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46 protocols using dxr2xi

1

Raman Imaging of DNA Nanostructures

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A DXR2xi Thermo Fisher Scientific Raman Imaging Microscope has been used to collect a Raman map of all the DNA drops deposited onto the nanostructured substrates and left to dry in air at Room Temperature. The maps have been collected by using a 532 nm laser source, with a 1 mW excitation power and a 50 × objective in a backscattering configuration.
Each spectrum composing the map resulted from 4 accumulations lasting 5 ms, and the map step size has been fixed in 4 μ so as to obtain 4000 spectra for each drop. The map dimension and step size have been established taking into account several specific requirements, such as the need to collect the same large number of spectra for each sample coming from the central part of the drop, in order to better exploit the SERS effect associated with the nanostructured substrate, and the fact that the spectra composing the map must come from points distant enough to be considered independent acquisitions for the classification methods. For each sample, HaCaT, SK-MEL-28, A375, CaCo-2, and HT29, the entire measurement process has been repeated 5 to 10 times.
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2

Characterization of Porous Au Nanocatalysts

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The porous Au NC was characterized by scanning electron microscopy (SEM, JEOL JSM-6700F, Tokyo, Japan), which was carried out with a voltage of 3.0 kV. Transmission electron microscopy (TEM) was operated by Hitachi HT7700 at 100 kV. High resolution TEM (HRTEM) and selected area electron diffraction (SAED) were operated by JEOL JEM-2100F at 200 kV. The surface-enhanced Raman spectroscopy was performed using a Raman spectrometer (Thermo Fisher DXR2xi, Waltham, MA, USA) with laser excitation at 633 nm.
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3

Tellurene Morphological and Sensing Analysis

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The morphologies of tellurene were investigated using optical microscopy (OM). The crystal structures and physical properties were observed through X-ray diffraction (XRD, D8 ADVANCE, Bruker, Billerica, MA, USA) with Cu Kα radiation and Raman spectroscopy (DXR2xi, Thermo Fisher Scientific Inc., Waltham, MA, USA) with a wavelength of 532 nm and an incident laser power of 6.1 mW. The transmission electron microscopy (TEM, Titan Themis Z, FEI, Hillsboro, USA) measurement was carried out to analysis the crystal structure and morphologies of the obtained samples. The electrical and gas-sensing properties were measured using a mini gas sensor chamber system (MPS-PT, Nextron, Daejeon, South Korea) connected to a source meter (2400, Keithley, Cleveland, OH, USA) to record the change in current or resistance in real-time. H2S and dry air were used as the target and standard base gases, respectively. Gas flow was modulated via mass flow controllers (TN-280SAV, Tylan Inc., San Diego, CA, USA) and 200 sccm of total flow rate was set for measurement. To attain stable gas-sensing characteristics, we evacuated all sensor devices in a vacuum chamber at room temperature for 30 min before performing the gas-sensing measurement.
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4

Microplastic Identification via Raman Spectroscopy

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Two to six particles per sample that were significantly identified were located with the µRaman microscope (DXR2xi, Thermofisher) at the filter using the digital image derived from the fluorescence microscope. Chemical composition was measured via recording spectra with the µRaman spectroscope (532 and 785 nm, laser intensity and exposure adjusted from 0.1 to 10.0 mW and 30 to 1 Hz respectively according to particle size, composition and laser setup, 25 µm or 50 µm pinhole, 1000 spectra integrated) and evaluated against 10 relevant external spectral libraries including SLoPP and SLoPP-E44 (link) and 2 self-generated libraries on synthetic polymers. The threshold value of the Raman spectra was set at >70% agreement. This could not be achieved with 10 particles (n = 8 60–70%, n = 2 <60%) which were nevertheless integrated based on expert-based decision due to the strong evidence of agreement.
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5

Carbonized Post-it Note Characterization

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Morphologies of the carbonized Post-it note were observed by field-emission scanning electron microscopy and energy dispersive X-ray spectrometry (SUPRA 55VP; Carl Zeiss). Carbonized microstructures were examined by wide-angle XRD (D8 Advance; Bruker Miller) with Cu radiation (λ = 0.154 nm) and by Raman spectroscopy (DXR2xi; Thermo Scientific). Chemical bonds and atomic compositions were investigated by X-ray photoelectron spectroscopy (AXIS Nova; Kratos Analytical). Specific surface area was assessed by N2 adsorption at 77 K using Brunauer–Emmett–Teller analysis (TriStar II 3020; Micromeritics Instruments).
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6

Comprehensive Characterization of Carbon Dots-Based Molecularly Imprinted Polymers

