The phase compositions of the optimized samples were determined using a D/MAX2000 X-ray diffractometer (Rigaku, Tokyo, Japan) with a Cu target, a tube voltage of 40 kV, a tube current of 26 mA, a power of 1600 W, a scanning angle in the 10–90° range, a step size of 0.02, and a scanning speed of 5°/min. The pore structure, densification degree, crystal morphology, and elemental distribution of the sintered samples were observed using a Quanta200 scanning electron microscope (FEI Company, Portland, OR, USA). Simple measurements of the pore structures and visible crystal sizes of the samples were taken from the SEM images using the ImageJ (1.80) image processing tool. The average size of ceramic crystal Dxrd (nm) and lattice strain ε (%) was determined using the Williamson–Hall method, which is based on the XRD pattern data of ceramic materials analyzed with Jade 9.0 software.
D max2000 x ray diffractometer
Manufactured by Rigaku
Sourced in Japan
The D/MAX2000 is an X-ray diffractometer manufactured by Rigaku. It is designed to analyze the crystalline structure of materials through the diffraction of X-rays. The instrument can be used to identify unknown materials, measure the crystallinity of samples, and determine the orientation of crystallites.
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Lab products found in correlation
3 protocols using d max2000 x ray diffractometer
1
Structural Characterization of Optimized Ceramics
2
Characterization of Inorganic Compounds
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Commercial chemicals were used as purchased unless otherwise mentioned. FT-IR spectra were determined on a Mattson Alpha Centauri spectrometer. Elemental analysis data were recorded on a Perkin-Elmer Model 240C elemental analyzer. Powder X-ray diffraction (PXRD) patterns were determined on a Rigaku Dmax 2000 X-ray diffractometer using CuKα radiation (λ = 0.154 nm). UV-vis spectra were measured on a Cary TU-1900 doublebeam UV-vis spectrophotometer. Thermogravimetric (TG) data were conducted on a Perkin-Elmer Model TG-7 analyzer under nitrogen gas. Luminescent spectra were performed on a FLSP920 Edinburgh Fluorescence Spectrometer.
3
Comprehensive Material Characterization Protocol
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Particle size distribution was analyzed by a Bettersize 2000 laser particle size analyzer. Chemical compositions were determined by a Shimadzu 1800 X-ray fluorescence (XRF) spectrometer. X-ray diffraction (XRD) patterns were recorded on a Rigaku D/MAX 2000 X-ray diffractometer and the mineral compositions were identified using the Jade software. Thermo-gravimetric analysis (TGA) and differential scanning calorimetric (DSC) were performed using a Mettler Toledo 1/1600 simultaneous thermal analyzer at a heating rate of 10 °C min−1 in a nitrogen atmosphere. The micromorphology and element distribution were conducted by a scanning electron microscopy equipped with energy disperse X-ray spectrometry (MLA650F, F.E.I.). Specific surface area was analyzed by a Brunauer–Emmett–Teller (BET) surface area analyzer (Nova Station A, Quantachrome).
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