Nicolet is20 spectrometer
The Nicolet iS20 spectrometer is a Fourier transform infrared (FTIR) spectroscopy instrument designed for laboratory use. It is capable of analyzing and identifying a wide range of materials through their unique infrared absorption spectra. The core function of the Nicolet iS20 is to provide high-performance FTIR analysis capabilities for various applications.
Lab products found in correlation
18 protocols using nicolet is20 spectrometer
Polysaccharide Films and Spectroscopic Analysis
Comprehensive Characterization of Nanocomposites
electron microscope
(SEM, Hitachi, Regulus 8220) with an accelerating voltage of 5 kV
and a transmission electron micrcoscope (TEM, JEOL, JEM-2100) with
an accelerating voltage of 200 kV were employed to characterize the
morphology and structure of all samples. The sample phase was determined
using a Bruker D8 Advance X-ray diffractometer with graphite monochromated
Cu Kα (λ = 0.15418 nm) radiation, and the scan range is
from 30 to 80°. X-ray photoelectron spectroscopy (XPS) was performed
on a Thermo XPS ESCALABXi+ instrument using Al Kα as the X-ray
source and corrected with the C 1s line at 284.8 eV. V-Sorb2800p was
employed to measure the nitrogen adsorption–desorption isotherms
of the nanocomposites at liquid nitrogen temperature (77 K). The absorbance
was detected by a Shimadzu UV-2450PC ultraviolet–visible spectrometer
at room temperature. Fourier transform infrared (FT-IR) spectra were
collected on a Nicolet iS 20 spectrometer (ThermoFisher Scientific)
in the range of 400–4000 cm–1.
Oleogel Spectra Analysis Protocol
Multimodal Nanostructure Characterization
For additional spectral analysis, Fourier transform infrared spectra were recorded using a KBr pellet technique in the 4000–400 cm−1 range. The 32 scans per spectrum were collected, enabling a 4 cm−1 resolution on the Nicolet iS20 spectrometer (Thermo Scientific, Waltham, MA, USA).
The morphology of prepared samples was analyzed using a field emission scanning electron microscope (FESEM) (JSM-6700F (JEOL)) and a Phenom ProX equipped with an energy-dispersive X-ray spectrometer (EDX) (Thermo Scientific, Waltham, MA, USA).
To confirm the nanostructures of synthesized samples, the transmission mode was also employed using an ultra-high resolution imaging H-8100 microscope (Hitachi Ltd., Chiyoda, Tokyo, Japan) with a LaB6 thermionic emission gun.
Infrared Spectral Analysis of Lyophilized Samples
Spectroscopic Analysis of Rejuvenating Oils
FTIR Analysis of Asphalt Aging
In the formula, AC=O is the area of the carbonyl peak; AS=O is the area of the sulfoxide peak; and is the sum of the area of each peak in the range of 2000 to 600 cm−1.
Comprehensive Material Characterization Protocol
Characterization of P2 or P2P Microcapsules
FTIR Spectroscopy of CS/PAA Samples
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