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Powder X-ray diffraction (XRD) measurements were performed on a SmartLab (Rigaku) laboratory diffractometer with a Cu Kα radiation in the 2θ range of 10–80° at 298 K. Fourier transform infrared (FT-IR) spectrum was observed with a Nicolet NEXUS spectrometer (Madison, WI, USA). The morphology of the CDs-MIPs was visualized using a scanning electron microscope (SEM, ZEISS Merlin, Germany) and Transmission electron microscope (TEM, FEI Talos F200S, Thermo Scientific, USA). Raman spectroscopy was observed with Thermo Scientific DXR 2Xi (USA). The fluorescent lifetimes and quantum yield were performed on FLS 1000-STM steady/transient fluorescence spectra instrument. X-ray photo-electron spectroscopy (XPS) was performed with a Thermo Fisher Scientific K-Alpha electron spectrometer. The UV spectrum was collected by UV-2600 spectrometer (Shimadzu instrument, Suzhou, China). Fluorescence determination was carried out on an F-4600 fluorescence spectrophotometer (Hitachi, Japan). A pHs-3C digital pH meter (Shanghai Lei Ci Device Works, Shanghai, China) was used for the pH adjustments.
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7

Characterization of Porous Silver Nanocrystals

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The prepared porous Ag crystals were characterized by scanning electron microscope (SEM, SU8010, Hitachi, Japan) and transmission electron microscope (TEM, Tecnai G2 F20 S-TWIN). The SEM study was conducted on a JEOL JSM-6700F SEM running at 3.0 kV. A Hitachi HT7700 operating at 100 kV was used for TEM characterization. Surface-enhanced Raman spectroscopy was performed using a confocal Raman microscope (Thermo Fisher DXR2xi) with a laser excitation at 633 nm, an exposure time of 10 s and an objective lens with a magnification of 50 times.
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8

Raman Mapping of 2D BP in Cell Cultures

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The samples were prepared by seeding PC-3 and PNT-2 cells onto the 2D BP flakes for different time intervals of 10 h, 24 h, 48 h, and 72 h. Afterwards, fixation of the samples for Raman measurements was performed using 4% formaldehyde overnight at 4 °C, followed by washing for three times and storing in PBS 1X until Raman analysis. Raman maps of the treated and untreated cells were then acquired with a DXR2xi Thermo Fisher Scientific (Waltham, MA, USA) Raman imaging microscope by exciting the samples at 532 nm with 2 mW laser power and a 50× objective. Each point spectrum resulted from 30 accumulations of 0.1 s acquisitions, and the maps were collected over a square area with a fixed step size of 1 μm. Each map contained several cells and many 2D BP flakes, localized inside, near, and far from the cells depending on the cell status, type, and time interval from the seeding. For every map, the 2D BP aggregates were visually and spectrally identified, and the corresponding point spectra were individually analyzed by means of a Lorentzian fitting procedure to extract the FWHM of the three peaks ascribed to 2D BP. For each time interval, the fitting results were used to build separate histograms for 2D BP decorating the cells or far away from them.
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9

SERS Detection of Rhodamine 6G

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The prepared 10 μL Au nanoparticles were dropped onto the cleaned glass slides, and then 10 μL R6G solutions of different concentrations were added. The solution was pumped and mixed evenly and dried at room temperature to prepare the surface-enhanced Raman spectroscopic detection substrate. A laser Raman spectrometer (Thermo Fisher DXR2xi) equipped with microscope and CCD detector was used to record SERS spectra. The laser wavelength used in the experiment is 633 nm, the acquisition time is 10 s, and the laser power is 6.0 mW. The objective lens (OLYMPUS 50X 0.75 BD) magnification is 50 times. All the collected spectra are baselines corrected by OMNIC for Dispersive Raman, a software provided with the equipment, and later used for analysis. The distribution of the Raman Peak is analyzed by using the matching software OMNIC for Dispersive Raman.
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10

Electrical Characterization of Carbon Nanofilms

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FE-SEM images were obtained using
a JSM-6701F (JEOL Ltd., Japan). Raman spectra were obtained using
a DXR2xi (Thermo, USA) installed at NCIRF at Seoul National University.
XPS data were acquired using a Sigma Probe (Thermo, USA). The electrical
conductivity was measured using a Keitheley 2400, and the amount of
charge was recorded using an electrochemical workstation (WBCS3000,
WonATech, Korea). The electrodeposition and oxidation-level control
were performed using WBCS3000. The electrical conductivity, charge
carrier mobility, and charge carrier density were calculated using
the following equations.
The electrical conductivity was calculated
as where L represents the length, A represents the area of the CNF, and R represents
the resistance measured by the source meter.
The charge carrier
mobility was calculated as where n0 represents
the charge carrier density and |e| represents the
electrical charge of the carrier.
The charge carrier density
was calculated as where q represents the amount
of charge and V represents the volume of the nanofilm.
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