Phi 5600 x ray photoelectron spectrometer

The morphology of a series of n-hemin/PAN nanocomposite membranes was examined by an S4800 field emission scanning electron microscope (Hitachi, Ltd., Tokyo, Japan). The Fourier transform infrared spectra of the membranes were measured on a Nexus 670 Fourier transform spectrometer (Nicolet Inc., Glendale, WI, USA). The X-ray photoelectron spectroscopy was employed by using a PHI 5600 X-ray photoelectron spectrometer (Perkin Elmer Inc., Waltham, MA, USA). The diffuse reflectance UV-Vis absorption spectra in the range from 200 to 800 nm were investigated by using Varian Cary 500 UV-vis spectrophotometer (Thermo Fisher Scientific Inc., Waltham, MA, USA). The total organic carbon (TOC) throughout the catalytic process was analyzed by using Shimadzu TOC-L (Shimadzu, Ltd., Kyoto, Japan). The atomic absorption spectrum was conducted by using a Shimadzu AA-7000 (Shimadzu, Ltd., Kyoto, Japan) to detect the residual Fe ions in the dye solution.