The anatase structure of TiO2 was investigated by X-ray diffraction (XRD, D/MAX-RB (12KW) and D/MAX-RC (12 kW), Rigaku). The morphologies of the TiO2 NFs and rGO@TiO2 NFs were observed by a scanning electron microscope (SEM, Philips). The lattice fringe and selected-area electron diffraction (SAED) patterns were obtained by a transmission electron microscope (TEM, Tecnai F30 S-Twin, FEI). Raman spectroscopy was carried out using a LabRAM HR UV/Vis/NIR PL device by Horiba Jobin Yvon, France. The Fourier-transform infrared spectroscopy (FT-IR) analysis was performed using the attenuated total reflection (ATR) method for the GO solution and the KBr-pellet method for the TiO2 NFs and the rGO@TiO2 NFs in transmission mode on an IFS66V/S & Hyperion 3000, Bruker Optiks, Germany. Carbon contents were measured by an element analysis (EA, Flash 2000 series, Thermo Scientific).
Tecnai f30 s twin
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Tecnai F30 S-Twin is a transmission electron microscope (TEM) designed for advanced materials research and analysis. It features a field emission gun (FEG) source, providing high-resolution imaging capabilities. The Tecnai F30 S-Twin is capable of operating at accelerating voltages up to 300 kV, enabling the examination of a wide range of specimen types.
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Lab products found in correlation
Sigma probe, by Thermo Fisher Scientific (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
D max rb, by Rigaku (1 mentions)
D max rc, by Rigaku (1 mentions)
Flash 2000 series, by Thermo Fisher Scientific (1 mentions)
Cary eclipse, by Agilent Technologies (1 mentions)
Pyris 1 tga system, by PerkinElmer (1 mentions)
D8 advance, by Bruker (1 mentions)
Nova 200, by Thermo Fisher Scientific (1 mentions)
Nova230, by Thermo Fisher Scientific (1 mentions)
Aramis, by Horiba (1 mentions)
D max 2500, by Rigaku (1 mentions)
Xl30 sfeg, by Thermo Fisher Scientific (1 mentions)
7 protocols using tecnai f30 s twin
1
Characterization of TiO2 Nanostructures with rGO
2
Comprehensive Characterization of Novel Materials
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X-ray diffraction (XRD) patterns were recorded on a multipurpose XRD system D8 Advance from Bruker with a Cu Kα radiation. Raman-shift spectra were measured on a JY HR800 tool with laser excitation of 488 nm. UV-Vis absorption spectra were obtained using a Shimadzu 2660 UV-Vis spectrophotometer, and PL spectra were measured with a Varian Cary Eclipse instrument. High-resolution transmission electron microscopy (HRTEM) images were taken on a FEI Tecnai F30 S-TWIN. Fluorescence lifetimes were measured using a Horiba FM-4P time-corrected single photon counting system. FTIR spectra were recorded with a Tensor-27 spectrometer. X-ray photoelectron spectroscopy (XPS) analysis was carried out on an ARL-9800 instrument with a monochromatic X-ray source Al Kα excitation (1486.6 eV). Binding energy calibration was based on the C 1s peak at 284.6 eV. TG curves were recorded with a Pyris-1-TGA system from Perkin-Elmer. Sample images were taken by a digital camera under illumination from a UV lamp.
3
Characterization of Perovskite Solar Cells
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Morphological and nano-structural analyses were performed using scanning electron microscopy (SEM) (Jeol JSM-6210) and high-resolution transmission microscopy (HRTEM) (FEI Tecnai F30 S-Twin), respectively. During cross sectional TEM imaging, samples were milled with 10- to 30-kV gallium ions accelerated by using a focused ion beam (FIB, FEI NOVA 200) in the dual-beam mode. The photocurrent density–voltage (J–V) curves of the devices were obtained by an electrochemistry workstation (CHI660D, 0.1 MHz to 100 Hz) under irradiation of simulated solar light (AM 1.5 G, 100 mW/cm2). The photon density of the illumination source was calibrated by using a power meter. Electrochemical impedance spectra were measured by the CHI-660E electrochemical workstation using the AC impedance method of light illumination of 100 mw/cm2. The applied initial voltage was set at the open-circuit voltage (Voc) of the PSC.
4
Characterizing Graphene Quantum Dots
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The morphologies of GQDs were analyzed using an HRTEM (High-resolution Transmission Microscopy) (FEI Tecnai F30 S-Twin). To make the HRTEM specimens, the GQDs were dispersed in DI water, a drop of which was then put on a C- or SiO-coated Cu grid (Tedpella, Inc., Redding, CA, USA) and mica substrate, respectively. The current-voltage (I–V) curve of the device was analyzed in an electrical and electronic workstation (Keithley 2400).
