Miniflex 600 2
The Miniflex 600 II is a compact X-ray diffractometer designed for phase identification and quantification of polycrystalline materials. It features a 600-watt X-ray source and a 1D semiconductor detector for fast data acquisition. The Miniflex 600 II is capable of recording X-ray diffraction patterns in the 2θ range of 5-60 degrees.
5 protocols using miniflex 600 2
X-ray Powder Diffraction Analysis
Analyzing Crystallinity with X-ray Diffraction
X-Ray Diffraction Characterization
X-Ray Powder Diffraction Analysis of API, PM, and KSD
Preparation and Characterization of Niclosamide Amorphous Solid Dispersion
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