Tespa probe

Manufactured by Bruker

Sourced in United States

The TESPA probes are a line of atomic force microscopy (AFM) probes manufactured by Bruker. They are designed for high-resolution imaging and force spectroscopy applications. The TESPA probes feature a silicon-based cantilever and a high-aspect-ratio silicon tip, optimized for enhanced resolution and sensitivity.

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Lab products found in correlation

Multimode afm nanoscope iiid system, by Bruker (5 mentions) Dimension 3100 afm, by Bruker (2 mentions) Multimode afm nanoscope 4 system, by Bruker (2 mentions) Xl30 feg sem, by Philips (1 mentions) Nicolet 5700 spectrometer, by Thermo Fisher Scientific (1 mentions) Labram hr evolution spectrometer, by Horiba (1 mentions) Dimension fastscan afm system, by Bruker (1 mentions) Hplc grade water, by Merck Group (1 mentions) Nanowizard 3, by Bruker (1 mentions) Dimension fastscan afm, by Bruker (1 mentions) Fastscan d, by Bruker (1 mentions)

18 protocols using tespa probe

Graphene Characterization using Raman Spectroscopy

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The graphene for laser spot size determination in the Supporting Information was made by mechanical exfoliation and then transferred to a PMMA substrate.^{33 (link)} The CVD graphene was grown on copper using a conventional methane feedstock and was then transferred onto PET film as described in the Supporting Information. For the bending test, the CVD graphene/PET film was attached to PMMA beam by PMMA solution adhesive.
SEM images were obtained using a Philips XL30 FEGSEM. The sample surface was coated with gold before analysis. AFM images were obtained from the surfaces of the CVD graphene using a Dimension 3100 AFM (Bruker) in the tapping mode in conjunction with the “TESPA” probe (Bruker).
Raman spectra were obtained using Renishaw 1000 spectrometers equipped with an argon laser (λ = 514 nm). The sample on the PMMA was deformed in a four-point bending rig, with the strain monitored using a resistance strain gauge attached to the PMMA beam adjacent to the CVD graphene/PET film.^{33 (link)} In all cases, the incident laser polarization is kept parallel to the strain. The simulation of Raman spectra was carried out using Wolfram Mathematica 9.

Li Z., Kinloch I.A., Young R.J., Novoselov K.S., Anagnostopoulos G., Parthenios J., Galiotis C., Papagelis K., Lu C.Y, & Britnell L. (2015). Deformation of Wrinkled Graphene. ACS Nano, 9(4), 3917-3925.

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Characterization of Graphene Oxide by FTIR, XRD, AFM, and Raman

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Transmission mode Fourier-transform infrared (FTIR) spectrum was obtained from dried GO powder mixed with KBr, using a Nicolet 5700 spectrometer (ThermoFisher Scientific Inc.). X-ray diffraction (XRD) was carried out on dried GO powder using an X’Pert DY609 X-ray diffractometer (Philips) with a Cu-Kα radiation source (λ=1.542 Å). Atomic force microscope (AFM) images were obtained using a Dimension 3100 AFM (Bruker) in the tapping mode in conjunction with a ‘TESPA’ probe (Bruker).
Raman spectra were obtained using Renishaw 1000/2000 spectrometers and a Horiba LabRAM HR Evolution spectrometer equipped with HeNe lasers (λ=633 nm) with laser spot sizes of around 1–2 μm. The incident laser polarization was parallel to the strain, whereas the scattered radiation was randomly polarized. The specimens were deformed in a four-point bending rig, and the strain was measured using a strain gauge placed close to the region being analysed [24 (link)].

Li Z., Kinloch I.A, & Young R.J. (2016). The role of interlayer adhesion in graphene oxide upon its reinforcement of nanocomposites. Philosophical transactions. Series A, Mathematical, physical, and engineering sciences, 374(2071), 20150283.

