N scanning electron microscope (SEM) (Hitachi Ltd, Japan). For observations by SEM, HA samples were dried in a desiccator and sputtered with platinum using a HITACHI E-1000 ion sputtering device. Elemental distribution of humic acids was accomplished by EDX spectroscopy. The samples were handled carefully to ensure that the HAs are not destroyed.
+ Open protocol
+ Expand
7

Powder X-ray Diffraction Analysis of Solid Forms

Check if the same lab product or an alternative is used in the 5 most similar protocols
The powder X-ray diffraction (XRPD) pattern was recorded at ambient temperature with a Rigaku MiniFlex II Desktop X-ray Powder Diffractometer. For radiation of Cu Ka at 30 KV,15 mA was used with 2q increments at a rate of 3 /min. The scans were run over a range of 2 -40 2q with a step size of 0.02 and a step time of 2 s. The powder samples were placed on a flat silicon zero background sample holder. All the samples for solubility testing were checked for their physical forms by XRPD when the solubility reached equilibrium.
+ Open protocol
+ Expand
8

Characterization of SaZnO Nanoparticles

Check if the same lab product or an alternative is used in the 5 most similar protocols
UV-Vis spectroscopic absorption measurements were carried out at room temperature using a UV–Vis spectrophotometer Beckman Coulter, (DU739, Germany) over the range of 200–800 nm. Fourier transform infrared (FTIR) transmittance was carried out with a PerkinElmer Spectrum 1000, (Shimadzu-8400S) in the range of 450–4000 cm-1. The crystallinity and phase purity of SaZnO NPs were characterized by XRD using a Rigaku Desktop MiniFlex II X-ray powder diffractometer with Cu kα radiation at an angle 2θ (λ = 0.15418 nm). The particle size was determined by Scherrer equation.
Where λ is the wavelength (Cu Kα) of X-Rays, β is the full width at half- maximum (FWHM) of the peak, and θ is the diffraction angle. The XRD pattern of SaZnO NPs was analyzed with the ICDD Powder Diffraction File database (International Centre for Diffraction Data) using Crystallographica Search-Match Version 2, 1, 1, 1. The surface morphology of SaZnO NPs samples is studied using SEM HITACHI (S-3400 N, Japan). The size of SaZnO NPs was studied using TEM (Tecnai G2 Spirit Bio-TWIN Transmission Electron Microscope).
+ Open protocol
+ Expand
9

Characterization of Zinc Oxide Nanoparticles

Check if the same lab product or an alternative is used in the 5 most similar protocols
The phase purity and the crystallinity
of the ZnO NPs were characterized by XRD using a Rigaku Desktop Miniflex
II X-ray powder diffractometer, Japan, with Cu kα radiation
with an angle 2θ (λ = 0.15418 nm). The particle size was
determined by the Scherrer equation for all samples as follows. where λ is the wavelength (Cu Kα)
of X-Rays, β is the full width at the half-maximum (FWHM) of
the peak, and θ is the diffraction angle.
The XRD pattern
of ZnO NPs was analyzed with the ICDD Powder Diffraction File database
(International Centre for Diffraction Data) using Crystallographic
Search-Match Version 2. The studies on the surface morphology of ZnO
NPs were performed by scanning electron microscopy (Hitachi S-3400N,
Japan).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!