5
Characterization and Sensing Properties of Metal Oxide Nanostructures
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The morphologies of each
sample were examined by field-emission scanning electron microscopy
(FE-SEM, Nova 230). The microstructure, selected area electron diffraction
(SAED) pattern, and EDS mapping analysis of each sample were analyzed
by transmission electron microscopy (TEM) (Tecnai F30 S-Twin, FEI).
The crystal structure of each sample was observed by X-ray diffraction
(XRD) pattern with an X-ray diffractometer (D/MAX-RC 12 kW, Rigaku)
using Cu Kα (λ = 1.54 Å) radiation. The chemical
bonding states of Co, Zn, and O in HMOF-derived metal oxide were investigated
by X-ray photoelectron spectroscopy (XPS, Sigma Probe, Thermo VG Scientific)
with Al Kα radiation (1486.6 eV). Sensing properties of the
ZnO sheet, Co3O4 rods, single-Co3O4 rods@ZnO sheet, double-Co3O4 rods@ZnO
sheet, and triple-Co3O4 rods@ZnO sheet were
evaluated by homemade testing equipment described elsewhere. The resistance
variation of each sample was measured by using a data acquisition
system (34972A, Agilent).
sample were examined by field-emission scanning electron microscopy
(FE-SEM, Nova 230). The microstructure, selected area electron diffraction
(SAED) pattern, and EDS mapping analysis of each sample were analyzed
by transmission electron microscopy (TEM) (Tecnai F30 S-Twin, FEI).
The crystal structure of each sample was observed by X-ray diffraction
(XRD) pattern with an X-ray diffractometer (D/MAX-RC 12 kW, Rigaku)
using Cu Kα (λ = 1.54 Å) radiation. The chemical
bonding states of Co, Zn, and O in HMOF-derived metal oxide were investigated
by X-ray photoelectron spectroscopy (XPS, Sigma Probe, Thermo VG Scientific)
with Al Kα radiation (1486.6 eV). Sensing properties of the
ZnO sheet, Co3O4 rods, single-Co3O4 rods@ZnO sheet, double-Co3O4 rods@ZnO
sheet, and triple-Co3O4 rods@ZnO sheet were
evaluated by homemade testing equipment described elsewhere. The resistance
variation of each sample was measured by using a data acquisition
system (34972A, Agilent).
6
Characterization of MoS2@CNFs@rGO Nanocomposite
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Nova 230 (field-emission scanning electron microscope (FE-SEM), FEI, Hillsboro, OR, USA) was employed to obtain FE-SEM images. The crystal structure of MoS2@CNFs@rGO was investigated by X-ray diffraction (XRD) patterns using D/Max-2500, with RIGAKU Corp. (Tokyo, Japan) with Cu Kα (λ = 1.54 Å) between 10° and 80° at a scan rate of 0.066° s−1. Both internal and external morphologies of MoS2@CNFs@rGO and the distribution of elementals were analyzed by a high-resolution transmission electron microscope (HR-TEM) operating at 300 kV and a scanning TEM (STEM) using a Tecnai F30 S-Twin (FEI, Hillsboro, OR, USA) equipped with energy-dispersive X-ray spectroscopy (EDX). The chemical states of MoS2@CNFs@rGO were investigated by X-ray photoelectron spectroscopy (XPS, K-alpha, Thermo VG Scientific, Waltham, MA, USA). In addition, the dominant vibration modes in the MoS2@CNFs@rGO were investigated using Raman spectroscopy (ARAMIS, Horiba Jobin Yvon, Montpellier, France) with a 514 nm laser source.
7
SWCNTs Deposition on GNSs/Li4Ti5O12 Substrate
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SWCNTs (Purified SW-CNT, Unidym Co., Ltd., USA; Supplementary Fig. S9b ) dispersed solution in DMF solvent was prepared with the same processing method as that of the GNSs solution in step (2) (Supplementary Fig. S10c ). The dispersion solution was sprayed on a stainless steel foil using an air-spray gun connected to a vacuum pump. The sprayed SWCNTs solution on the GNSs/Li4Ti5O12 was dried to evaporate the DMF solvent. To easily evaporate the solvent, the temperature of the SUS/GNSs/Li4Ti5O12 substrate, which is attached with tape to the hot plate, was maintained at 160°C. The air-spraying and subsequent drying processes were repeated several times for uniform deposition of SWCNTs and dense interconnection with the substrate. The surface morphology of the samples was analyzed using a scanning electron microscope (SEM, Philips, XL30SFEG) and transmission electron microscope (TEM, FEI, Tecnai F30 S-Twin).
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