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Functionalized Mica for Atomic Force Microscopy

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1-(3-Aminopropyl)silatrane (APS)-functionalized mica was used as the AFM substrate for all experiments.^{27 (link)} Briefly, freshly cleaved mica was incubated in 4 mL APS (167 μM) in a cuvette for 30 min and then rinsed with double-distilled water (ddH₂O) thoroughly, as described in ref 26 (link). Ten microliters of the sample were deposited onto the APS mica for 2 min, rinsed with ddH₂O, and dried with a gentle Argon gas flow. Images were acquired using tapping mode in the air on a MultiMode 8, Nanoscope V system (Bruker, Santa Barbara, CA) using TESPA probes (320 kHz nominal frequency and a 42 N/m spring constant) from the same vendor.

Sun Z., Wang Y., Bianco P.R, & Lyubchenko Y.L. (2021). Dynamics of the PriA Helicase at Stalled DNA Replication Forks. The journal of physical chemistry. B, 125(17), 4299-4307.

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AFM Imaging of Gel Assembly/Disassembly

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All atomic force microscopy (AFM) data were acquired with a Bruker Dimension FastScan AFM system. The raw AFM data were processed in terms of 1 st order plane-fitting and 1 st order flattening with the Bruker NanoScope Analysis software v1.50. The NanoScope Analysis software was further used to analyse cross sections and to export the images. Freshly cleaved mica was used as substrate for all AFM experiments. In-situ AFM measurements were performed on a temperature controlled sample stage using PeakForce Tapping as reported previously. 36 The gel was imaged in a small droplet which was placed with a pipette on the freshly cleaved mica substrate. Bruker FastScan-B probes with a spring constant of 1 N/m were used for in-situ AFM imaging of the assembly and disassembly process of the gel. Ex-situ AFM imaging was carried out on thin films of gels prepared by smearing the gel across a freshly cleaved mica substrate with a glass pipette. These films were imaged using standard Tapping Mode AFM with Bruker TESPA probes with a spring constant of 42 N/m and a resonant frequency of 300 kHz.

Barker E.C., Martin A.D., Garvey C.J., Goh C.Y., Jones F., Mocerino M., Skelton B.W., Ogden M.I, & Becker T. (2017). Thermal annealing behaviour and gel to crystal transition of a low molecular weight hydrogelator. Soft matter, 13(5).

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Mica Surface Functionalization and Imaging

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Freshly cleaved mica was functionalized with a 167 μM solution of 1-(3-aminopropyl)- silatrane (APS) for 30 min at room temperature, rinsed, and dried with a gentle flow of argon as described in [17 ]. Samples were diluted to 2 nM concentration in imaging buffer (10 mM HEPES pH 7.5, 4 mM MgCl₂), deposited on the mica surface for 2 min, rinsed with water, and dried with gentle argon flow. Samples were stored in vacuum under argon until ready for imaging using tapping mode on a Nanoscope V MultiMode 8 system (Bruker, Santa Barbara, CA, USA) using TESPA probes with a nominal tip radius of 7 nm (Bruker, Santa Barbara, CA, USA). A typical image was 1 × 1 μm in size with 2 nm/pixel resolution.

Zagorski K., Stormberg T., Hashemi M., Kolomeisky A.B, & Lyubchenko Y.L. (2022). Nanorings to Probe Mechanical Stress of Single-Stranded DNA Mediated by the DNA Duplex. International Journal of Molecular Sciences, 23(21), 12916.

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Imaging of Cross-linked Aβ42 Oligomers

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Cross-linked [Phe10, Tyr42]Aβ42 oligomers generated by photoinduced cross-linking of unmodified proteins (PICUP)^{23 (link),26 (link)} were diluted in 10 mM sodium phosphate buffer pH 7.4 to a concentration range of 20-50 nM. A freshly cleaved mica surface was functionalized with 1-(3-aminopropyl)silatrane (APS) as described earlier.^{32 (link)} 5 μl of the oligomer sample was deposited onto APS-mica for 2 min, then rinsed with deionized water and dried with Ar gas. AFM imaging was carried out in air in tapping mode using Nanoscope Multimode V system (Bruker, Santa Barbara, CA). TESPA probes (Bruker) with a resonance frequency of 320 kHz and spring constant of 42 N/m were used for air imaging.

