Nanoscale Mechanical characterization (PF-QNM) in PeakForce Tapping
mode, in a Bruker Dimension Icon AFM (Bruker Corporation, CA, USA)
to map the topography and the Young’s modulus of different
materials.
and ZIF-62 (as reference material) were drop-casted on silicon substrates
and imaged, in air under ambient conditions, with RTESPA-150 probes
(spring constant 5 N/m, Bruker). The force applied by the tip was
fixed to ∼1 nN in all experiments. The automatic analysis of
these curves generates maps of mechanical property distribution and
topography simultaneously.