Each spectrum composing the map resulted from 4 accumulations lasting 5 ms, and the map step size has been fixed in 4 μ so as to obtain 4000 spectra for each drop. The map dimension and step size have been established taking into account several specific requirements, such as the need to collect the same large number of spectra for each sample coming from the central part of the drop, in order to better exploit the SERS effect associated with the nanostructured substrate, and the fact that the spectra composing the map must come from points distant enough to be considered independent acquisitions for the classification methods. For each sample, HaCaT, SK-MEL-28, A375, CaCo-2, and HT29, the entire measurement process has been repeated 5 to 10 times.
Dxr2xi
The DXR2xi is a high-performance Raman microscope designed for materials characterization. It provides users with advanced Raman spectroscopy capabilities for the analysis of a wide range of samples. The instrument features a compact and modular design, enabling flexible configuration to meet specific research and analytical needs.
Lab products found in correlation
46 protocols using dxr2xi
Raman Imaging of DNA Nanostructures
Each spectrum composing the map resulted from 4 accumulations lasting 5 ms, and the map step size has been fixed in 4 μ so as to obtain 4000 spectra for each drop. The map dimension and step size have been established taking into account several specific requirements, such as the need to collect the same large number of spectra for each sample coming from the central part of the drop, in order to better exploit the SERS effect associated with the nanostructured substrate, and the fact that the spectra composing the map must come from points distant enough to be considered independent acquisitions for the classification methods. For each sample, HaCaT, SK-MEL-28, A375, CaCo-2, and HT29, the entire measurement process has been repeated 5 to 10 times.
Characterization of Porous Au Nanocatalysts
Tellurene Morphological and Sensing Analysis
Microplastic Identification via Raman Spectroscopy
Carbonized Post-it Note Characterization
Comprehensive Characterization of Carbon Dots-Based Molecularly Imprinted Polymers
Characterization of Porous Silver Nanocrystals
Raman Mapping of 2D BP in Cell Cultures
SERS Detection of Rhodamine 6G
Electrical Characterization of Carbon Nanofilms
a JSM-6701F (JEOL Ltd., Japan). Raman spectra were obtained using
a DXR2xi (Thermo, USA) installed at NCIRF at Seoul National University.
XPS data were acquired using a Sigma Probe (Thermo, USA). The electrical
conductivity was measured using a Keitheley 2400, and the amount of
charge was recorded using an electrochemical workstation (WBCS3000,
WonATech, Korea). The electrodeposition and oxidation-level control
were performed using WBCS3000. The electrical conductivity, charge
carrier mobility, and charge carrier density were calculated using
the following equations.
The electrical conductivity was calculated
as where L represents the length, A represents the area of the CNF, and R represents
the resistance measured by the source meter.
The charge carrier
mobility was calculated as where n0 represents
the charge carrier density and |e| represents the
electrical charge of the carrier.
The charge carrier density
was calculated as where q represents the amount
of charge and V represents the volume of the nanofilm.
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