Banerjee S., Sun Z., Hayden E.Y., Teplow D.B, & Lyubchenko Y.L. (2017). Nanoscale Dynamics of Amyloid Beta-42 Oligomers as Revealed by High-Speed Atomic Force Microscopy. ACS nano, 11(12), 12202-12209.

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Sample Preparation for AFM Imaging

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Sample preparation for AFM imaging was performed as previously described[16 (link)]. Freshly cleaved mica was functionalized with a solution of 1-(3-aminopropyl)- silatrane (APS) for sample deposition[23 (link)]. The samples were diluted from 300 nM to 2 nM in imaging buffer (10 mM HEPES pH 7.5, 4 mM MgCl₂) immediately before deposition on the functionalized mica. The sample was left to incubate for 2 minutes before being rinsed with water and dried with argon flow. Samples were stored in vacuum and argon before being imaged on Multimode AFM/Nanoscope IIId system using TESPA probes (Bruker Nano Inc, Camarillo, CA). A typical image captured was 1×1 μm in size with 512 pixels/line.

Stormberg T., Filliaux S., Baughman H.E., Komives E.A, & Lyubchenko Y.L. (2021). Transcription Factor NF-κB Unravels Nucleosomes. Biochimica et biophysica acta. General subjects, 1865(9), 129934.

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Atomic Force Microscopy Substrate Preparation

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APS (1-(3-aminopropyl)silatrane) functionalized mica was used as the AFM substrate for all experiments. Briefly, freshly cleaved mica was incubated in a 167 μM aqueous solution of APS for 30 min and rinsed thoroughly with deionized water as described in [9 (link)]. Five microliters of the sample was deposited onto the APS mica and incubated for 2 min, rinsed with deionized water, and dried with a gentle argon gas flow. Images were acquired using tapping mode in air on a MultiMode 8, Nanoscope V system (Bruker, Santa Barbara, CA) using TESPA probes (320 kHz nominal frequency and a 42 N/m spring constant) from the same vendor.

Sun Z., Wang Y., Hashemi M, & Lyubchenko Y.L. (2021). Restriction of RecG translocation by DNA mispairing. Biochimica et biophysica acta. General subjects, 1865(12), 130006.

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Mica Substrate Functionalization for AFM

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1-(3-Aminopropyl)silatrane (APS) functionalized mica was used as the AFM substrate for all experiments. Briefly, freshly cleaved mica was incubated in 4 ml APS (167 μM) in a cuvette for 30 min and then rinsed with ddH₂O thoroughly, as described in ref. 14 (link). Ten microliters of the sample were deposited onto APS mica for 2 min, cleaned with ddH₂O, and dried with a gentle argon gas flow. Images were acquired using tapping mode in air on a MultiMode 8, Nanoscope V system (Bruker, Santa Barbara, CA) using TESPA probes (320 kHz nominal frequency and a 42 N m⁻¹ spring constant) from the same vendor.

Sun Z., Wang Y., Bianco P.R, & Lyubchenko Y.L. (2020). Nanoscale interaction of RecG with mobile fork DNA. Nanoscale Advances, 2(3), 1318-1324.

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AFM Imaging of Mica Surfaces

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1-(3-aminopropyl) silatrane (APS) functionalized mica was used as the AFM substrate for all experiments. Briefly, freshly cleaved mica was incubated in 4ml APS (167 μM) in a cuvette for 30 min and then rinsed with ddH2O thoroughly, as described in ref ^{14 (link)}. Ten microliters of the sample were deposited onto the APS mica for 2 min, cleaned with ddH2O, and dried with a gentle Argon gas flow. Images were acquired using tapping mode in the air on a MultiMode 8, Nanoscope V system (Bruker, Santa Barbara, CA) using TESPA probes (320 kHz nominal frequency and a 42 N/m spring constant) from the same vendor.

Sun Z., Wang Y., Bianco P.R, & Lyubchenko Y.L. (2020). Nanoscale interaction of RecG with mobile fork DNA. Nanoscale Advances, 2(3), 1318-1324.

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