Fourier transform infrared spectroscopy ft ir

The ultraviolet-visible (UV-Vis) spectra of the PdNPs were recorded using an Optizen Pop spectrophotometer (Mecasys, Seoul, Korea) while X-ray diffraction (XRD) analyses were performed using a Bruker D8 Discover X-ray diffractometer (Bruker AXS GmBH, Karlsruhe, Germany). The X-ray source was 3 kW with a Cu target, and high-resolution XRD patterns were measured using a scintillation counter (λ = 1.5406 Å). The XRD was run at 40 kV and 40 mA, and samples were recorded at 2θ values between 10° and 80°. The dried PdNP powder was diluted with potassium bromide and Fourier transform infrared spectroscopy (FTIR, Perkin Elmer Inc., Waltham, MA, USA) and GX spectrometry were performed, and the spectra were recorded within the range of 500–4000 cm⁻¹. Transmission electron microscopy (TEM) using a TEM Hitachi H-7500 (Seoul National University, Seoul, Korea) was used to determine the PdNP size and morphology with images obtained at an accelerating voltage of 300 kV.

Insect pathogenic fungal-derived copper nanoparticles were characterized using UV-Vis spectrophotometer(Cole-Parmer India Pvt. Ltd., Mumbai, India), Fourier Transform Infrared Spectroscopy (FTIR) (PerkinElmer, Waltham, MA, USA), X-ray Diffraction (XRD) (M/S Virtue Meta-Sol, Hyderabad, India), Energy Dispersive X-ray analysis (EDaX) (Jeol, Tokyo, Japan), High Resolution Scanning Electron Microscope (HR-SEM) (Hitachi India Pvt. Ltd., Gujarat, India) and Atomic Force Microscope (AFM) (Nano Science and Technology Company, Uttar Pradesh, India) analysis.

The size and shape of ⁶⁴Cu-IO NPs were examined using scanning electron microscopy (SEM) (JEOL, Tokyo, Japan) and transmission electron microscopy (TEM) (HITACHI, Tokyo, Japan). For the elemental analysis, an element composition mapping was performed using an energy dispersive X-ray attachment (EDS) equipped with SEM. Inductive coupled plasma mass spectroscopy (ICP-MS) (Perkin Elmer, Waltham, MA, USA) was carried out to measure the element concentration of ⁶⁴Cu-IO. The distributions of the particle sizes of IO and ⁶⁴Cu-IO NPs were examined by a dynamic light scattering (DLS) analyzer (Nanotrac wave, Montgomeryville and York, PA, USA). The Fourier transform infrared spectroscopy (FTIR) (Perkin Elmer, Waltham, MA, USA) was performed to confirm the functional groups on the surface of the NPs. The structure of ⁶⁴Cu-IO was examined by X-ray diffraction (XRD) in a range of 5–90° as a function of the diffraction angle 2θ by using a MiniFlex 600 (RIGAKU, Tokyo, Japan) diffractometer with 3 kW monochromatic Co radiation (λ = 1.79 $\mathrm{\AA }$ ). To investigate the chemical state of the NPs, X-ray photoelectron spectroscopy (XPS) was employed. The XPS spectra were measured by a PHI 5000 VersaProbe spectrometer (Ulvac-PHI, Osaka, Japan) equipped with a monochromatized Al Kα (1486.6 eV) X-ray source. All of the binding energies were calibrated with the C 1s peak at 284.6 eV.

The conjugation of fucoidan on the AuNR surface (Fu-AuNRs) was conducted following a previously reported method [22 (link)] based on the electrostatic interaction between the cationic –N⁺(CH₃)₃ group of CTAB and the anionic sulfate group of fucoidan (see the “Supplementary information” for details).
For the imaging of the AuNRs embedded onto solidified PVA, a PVA solution (20 mL) was prepared following a previously described protocol [23 ]. The AuNRs were fixed onto solidified PVA to investigate the scattering intensity bias from the chromatic aberrations of the illumination objective lens (see the “Supplementary information” for details).
In addition, the AuNRs and Fu-AuNRs were characterized by transmission electron microscopy (TEM, 2100F, JEOL Ltd, Tokyo, Japan) [24 (link)], UV–vis spectroscopy (MultiSpec-1501, Shimadzu, Tokyo, Japan), dynamic light scattering (802DLS, Viscotek, Westborough, MA, USA), and Fourier transform infrared (FT-IR) spectroscopy (Perkin Elmer, Inc., Norwalk, CT, USA) [19 (link)] (see the “Supplementary information” for details).

Ultraviolet (UV)-Vis spectra (Beckman Coulter, DU739, Krefeld, Germany) and Powder X-Ray Diffraction (PXRD) patterns of ZnO-NPs were analyzed as reported by Ashraf et al. [23 (link)] and the particle size was calculated using the Scherrer’s formula:
$\Phi =\frac{\mathrm{K}\mathsf{\lambda }}{\mathsf{\beta }\cos \mathsf{\theta }},$
where Φ is the crystalline size, λ is the wavelength of X-Ray used. K is the shape factor, β is the full line width at the half maximum (FWHM) elevation of the main intensity peak, and θ is the Bragg angle. Fourier Transform Infrared (FT-IR) spectroscopy (Perkin Elmer, Waltham, MA 02451 USA) was carried out to know the functional groups. Scanning electron microscopy (SEM) (HITACHI, S-3400N, Tokyo, Japan) and energy dispersive spectroscopy (EDS) of biosynthesized ZnO-NPs were performed as a method described by Jalal et al. [24 (link)].

Fourier transform infrared (FTIR) spectroscopy (PerkinElmer, Waltham, MA, USA) was done for the neat, cross-linked and drug-loaded samples using attenuated total reflectance (ATR) accessory equipped with a diamond ATR crystal. Spectral profiles were conducted in the mid-infrared region (600 to 3500 cm⁻¹) at a resolution of 4 cm⁻¹ by accumulating 32 scans. Obtained spectra were processed using Spectrum™ 10 software.