Model 2000 physical property measurement system

Transmission electron microscope (TEM) images were obtained with a JEM-2010 microscope (JEOL, Japan) at an accelerating voltage of 120 kV. The samples were prepared by drop-casting a dilute solution of particles onto carbon-coated copper grids, followed by air drying. High-resolution transmission electron microscopy (HRTEM) images were obtained on a field-emission electron microscope (FEI Talos F200x, USA) equipped with a Super X energy spectrum. X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Fischer ESCALAB 250Xi (USA). Structural information of the samples was obtained by X-ray diffractometer-6100 diffractometer (Shimadzu, Japan). Fourier transform infrared spectrometry (FT-IR) analysis was conducted on an IR 200 spectrometer (Thermo Nicolet, USA) using KBr pellets. Thermogravimetric analysis (TGA) was performed on a Mettler TGA/SDTA851e° instrument (Switzerland) at a heating rate of 5 °C min⁻¹ from 30 to 700 °C under N₂ atmosphere. The magnetism of the samples was measured with a vibrating sample magnetometer (VSM) on a model 2000 physical property measurement system (Quantum design) at room temperature.

Transmission Electron Microscope (TEM) images were obtained with a JEM-2010 microscope (JEOL, Japan) at an accelerating voltage of 120 kV. The samples were prepared by drop-casting a dilute solution of particles onto carbon-coated copper grids, followed by air drying. FT-IR spectra were recorded on an IR 200 spectrometer (Thermo Nicolet, USA) using KBr pellets. X-Ray photoelectron spectroscopy (XPS) was performed on a Thermo Fisher ESCALAB Xi+. Thermogravimetric analysis (TGA) was performed on a Mettler TGA/SDTA851e° instrument (Switzerland) at a heating rate of 5 °C min⁻¹ from 30 to 700 °C under N₂ atmosphere. Magnetic property was measured by vibrating sample magnetometry (VSM) on a model 2000 physical property measurement system (Quantum Design) at room temperature. Zeta potentials of samples were determined on a dynamic light scattering (DLS) instrument (Zetasizer Nano-ZS, Malvern Instruments, UK).